Patents by Inventor Hai Nguy

Hai Nguy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining lifetime for media thermal decay
    Patent number: 6697203
    Abstract: A method and apparatus for determining a lifetime for a medium to fail due to thermal decay of a magnetization pattern is provided. Different stress magnetic fields are applied to a write head for writing to a machine-readable medium resulting in a magnetic field on the medium. A time to failure, corresponding to each of the different stress magnetic fields, is determined, the time to failure being an amount of time for an amplitude of a signal on the medium to degrade beyond a predetermined failure criteria. A time to failure without a stress magnetic field is determined based on the corresponding times to failure determined for each of the different stress currents.
    Type: Grant
    Filed: May 24, 2000
    Date of Patent: February 24, 2004
    Assignee: Maxtor Corporation
    Inventors: Nelson Cheng, Bill Higgins, Hai Nguy, Steven Stupp, Steven Lambert