Abstract: A method for testing an electronic component. The method includes connecting the electronic component to a test machine; specifying search range limits, low-to-high transition edge and high-to-low transition edge found criterion, and number of outcomes in a trial including multiple tests specified as proof of low-to-high transition or as high-to-low transition; computing values for initial trial parameters; if low-to-high transition edge not found: executing a low-to-high trial and adjusting trial parameter values based on results of step executing low-to-high trial; if high-to-low transition edge not found: executing high-to-low trial; and if either low-to-high or high-to-low transition edge not found: adjusting trial parameter values based on results of step executing high-to-low trial and repeating above steps beginning with the step having the condition if low-to-high transition edge has not been found.