Abstract: A choke is used to carry out high-voltage tests. The choke includes: a housing; a coil arranged in an interior of the housing; at least one electrically conductive component arranged between the coil and the housing; and a flux guide configured to guide a magnetic flux that is configured to be generated by the coil. The flux guide includes a ferromagnetic material; and is arranged between the coil and the at least one electrically conductive component in such a way that the magnetic flux that is configured to be generated by the coil is guided past the electrically conductive component.

Abstract: A choke is used to carry out high-voltage tests. The choke includes: a housing; a coil arranged in an interior of the housing; at least one electrically conductive component arranged between the coil and the housing; and a flux guide configured to guide a magnetic flux that is configured to be generated by the coil. The flux guide includes a ferromagnetic material; and is arranged between the coil and the at least one electrically conductive component in such a way that the magnetic flux that is configured to be generated by the coil is guided past the electrically conductive component.

Abstract: The present invention relates to a test system for high-voltage technology devices, in particular shunt reactors, as defined in the preamble of independent patent claim 1. The invention also relates to a method which can be carried out with this test system and is intended to test high-voltage technology devices according to coordinate patent claim 5. The general idea of the test system according to the invention is to provide a continuously adjustable inductance and a capacitance, which can be adjusted in discrete steps, on the secondary side of the test transformer in such a manner that said components form a series resonant circuit together with the test object in the form of an inductance.

Abstract: The present invention relates to a test system for high-voltage technology devices, in particular shunt reactors, as defined in the preamble of independent patent claim 1. The invention also relates to a method which can be carried out with this test system and is intended to test high-voltage technology devices according to coordinate patent claim 5. The general idea of the test system according to the invention is to provide a continuously adjustable inductance and a capacitance, which can be adjusted in in discrete steps, on the secondary side of the test transformer in such a manner that said components form a series resonant circuit together with the test object in the form of an inductance.