Abstract: Various aspects directed towards an integrated transverse electromagnetic (TEM) transmission line structure for probe calibration are disclosed. In one example, the integrated TEM transmission line structure includes a printed circuit board (PCB) and an air-dielectric coplanar waveguide (CPW). For this example, the air-dielectric CPW includes an air trace in a cutout slot of the PCB. In another example, a method is disclosed, which includes forming an air-dielectric CPW on a PCB in which the air-dielectric CPW includes an air trace in a cutout slot of the PCB. In a further example, an integrated TEM transmission line structure includes an air-dielectric CPW with an air trace. For this example, a first connector is electrically coupled to a first end of the air-dielectric CPW, and a second connector is electrically coupled to a second end of the air-dielectric CPW.

Abstract: Apparatus and associated methods relate to augmenting a device model identified by artificial intelligence, with measurements of physical parameters, iteratively validating and verifying the augmented model until the augmented model satisfies a quality criterion determined as a function of the artificial intelligence, and automatically synthesizing an interactive simulation and measurement environment, based on the model. The model may be identified by the artificial intelligence based on measurement of a device operating characteristic. The physical parameter measurements the model is augmented with may be determined by the artificial intelligence, based on the model. The model may include a component, sub-system, and system model, permitting validation and verification through multiple levels. Various implementations may automatically generate a measurement scenario including communication commands configured to validate and verify the augmented model.

Abstract: A system and method for detecting and characterizing high intensity electromagnetic interference signals uses a multichannel detection unit that includes a threshold-based latch to detect a potential electromagnetic interference signal from received signals based on signal strength, power detector to measure power of the detected potential electromagnetic interference signal and a frequency detector to detect a frequency of the detected potential electromagnetic interference signal. Outputs of the multichannel detection unit are then used to determine characteristics of the detected potential electromagnetic interference signal.

Abstract: Various aspects directed towards an integrated transverse electromagnetic (TEM) transmission line structure for probe calibration are disclosed. In one example, the integrated TEM transmission line structure includes a printed circuit board (PCB) and an air-dielectric coplanar waveguide (CPW). For this example, the air-dielectric CPW includes an air trace in a cutout slot of the PCB. In another example, a method is disclosed, which includes forming an air-dielectric CPW on a PCB in which the air-dielectric CPW includes an air trace in a cutout slot of the PCB. In a further example, an integrated TEM transmission line structure includes an air-dielectric CPW with an air trace. For this example, a first connector is electrically coupled to a first end of the air-dielectric CPW, and a second connector is electrically coupled to a second end of the air-dielectric CPW.

Abstract: A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.

Abstract: A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourier transform are multiplied by a complex phase adjustment term as a function of distance from the sampling locations to the DUT to translate the measured field component values back to the locations on the surface of the DUT.

Abstract: A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.

Abstract: A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourier transform are multiplied by a complex phase adjustment term as a function of distance from the sampling locations to the DUT to translate the measured field component values back to the locations on the surface of the DUT.