Patents by Inventor Guannan JIANG

Guannan JIANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11978189
    Abstract: Embodiments of this application provide a defect detection method and apparatus. The method includes: obtaining an image for inspection; performing anomaly detection on the image for inspection to obtain an anomaly region image corresponding to the image for inspection; and performing defect classification on the anomaly region image to obtain defect detection information of the image for inspection. The defect detection method of the embodiments of this application is divided into two steps of anomaly detection and defect classification. Anomaly detection is performed on the image for inspection first, and then defect classification needs to be performed only on an anomaly region, reducing the workload of defect classification, thereby improving the efficiency of defect detection.
    Type: Grant
    Filed: March 31, 2023
    Date of Patent: May 7, 2024
    Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Guannan Jiang, Annan Shu, Qiangwei Huang
  • Patent number: 11948323
    Abstract: Embodiments of this application provide a measurement method and a measurement apparatus. The measurement method includes: acquiring a first image and a second image of a target object, where the first image is acquired by a camera located on a non-backlight side of the target object, and the second image is acquired by a camera located on a backlight side of target object; and measuring the target object for size information according to the first image and the second image. The technical solution of this application can improve accuracy and precision of inspection while improving production efficiency.
    Type: Grant
    Filed: April 5, 2023
    Date of Patent: April 2, 2024
    Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Weilin Zhuang, Guannan Jiang, Annan Shu
  • Publication number: 20240104713
    Abstract: A method for detecting a number of tabs includes determining a pixel value of a first target pixel based on at least one pixel value of at least one first adjacent pixel adjacent to a first target pixel on a tab framework, and determining the number of tabs based on the pixel value of the first target pixel. Each of the at least one first adjacent pixel is an adjacent pixel of the first target pixel on a side in a first direction on the tab framework.
    Type: Application
    Filed: August 4, 2023
    Publication date: March 28, 2024
    Inventors: Lu LI, Guannan JIANG, Zhiyu WANG
  • Publication number: 20240094137
    Abstract: An embodiment of this application discloses a method and device for detecting a defect of an electrode assembly, and a computer-readable storage medium. The method may include: determining a first segmented image of an electrode assembly body in an electrode assembly image based on a first preset threshold; determining a second segmented image of a tab in the electrode assembly image based on a second preset threshold, where the second preset threshold is less than the first preset threshold; and determining defect status of the electrode assembly based on the first segmented image and the second segmented image.
    Type: Application
    Filed: July 24, 2023
    Publication date: March 21, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Zhiyu WANG, Xi WANG, Guannan JIANG
  • Publication number: 20240095902
    Abstract: A tab bending detection method and apparatus, an electronic device, and a storage medium are provided. The method includes: performing skeleton extraction on a sectional image of multiple layers of tabs to obtain a skeleton image of the multiple layers of tabs; merging damaged connected components in the skeleton image to obtain a merged connected component, where the damaged connected components are connected components on which breaking occurs in a same tab section; calculating a target number of the multiple layers of tabs based on the merged connected component and an undamaged connected component; and detecting, based on the target number and a preset number, whether any tab in the multiple layers of tabs is in a bending state. The damaged connected components are merged to obtain the merged connected component.
    Type: Application
    Filed: April 25, 2023
    Publication date: March 21, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Qiangwei HUANG, Guannan JIANG, Zhiyu WANG
  • Patent number: 11935260
    Abstract: This application provides a method for measuring dimensions to reduce measurement time and improve production efficiency, including: obtaining a first image and a second image of a to-be-measured workpiece, where the first image and the second image are images captured by a first camera and a second camera at different positions respectively; extracting a first corner set of the to-be-measured workpiece from the first image and a second corner set of the to-be-measured workpiece from the second image separately; rectifying position coordinates of the first corner set and position coordinates of the second corner set to obtain a position coordinate value of the first corner set and a position coordinate value of the second corner set in a same coordinate system; and obtaining dimensions of the to-be-measured workpiece based on the position coordinate value of the first corner set and the position coordinate value of the second corner set.
    Type: Grant
    Filed: March 22, 2023
    Date of Patent: March 19, 2024
    Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Tianhui Wu, Fei Chen, Guannan Jiang
  • Publication number: 20240087152
    Abstract: This application provides a method for measuring dimensions to reduce measurement time and improve production efficiency, including: obtaining a first image and a second image of a to-be-measured workpiece, where the first image and the second image are images captured by a first camera and a second camera at different positions respectively; extracting a first corner set of the to-be-measured workpiece from the first image and a second corner set of the to-be-measured workpiece from the second image separately; rectifying position coordinates of the first corner set and position coordinates of the second corner set to obtain a position coordinate value of the first corner set and a position coordinate value of the second corner set in a same coordinate system; and obtaining dimensions of the to-be-measured workpiece based on the position coordinate value of the first corner set and the position coordinate value of the second corner set.
    Type: Application
    Filed: March 22, 2023
    Publication date: March 14, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Tianhui WU, Fei CHEN, Guannan JIANG
  • Publication number: 20240086661
    Abstract: Embodiments of this application disclose a method and apparatus for processing graphic symbol and a computer-readable storage medium. The method may include: obtaining a luminance component image of a to-be-processed image, performing binarization processing based on the luminance component image of the to-be-processed image to obtain a binarized image, and performing a grayscale morphological operation based on the binarized image to obtain a target image.
    Type: Application
    Filed: November 22, 2023
    Publication date: March 14, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Xiaoyi CHEN, Fei CHEN, Guannan JIANG
  • Publication number: 20240078793
    Abstract: Embodiments of the present application provide a detection method, a detection device, and a storage medium. The detection method may comprise: obtaining a to-be-detected image; obtaining a plurality of confidence levels corresponding to a plurality of detection items according to the to-be-detected image; and determining a detection result of the to-be-detected image according to the plurality of confidence levels and a plurality of detection thresholds, where the plurality of detection thresholds may be corresponding to the plurality of detection items and may be a non-inferior solution of objective functions of an overkill rate and a missed detection rate, the overkill rate may be the ratio of qualified ones detected as defective, and the missed detection rate may be the ratio of defective ones detected as qualified.
    Type: Application
    Filed: June 1, 2023
    Publication date: March 7, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Guannan JIANG, Xi WANG, Zhiyu WANG
  • Publication number: 20240071026
    Abstract: Embodiments of this application provide a method for detecting a target point in an image. The method may include: obtaining an image under test, where the image under test may include a structure-stable first target object and a structure-unstable second target object; and processing the image under test based on a target point detection model to obtain a target point in the image under test, where the target point may include a feature point on the structure-stable first target object and a feature point on the structure-unstable second target object.
    Type: Application
    Filed: May 26, 2023
    Publication date: February 29, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Boxiong HUANG, Zhiyu WANG, Guannan JIANG
  • Publication number: 20240070840
    Abstract: Provided are a defect detection method and apparatus, and a computer-readable storage medium. Specifically, the method includes: obtaining a to-be-detected image; obtaining a feature map of the to-be-detected image based on the to-be-detected image, where the feature map of the to-be-detected image includes a feature map of spatial position coordinate information; and performing defect detection on the to-be-detected image based on the feature map of the to-be-detected image. By modifying a neural network structure of defect detection and extracting the feature map of spatial position coordinate information during the detection, this application makes the neural network for use of defect detection sensitive to a spatial position, thereby enhancing sensitivity of a detection neural network to the spatial position, and in turn, increasing accuracy of detecting some specific defect types by the detection neural network, and increasing accuracy of defect detection.
    Type: Application
    Filed: July 21, 2023
    Publication date: February 29, 2024
    Inventors: Zhiyu Wang, Xi Wang, Guannan Jiang
  • Publication number: 20240070849
    Abstract: A spot-checking method for a visual inspection system includes obtaining a plurality of to-be-inspected images, inspecting the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, and confirming availability of the visual inspection system based on the defect types and/or the parameters.
    Type: Application
    Filed: April 7, 2023
    Publication date: February 29, 2024
    Inventors: Qian WU, Jiwei CHEN, Guannan JIANG
  • Publication number: 20240071030
    Abstract: Some embodiments of this application disclose a method and device for locating a target region on an image, and a computer-readable storage medium. The method includes: obtaining coordinates of target points in a to-be-detected image based on a feature point recognition model; and locating the target region based on the coordinates of the target points. The to-be-detected image includes an unstably imaged target region. A target object in the target region includes a stably imaged first section and an unstably imaged second section. The target points include a feature point on the first section. The method can improve accuracy and efficiency of locating the target region.
    Type: Application
    Filed: July 31, 2023
    Publication date: February 29, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Boxiong HUANG, Guannan JIANG, Zhiyu WANG
  • Patent number: 11915462
    Abstract: Embodiments of this application provide a method for detecting a target point in an image. The method may include: obtaining an image under test, where the image under test may include a structure-stable first target object and a structure-unstable second target object; and processing the image under test based on a target point detection model to obtain a target point in the image under test, where the target point may include a feature point on the structure-stable first target object and a feature point on the structure-unstable second target object.
    Type: Grant
    Filed: May 26, 2023
    Date of Patent: February 27, 2024
    Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Boxiong Huang, Zhiyu Wang, Guannan Jiang
  • Patent number: 11915443
    Abstract: An image processing method includes searching for a next pixel of a skeleton branch of a target image based on an already-searched current pixel of the skeleton branch, and determining whether the skeleton branch is a burr branch based on a number of already-searched pixels of the skeleton branch.
    Type: Grant
    Filed: April 20, 2023
    Date of Patent: February 27, 2024
    Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Qiangwei Huang, Guannan Jiang, Zhiyu Wang
  • Patent number: 11915410
    Abstract: A method and an apparatus for inspecting tab appearance of cell assembly, an electronic device, a non-transitory computer-readable storage medium, and a computer program product are provided. The method includes: obtaining an image for inspection that includes a background region and a cell assembly image region, where the cell assembly image region includes a body zone and a plurality of tab stacking regions, each tab stacking region adjoining a top edge or a bottom edge of the body zone; determining each root corner of the plurality of tab stacking regions in the image for inspection; determining two side edges of the body zone in the image for inspection; determining at least one reference edge line in the image for inspection based on the two side edges of the body zone in the image for inspection; and determining result information of the tab appearance inspection based on each root corner of the plurality of tab stacking regions in the image for inspection and the at least one reference edge line.
    Type: Grant
    Filed: April 24, 2023
    Date of Patent: February 27, 2024
    Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Lu Li, Zhiyu Wang, Guannan Jiang
  • Publication number: 20240062336
    Abstract: A correction method for a depth image of a battery includes obtaining the depth image of the battery. The depth image includes two adjacent surfaces of a shell assembly of the battery and an intersecting line between the two adjacent surfaces. The method further includes extracting the intersecting line from the depth image, determining planes in the depth image in which the two adjacent surfaces are located, and obtaining a datum plane based on the intersecting line and the planes in which the two adjacent surfaces are located. The datum plane is parallel to the intersecting line, and included angles between the datum plane and the planes in which the two adjacent surfaces are located are equal to each other. The method also includes projecting and mapping points in the depth image to the datum plane, to obtain depth information of points in a corrected depth image.
    Type: Application
    Filed: July 31, 2023
    Publication date: February 22, 2024
    Inventors: Chao YUAN, Annan SHU, Guannan JIANG
  • Publication number: 20240062422
    Abstract: The present application relates to a camera calibration method and apparatus, a computer device, a storage medium, and a program product. The method includes: obtaining a first operation instruction based on a camera calibration interface; determining, from configuration information, target configuration information matching the first operation instruction and set based on the camera calibration interface; and then executing a corresponding operation in a camera calibration process based on the first operation instruction and the target configuration information. However, the camera calibration process provided by embodiments of the present application is implemented based on the camera calibration interface, without switching back and forth between a plurality of tools, thereby making the camera calibration process less cumbersome.
    Type: Application
    Filed: November 1, 2023
    Publication date: February 22, 2024
    Inventors: Qian Wu, Jiwei Chen, Guannan Jiang
  • Publication number: 20240062381
    Abstract: The present application relates to a cell detection method and apparatus, a device, a readable storage medium, and a program product. The method may include: obtaining a first image, where the first image includes a first area where a cell is located; determining a first edge line of the cell based on the first area; and determining a detection result of the cell based on grayscale values corresponding to pixels in a preset area in the first image, where the detection result is used to indicate whether the cell includes a bottom support sheet, and the preset area is an area within a preset range from the first edge line.
    Type: Application
    Filed: November 1, 2023
    Publication date: February 22, 2024
    Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Bingquan WANG, Fei CHEN, Guannan JIANG
  • Publication number: 20240062423
    Abstract: A calibration scale includes a scale body and at least two calibration pattern subsets arranged on the scale body along a first direction. The at least two calibration pattern subsets include a plurality of first calibration blocks arranged at spacings along the first direction and staggered along a second direction. Projections of the plurality of first calibration blocks in each calibration pattern subset along the first direction have a first overlapping area. Projections of at least two first overlapping areas along the first direction have a second overlapping area.
    Type: Application
    Filed: August 2, 2023
    Publication date: February 22, 2024
    Inventors: Guan CHEN, Fei CHEN, Guannan JIANG