Patents by Inventor Hajime Nakano

Hajime Nakano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8097386
    Abstract: A positive-type photosensitive resin composition for electronic materials having good film adhesiveness and sensitivity without causing a corrosion reaction to copper and copper alloys in metal wirings, a method for producing patterns and electronic parts are provided. The positive-type photosensitive resin composition includes (A) a polybenzoxazole precursor having a structure represented by the following general formula (I): wherein X represents a bivalent organic group, Y represents a tetravalent organic group, R1 represents a hydrogen atom or a monovalent organic group, and m represents an integer of 2 to 500 which represents a repeating unit number of the polymer, (B) a solvent, (C) a tetrazole derivative and (D) a compound which generates an acid by light.
    Type: Grant
    Filed: August 14, 2006
    Date of Patent: January 17, 2012
    Assignee: Hitachi Chemical DuPont Microsystems, Ltd.
    Inventors: Hajime Nakano, Noriyuki Yamazaki, Yoshiko Futagawa, Yoshika Satou, Dai Kawasaki, Takumi Ueno
  • Patent number: 7968205
    Abstract: A corrosion resistant member to be exposed to a halogen-containing gas atmosphere or a halogen-containing gas plasma atmosphere, comprising a substrate and a plurality of layers deposited thereon including a layer of rare earth fluoride providing the outermost surface and a layer of rare earth oxide having a porosity of less than 5% underlying the rare earth fluoride layer.
    Type: Grant
    Filed: October 19, 2006
    Date of Patent: June 28, 2011
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Hajime Nakano, Toshihiko Tsukatani, Takao Maeda
  • Patent number: 7932012
    Abstract: A heat resistant photosensitive resin composition having excellent film properties is provided by constituting a photosensitive resin composition containing (A) a polymer having an acid functional group and/or a substituent derived therefrom, (B) a compound having at least one substituent derived from an amine functional group, (C) a photoreactive compound, and (D) a solvent. Using this composition, a pattern with high resolution can be produced, and thus an electronic part having a high quality can be produced.
    Type: Grant
    Filed: March 31, 2004
    Date of Patent: April 26, 2011
    Assignee: Hitachi Chemical Dupont Microsystems Ltd.
    Inventors: Hiroshi Komatsu, Nagatoshi Fujieda, Hajime Nakano
  • Publication number: 20110076458
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Application
    Filed: December 7, 2010
    Publication date: March 31, 2011
    Inventors: Masataka NUNOMURA, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Publication number: 20110027544
    Abstract: A resin composition includes: (A) a polymer having a structural unit shown by the formula (I), and an acidic functional group or a group derived therefrom at both of the terminals; wherein X1 is a di- to octa-valent organic group, Y1 is a di- to octa-valent organic group, R1 is a hydrogen atom or an organic group having 1 to 20 carbon atoms, R2 is a hydrogen atom or a monovalent organic group, when plural R1s or R2s exist, the plural R1s or R2s may be the same or different, p and q are independently an integer of 0 to 4, l and m are independently an integer of 0 to 2, and n is an integer of 2 or more indicating the number of structural units; (B) a solvent; and (C) a compound shown by formula (II) wherein R3 is a monovalent organic group.
    Type: Application
    Filed: April 30, 2010
    Publication date: February 3, 2011
    Applicant: HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD.
    Inventor: Hajime NAKANO
  • Patent number: 7851128
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Grant
    Filed: November 29, 2006
    Date of Patent: December 14, 2010
    Assignees: Hitachi Chemical Dupont Microsystems Ltd., Hitachi Chemical Dupont Microsystems L.L.C.
    Inventors: Masataka Nunomura, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Patent number: 7816013
    Abstract: A wafer has a rare earth fluoride coating disposed, typically sprayed on a substrate as an outermost layer, the rare earth fluoride being selected from lanthanoid fluorides, yttrium fluoride, and scandium fluoride. It is useful as a dummy wafer in a plasma etching or deposition system.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: October 19, 2010
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Toshihiko Tsukatani, Masaru Konya, Noriaki Hamaya, Hajime Nakano, Takao Maeda
  • Publication number: 20100227126
    Abstract: A positive-type photosensitive resin composition for electronic materials having good film adhesiveness and sensitivity without causing a corrosion reaction to copper and copper alloys in metal wirings, a method for producing patterns and electronic parts are provided. The positive-type photosensitive resin composition includes (A) a polybenzoxazole precursor having a structure represented by the following general formula (I): wherein X represents a bivalent organic group, Y represents a tetravalent organic group, R1 represents a hydrogen atom or a monovalent organic group, and m represents an integer of 2 to 500 which represents a repeating unit number of the polymer, (B) a solvent, (C) a tetrazole derivative and (D) a compound which generates an acid by light.
    Type: Application
    Filed: August 14, 2006
    Publication date: September 9, 2010
    Inventors: Hajime Nakano, Noriyuki Yamazaki, Yoshiko Futagawa, Yoshika Satou, Dai Kawasaki, Takumi Ueno
  • Patent number: 7674427
    Abstract: By using a rare earth metal having a minimal content of impurity metal element, machining it into a member and cleaning with an organic acid-base capping agent, there is obtained a rare earth metal member composed entirely of a rare earth metal and containing not more than 100 ppm of impurity metal element in a sub-surface zone, which member is characterized by a high surface purity, a large grain size, minimized grain boundaries, and improved halogen resistance or corrosion resistance.
    Type: Grant
    Filed: June 28, 2006
    Date of Patent: March 9, 2010
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Toshihiko Tsukatani, Hajime Nakano, Takao Maeda
  • Patent number: 7655328
    Abstract: An electrically conductive, plasma-resistant member adapted for exposure to a halogen-based gas plasma atmosphere includes a substrate having formed on at least part of a region thereof to be exposed to the plasma a thermal spray coating composed of yttrium metal or yttrium metal in admixture with yttrium oxide and/or yttrium fluoride so as to confer electrical conductivity. Because the member is conductive and has an improved erosion resistance to halogen-based corrosive gases or plasmas thereof, particle contamination due to plasma etching when used in semiconductor manufacturing equipment or flat panel display manufacturing equipment can be suppressed.
    Type: Grant
    Filed: April 19, 2007
    Date of Patent: February 2, 2010
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Takao Maeda, Yuuichi Makino, Hajime Nakano, Ichiro Uehara
  • Patent number: 7638254
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Grant
    Filed: September 10, 2008
    Date of Patent: December 29, 2009
    Assignee: Hitachi Chemical Dupont Microsystems Ltd
    Inventors: Takashi Hattori, Yasuharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano
  • Publication number: 20090191429
    Abstract: A ceramic sprayed member comprises a substrate and a ceramic sprayed coating thereon. Splats have been removed from the surface of the sprayed coating, typically by blasting. The ceramic sprayed member with improved plasma resistance mitigates particle contamination of wafers and enables stable manufacture when used in a halogen plasma process for semiconductor fabrication or the like.
    Type: Application
    Filed: January 23, 2009
    Publication date: July 30, 2009
    Applicant: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Takao MAEDA, Hajime NAKANO, Toshihiko TSUKATANI
  • Publication number: 20090142605
    Abstract: A wafer has a rare earth fluoride coating disposed, typically sprayed on a substrate as an outermost layer, the rare earth fluoride being selected from lanthanoid fluorides, yttrium fluoride, and scandium fluoride. It is useful as a dummy wafer in a plasma etching or deposition system.
    Type: Application
    Filed: December 2, 2008
    Publication date: June 4, 2009
    Applicant: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Toshihiko TSUKATANI, Masaru KONYA, Noriaki HAMAYA, Hajime NAKANO, Takao MAEDA
  • Publication number: 20090108414
    Abstract: A wafer has a rare earth oxide layer disposed, typically sprayed, on a substrate. It is useful as a dummy wafer in a plasma etching or deposition system.
    Type: Application
    Filed: October 27, 2008
    Publication date: April 30, 2009
    Applicant: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Toshihiko TSUKATANI, Takao MAEDA, Junichi NAKAYAMA, Hirofumi KAWAZOE, Masaru KONYA, Noriaki HAMAYA, Hajime NAKANO
  • Publication number: 20090011364
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Application
    Filed: September 10, 2008
    Publication date: January 8, 2009
    Inventors: Takashi HATTORI, Yasuharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano
  • Patent number: 7462407
    Abstract: A Group IIIA element fluoride-containing coating comprising a Group IIIA element fluoride phase which contains at least 50% of a crystalline phase of the orthorhombic system belonging to space group Pnma is formed on a member for imparting corrosion resistance so that the member may be used in a corrosive halogen species-containing atmosphere. When the state of a crystalline phase is properly controlled, the coating experiences only a little color change by corrosion. A Group IIIA element fluoride-containing coating having a micro-Vickers hardness Hv of at least 100 is minimized in weight loss by-corrosion.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: December 9, 2008
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Takao Maeda, Hajime Nakano, Satoshi Shima
  • Patent number: 7435525
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Grant
    Filed: March 11, 2005
    Date of Patent: October 14, 2008
    Assignee: Hitachi Chemical Dupont Microsystems Ltd.
    Inventors: Takashi Hattori, Yasuharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano
  • Publication number: 20080233513
    Abstract: A heat resistant photosensitive resin composition having excellent film properties is provided by constituting a photosensitive resin composition containing (A) a polymer having an acid functional group and/or a substituent derived therefrom, (B) a compound having at least one substituent derived from an amine functional group, (C) a photoreactive compound, and (D) a solvent. Using this composition, a pattern with high resolution can be produced, and thus an electronic part having a high quality can be produced.
    Type: Application
    Filed: March 31, 2004
    Publication date: September 25, 2008
    Inventors: Hiroshi Komatsu, Nagatoshi Fujieda, Hajime Nakano
  • Publication number: 20070248832
    Abstract: An electrically conductive, plasma-resistant member adapted for exposure to a halogen-based gas plasma atmosphere includes a substrate having formed on at least part of a region thereof to be exposed to the plasma a thermal spray coating composed of yttrium metal or yttrium metal in admixture with yttrium oxide and/or yttrium fluoride so as to confer electrical conductivity. Because the member is conductive and has an improved erosion resistance to halogen-based corrosive gases or plasmas thereof, particle contamination due to plasma etching when used in semiconductor manufacturing equipment or flat panel display manufacturing equipment can be suppressed.
    Type: Application
    Filed: April 19, 2007
    Publication date: October 25, 2007
    Inventors: Takao Maeda, Yuuichi Makino, Hajime Nakano, Ichiro Uehara
  • Publication number: 20070122733
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Application
    Filed: March 11, 2005
    Publication date: May 31, 2007
    Inventors: Takashi Hattori, Yasaharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano