Patents by Inventor Guy Baruch

Guy Baruch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7613973
    Abstract: A method for enabling bitwise or bit slice constraints to be provided as part of the test generation process, by providing a language structure which enables these constraints to be expressed in a test generation language such as e code for example. The language structure for such bitwise constraints is then handled in a more flexible manner, such that the test generation process does not attempt to rigidly “solve” the expression containing the constraint as a function. Therefore, the propagation of constraints in such a structure do not necessarily need to be propagated from left to right, but instead are generated in a multi-directional manner. The language structure is particularly suitable for such operators as “[: ]”, “|”, “&”, “^”, “˜”, “>>” and “<<”.
    Type: Grant
    Filed: December 20, 2004
    Date of Patent: November 3, 2009
    Assignee: Cadence Design (Israel) II Ltd.
    Inventors: Vitaly Lagoon, Guy Baruch
  • Patent number: 7281241
    Abstract: A system and method for visualization and debugging of constraint systems and for constraint resolution. The present invention features a systematic, graphical representation that relates generation objects and generation decisions, preferably for example as a simple, two dimensional chart. The representation of relationships between generation entities and generation decisions, and the order in which generation decisions are made, help the user to identify and solve generation problems.
    Type: Grant
    Filed: January 15, 2002
    Date of Patent: October 9, 2007
    Assignee: Cadence Design (Israel) II Ltd.
    Inventors: Eyal Benoudiz, Guy Baruch
  • Publication number: 20050203720
    Abstract: A method for enabling bitwise or bit slice constraints to be provided as part of the test generation process, by providing a language structure which enables these constraints to be expressed in a test generation language such as e code for example. The language structure for such bitwise constraints is then handled in a more flexible manner, such that the test generation process does not attempt to rigidly “solve” the expression containing the constraint as a function. Therefore, the propagation of constraints in such a structure do not necessarily need to be propagated from left to right, but instead are generated in a multi-directional manner. The language structure is particularly suitable for such operators as “[: ]”, “|”, “&”, “{circumflex over (?)}”, “˜”, “>>” and “<<”.
    Type: Application
    Filed: December 20, 2004
    Publication date: September 15, 2005
    Inventors: Vitaly Lagoon, Guy Baruch