Patents by Inventor Hai Benron

Hai Benron has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • INSPECTION SYSTEM FOR USE IN MONITORING PLANTS IN PLANT GROWTH AREAS
    Publication number: 20240080542
    Abstract: An inspection system is presented for use in monitoring plants' conditions in a plant growing area.
    Type: Application
    Filed: November 8, 2023
    Publication date: March 7, 2024
    Inventors: David SCHEINER, Eilat TAL, Hai BENRON
  • Inspection system for use in monitoring plants in plant growth areas
    Patent number: 11849207
    Abstract: An inspection system is presented for use in monitoring plants' conditions in a plant growing area.
    Type: Grant
    Filed: September 23, 2022
    Date of Patent: December 19, 2023
    Assignee: VIEWNETIC LTD.
    Inventors: David Scheiner, Eilat Tal, Hai Benron
  • SYSTEMS AND METHODS FOR MONITORING PLANTS IN PLANT GROWING AREAS
    Publication number: 20230165181
    Abstract: Systems and methods for monitoring plants'conditions in one or more plant growing areas are presented.
    Type: Application
    Filed: March 11, 2020
    Publication date: June 1, 2023
    Inventors: David SCHEINER, Eilat TAL, Hai BENRON
  • System and method for monitoring plants in plant growing areas
    Patent number: 11601587
    Abstract: A monitoring system is presented for monitoring plants' conditions in one or more plant growing areas.
    Type: Grant
    Filed: September 9, 2019
    Date of Patent: March 7, 2023
    Assignee: VIEWNETIC LTD.
    Inventors: David Scheiner, Eilat Tal, Hai Benron
  • INSPECTION SYSTEM FOR USE IN MONITORING PLANTS IN PLANT GROWTH AREAS
    Publication number: 20230015689
    Abstract: An inspection system is presented for use in monitoring plants' conditions in a plant growing area.
    Type: Application
    Filed: September 23, 2022
    Publication date: January 19, 2023
    Inventors: David SCHEINER, Eilat TAL, Hai BENRON
  • Inspection system for use in monitoring plants in plant growth areas
    Patent number: 11483471
    Abstract: An inspection system is presented for use in monitoring plants' conditions in a plant growing area.
    Type: Grant
    Filed: September 9, 2019
    Date of Patent: October 25, 2022
    Assignee: Viewnetic Ltd.
    Inventors: David Scheiner, Eilat Tal, Hai Benron
  • SYSTEM AND METHOD FOR MONITORING PLANTS IN PLANT GROWING AREAS
    Publication number: 20220053122
    Abstract: A monitoring system is presented for monitoring plants' conditions in one or more plant growing areas.
    Type: Application
    Filed: September 9, 2019
    Publication date: February 17, 2022
    Inventors: David SCHEINER, Eilat TAL, Hai BENRON
  • INSPECTION SYSTEM FOR USE IN MONITORING PLANTS IN PLANT GROWTH AREAS
    Publication number: 20220050093
    Abstract: An inspection system is presented for use in monitoring plants' conditions in a plant growing area.
    Type: Application
    Filed: September 9, 2019
    Publication date: February 17, 2022
    Inventors: David SCHEINER, Eilat TAL, Hai BENRON
  • Method and apparatus for printing patterns on substrates
    Patent number: 6593066
    Abstract: A method and apparatus for printing a pattern on a substrate, by applying a photoresist layer over the substrate; locating a laser direct-imagining exposure head to print the pattern on the substrate by the application of one or more laser beams to the photoresist layer on the substrate while relative movement is effected between the exposure head and the substrate; and controlling the drive and the exposure head to cause the exposure head to print a first portion of the pattern on a first portion of the substrate at a first (normal) resolution, and a second portion of the pattern on a second portion of the substrate at a second (higher) resolution.
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: July 15, 2003
    Assignee: Creo IL. Ltd.
    Inventors: Oz Cabiri, Hai Benron
  • Method and apparatus for printing patterns on substrates
    Publication number: 20020118345
    Abstract: A method and apparatus for printing a pattern on a substrate, by applying a photoresist layer over the substrate; locating a laser direct-imagining exposure head to print the pattern on the substrate by the application of one or more laser beams to the photoresist layer on the substrate while relative movement is effected between the exposure head and the substrate; and controlling the drive and the exposure head to cause the exposure head to print a first portion of the pattern on a first portion of the substrate at a first (normal) resolution, and a second portion of the pattern on a second portion of the substrate at a second (higher) resolution.
    Type: Application
    Filed: February 28, 2001
    Publication date: August 29, 2002
    Applicant: CREO LTD.
    Inventors: Oz Cabiri, Hai Benron