Abstract: A donor substrate includes a base substrate, a light to heat conversion layer, a buffer layer and a transfer layer. The light to heat conversion layer may be disposed on the base substrate. The buffer layer may be disposed on the light to heat conversion layer. The buffer layer may include at least one porous layer having a plurality of pores. The transfer layer may be disposed on the buffer layer.

Abstract: In a donor film, an organic light emitting diode display manufacturing method using the same, and an organic light emitting diode display manufactured by using the method, the donor film includes a donor substrate and a transfer layer formed on the donor substrate. The donor substrate includes a base film, a light-to-heat conversion (LTHC) layer disposed on the base film, and a curved interlayer film provided on the light-to-heat conversion layer and having a wrinkled side. The transfer layer includes an organic emission layer which is formed so as to be curved along a shape of the wrinkled side of the curved interlayer film.

Abstract: A donor substrate includes a base layer, a light to heat conversion layer on the base layer, an interlayer on the light to heat conversion layer, a low molecular weight transfer layer on the interlayer and an organic transfer layer on the low molecular weight transfer layer. The low molecular weight transfer layer includes an element in Group I or a compound of elements in Group I and Group VII.

Abstract: A device for manufacturing an organic light-emitting display panel and a method of manufacturing an organic light-emitting display panel by using the same. A device for manufacturing an organic light-emitting display panel includes a plurality of chambers; a deposition unit configured to form a transfer layer on a film supplied into the plurality of chambers in a roll-to-roll process; and a laser thermal transfer device configured to transfer a pattern of the transfer layer formed on the film onto a substrate that is supplied into a chamber of the plurality of chambers.

Abstract: Provided is a method for analyzing the performance of an OLED through activation in-situ. The method includes placing the OLED in an in-situ chamber, driving the OLED, and analyzing a dark spot and/or thermal degradation of the OLED, such that performance of the OLED can be analyzed while driving the OLED in-situ, separated from the external environment.

Abstract: Provided is a method for analyzing the performance of an OLED through activation in-situ. The method includes placing the OLED in an in-situ chamber, driving the OLED, and analyzing a dark spot and/or thermal degradation of the OLED, such that performance of the OLED can be analyzed while driving the OLED in-situ, separated from the external environment.