Abstract: A test station with multiple output bins on an output platform receives electronic devices under test. At each of the different output bins on the output platform, replaceable trays which accept the electronic devices are positioned. After testing of a device is completed, an automatic device handler removes a device from the test station and places it at an appropriate bin based on the test results. As the trays at each bin become full, the trays are removed and empty trays are placed at the bin. A unique guide is located near each bin position on the output platform and each tray is shaped to match one of the guides. When a tray is placed at a bin location, it will properly fit at only one bin. In certain embodiments, all the trays are identically shaped and a clip, which attaches to the side of a tray, is used to provide the complementary shape to one of the guides.