Patents by Inventor Guillaume Beldjoudi

Guillaume Beldjoudi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9885674
    Abstract: A method for characterizing nature of a material, including: providing at least one sample of the material between an X-ray source and a detector; using the X-ray source to make N X-radiation spectra transmitted through the material, each for a time; calculating transmission function of the material as a function of energy or the detection channel; and in each of at least two energy zones, calculating the integral of the transmission function, thus forming at least a first transmission coefficient and a second transmission coefficient.
    Type: Grant
    Filed: November 2, 2010
    Date of Patent: February 6, 2018
    Assignee: Commissariat a l'energie atomique et aux energies alternatives
    Inventors: Patrice Ouvrier-Buffet, Guillaume Beldjoudi, Veronique Rebuffel, Jean Rinkel
  • Patent number: 9476923
    Abstract: A method identifying a material, includes: measuring an electromagnetic radiation spectrum emitted through the material; determining at least one measurement energy band, and spectral coefficients of a comparison function in the measurement band, using the measured spectrum; estimating, using the determined spectral coefficients, a nature and/or thickness of the material based on a set of reference spectral parameters relating to reference materials and/or thicknesses and defined in reference bands.
    Type: Grant
    Filed: June 29, 2012
    Date of Patent: October 25, 2016
    Assignee: Commissariat a l'energie atomique et aux energies alternatives
    Inventors: Guillaume Beldjoudi, Veronique Rebuffel, Jean Rinkel
  • Patent number: 9311277
    Abstract: A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.
    Type: Grant
    Filed: June 28, 2011
    Date of Patent: April 12, 2016
    Assignee: Commissariat à l' énergie atomique et aux énergies alternatives
    Inventors: Jean Rinkel, Guillaume Beldjoudi, Jean-Marc Dinten, Georges Gonon, Veronique Rebuffel
  • Publication number: 20140126693
    Abstract: A method identifying a material, includes: measuring an electromagnetic radiation spectrum emitted through the material; determining at least one measurement energy band, and spectral coefficients of a comparison function in the measurement band, using the measured spectrum; estimating, using the determined spectral coefficients, a nature and/or thickness of the material based on a set of reference spectral parameters relating to reference materials and/or thicknesses and defined in reference bands.
    Type: Application
    Filed: June 29, 2012
    Publication date: May 8, 2014
    Applicant: Commissariat a l'energie atomique et aux ene alt
    Inventors: Guillaume Beldjoudi, Veronique Rebuffel, Jean Rinkel
  • Publication number: 20130110438
    Abstract: A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.
    Type: Application
    Filed: June 28, 2011
    Publication date: May 2, 2013
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT
    Inventors: Jean Rinkel, Guillaume Beldjoudi, Jean-Marc Dinten, Georges Gonon, Veronique Rebuffel
  • Publication number: 20120239310
    Abstract: A method for characterising nature of a material, including: providing at least one sample of the material between an X-ray source and a detector; using the X-ray source to make N X-radiation spectra transmitted through the material, each for a time; calculating transmission function of the material as a function of energy or the detection channel; and in each of at least two energy zones, calculating the integral of the transmission function, thus forming at least a first transmission coefficient and a second transmission coefficient.
    Type: Application
    Filed: November 2, 2010
    Publication date: September 20, 2012
    Applicant: commissariat a l'energie atomique et aux energies alternatives
    Inventors: Patrice Ouvrier-Buffet, Guillaume Beldjoudi, Veronique Rebuffel, Jean Rinkel