Abstract: An apparatus and method for measuring a capacitance on the sensor element using two charge rates. The two charge rates may be two charging rates, or alternatively, two discharging rates for discharging the sensor element. Alternatively, both the two charging and discharging rates may be used to measure the capacitance. The method may be performed by charging a sensor element of a sensing device for a fixed time at the first charging rate, and charging the sensor element at the second charging rate to reach a threshold voltage after charging the sensor element for the fixed time. The method may also be performed by discharging the sensor element for a fixed time at the first discharging rate, and discharging the sensor element at the second discharging rate to reach a threshold voltage after discharging the sensor element for the fixed time.