Abstract: An integrated circuit has a transceiver circuit and a memory circuit. The transceiver circuit includes stage circuits that each perform at least one function specified by a data transmission protocol. The transceiver circuit is coupled to receive packets of timing test patterns. Each of the stage circuits in the transceiver circuit generates a timestamp in response to receiving each of the packets of timing test patterns. Each of the stage circuits in the transceiver circuit generates a trigger indicating receipt of a predefined reference point in each of the packets of timing test patterns. The memory circuit stores each of the timestamps generated by the stage circuits in response to a respective one of the triggers and outputs the timestamps for analysis.

Abstract: Methods and systems are provided for decrypting and/or encryption information received by and/or transmitted from an integrated circuit (IC) device input/output (I/O) interface. A decryption circuit is configurable to apply a first decryption algorithm selected from a plurality of decryption algorithms to received information. An encryption circuit is configurable to apply a first encryption algorithm selected from a plurality of encryption algorithms to transmitted information. A key wrapping circuit is configurable to wrap decryption and/or encryption keys associated with the first decryption and/or encryption algorithm. A firewall circuit is configurable to prevent unauthorized access to the wrapped decryption and/or encryption keys. The decryption and/or encryption circuits are reconfigurable to apply a second decryption algorithm and/or a second encryption algorithm to the received information and/or the transmitted information.

Abstract: An integrated circuit includes a multiplexer circuit coupled to receive a first clock signal and a second clock signal and coupled to provide an output clock signal to a channel. A protection circuit is coupled to receive a feedback signal from the channel. The protection circuit causes the multiplexer circuit to provide oscillations in the second clock signal to the output clock signal in response to the feedback signal indicating that the channel is idle to cause the channel to be in a protection mode that reduces degradation from bias temperature instability. The protection circuit causes the multiplexer circuit to provide oscillations in the first clock signal to the output clock signal in response to the feedback signal indicating that the channel is active.

Abstract: An integrated circuit may include a reconfigurable functional circuit block coupled to a microcontroller. The microcontroller may monitor a trigger register that receives trigger signals at a reconfiguration portion. The trigger signals may initiate corresponding reconfiguration operations by triggering the execution of instructions in a reconfiguration sequence program to load appropriate configuration data to configuration registers. The configuration registers may determine the operating mode of the functional circuit block by activating a subcomponent module in the functional circuit block. By providing a reconfiguration port that has full control of the reconfiguration of the functional circuit block, sensitive information regarding the implementation of the functional circuit block, the microcontroller, and connections therebetween may be protected while simplifying the design process for a custom logic circuit generated based on the reconfigurable functional circuit block.

Abstract: An integrated circuit has a transceiver circuit and a memory circuit. The transceiver circuit includes stage circuits that each perform at least one function specified by a data transmission protocol. The transceiver circuit is coupled to receive packets of timing test patterns. Each of the stage circuits in the transceiver circuit generates a timestamp in response to receiving each of the packets of timing test patterns. Each of the stage circuits in the transceiver circuit generates a trigger indicating receipt of a predefined reference point in each of the packets of timing test patterns. The memory circuit stores each of the timestamps generated by the stage circuits in response to a respective one of the triggers and outputs the timestamps for analysis.

Abstract: The present disclosure provides a link assist capability that may be added to a compiled design that includes a transceiver. The transceiver with the link assist capability may be dynamically reconfigured to operate in a link assist mode, which is a diagnostic and test mode. The link assist mode may interact with a HSSI link partner, or a design software tool, or a user-defined program. The link assist mode may also facilitate remote debugging. One embodiment relates to an apparatus for serial interface link assist. Another embodiment relates to a method of dynamic reconfiguration of transceiver settings. Another embodiment relates to a method of tuning a bidirectional serial link. Other features, aspects and embodiments are also disclosed.

Abstract: An integrated circuit may include a reconfigurable functional circuit block coupled to a microcontroller. The microcontroller may monitor a trigger register that receives trigger signals at a reconfiguration portion. The trigger signals may initiate corresponding reconfiguration operations by triggering the execution of instructions in a reconfiguration sequence program to load appropriate configuration data to configuration registers. The configuration registers may determine the operating mode of the functional circuit block by activating a subcomponent module in the functional circuit block. By providing a reconfiguration port that has full control of the reconfiguration of the functional circuit block, sensitive information regarding the implementation of the functional circuit block, the microcontroller, and connections therebetween may be protected while simplifying the design process for a custom logic circuit generated based on the reconfigurable functional circuit block.

Abstract: Circuits and methods are disclosed for low-skew bonding of a plurality of data channels into a multi-lane data channel. In one embodiment, phase-measuring first-in first-out buffer circuits buffer pre-buffer parallel data signals and generate phase-measurement signals. A channel-bonding control circuit receives the phase-measurement signals and generates bit-slip control signals. Transmission bit-slip circuits slip integer numbers of bits based on the bit-slip control signals. Bypass registers may be used when the integer number of bits is greater or equal to the parallel width of a lane. In another embodiment, the channel-bonding control circuit receives the phase-measurement signals from the phase-measuring FIFO buffer circuits and generates clock-slip control signals. Clock slip circuits controllably slip parallel clock signals by integer numbers of unit intervals of a serial clock signal. Various other aspects, features, and embodiments are also disclosed.

Abstract: A control system controls First-In First-Out (FIFO) settings of a receiving system. The control system includes a FIFO settings controller that receives a first signal indicative of a first frequency of data received by the receiving system. The FIFO settings controller receives a second signal indicative of a second frequency of a clock that reads the data received by the receiving system. The FIFO settings controller determines a difference (e.g., a parts-per-million (PPM) difference) between the first frequency and the second frequency. The FIFO settings controller sends a third signal indicative of instructions to adjust FIFO configuration settings based on the PPM difference.

Abstract: A control system controls First-In First-Out (FIFO) settings of a receiving system. The control system includes a FIFO settings controller that receives a first signal indicative of a first frequency of data received by the receiving system. The FIFO settings controller receives a second signal indicative of a second frequency of a clock that reads the data received by the receiving system. The FIFO settings controller determines a difference (e.g., a parts-per-million (PPM) difference) between the first frequency and the second frequency. The FIFO settings controller sends a third signal indicative of instructions to adjust FIFO configuration settings based on the PPM difference.

Abstract: Circuits and methods are disclosed for low-skew bonding of a plurality of data channels into a multi-lane data channel. In one embodiment, phase-measuring first-in first-out buffer circuits buffer pre-buffer parallel data signals and generate phase-measurement signals. A channel-bonding control circuit receives the phase-measurement signals and generates bit-slip control signals. Transmission bit-slip circuits slip integer numbers of bits based on the bit-slip control signals. Bypass registers may be used when the integer number of bits is greater or equal to the parallel width of a lane. In another embodiment, the channel-bonding control circuit receives the phase-measurement signals from the phase-measuring FIFO buffer circuits and generates clock-slip control signals. Clock slip circuits controllably slip parallel clock signals by integer numbers of unit intervals of a serial clock signal. Various other aspects, features, and embodiments are also disclosed.

Abstract: Circuits and methods are disclosed for low-skew bonding of a plurality of data channels into a multi-lane data channel. In one embodiment, phase-measuring first-in first-out buffer circuits buffer pre-buffer parallel data signals and generate phase-measurement signals. A channel-bonding control circuit receives the phase-measurement signals and generates bit-slip control signals. Transmission bit-slip circuits slip integer numbers of bits based on the bit-slip control signals. Bypass registers may be used when the integer number of bits is greater or equal to the parallel width of a lane. In another embodiment, the channel-bonding control circuit receives the phase-measurement signals from the phase-measuring FIFO buffer circuits and generates clock-slip control signals. Clock slip circuits controllably slip parallel clock signals by integer numbers of unit intervals of a serial clock signal. Various other aspects, features, and embodiments are also disclosed.

Abstract: The present disclosure provides a link assist capability that may be added to a compiled design that includes a transceiver. The transceiver with the link assist capability may be dynamically reconfigured to operate in a link assist mode, which is a diagnostic and test mode. The link assist mode may interact with a HSSI link partner, or a design software tool, or a user-defined program. The link assist mode may also facilitate remote debugging. One embodiment relates to an apparatus for serial interface link assist. Another embodiment relates to a method of dynamic reconfiguration of transceiver settings. Another embodiment relates to a method of tuning a bidirectional serial link. Other features, aspects and embodiments are also disclosed.

Abstract: An integrated circuit may include multiple circuit blocks, each with an associated latency value. As an example, transceiver circuitry in an integrated circuit may receive different data packets and circuit blocks in the transceiver circuitry may have different latency values depending on the data packets received. The integrated circuit may further include latency computation circuitry that receives the different latency values from the multiple circuit blocks. The latency computation circuitry may accordingly output a total latency value for the multiple circuit blocks in the integrated circuit based on the received latency values.

Abstract: Circuits and techniques for operating an integrated circuit (IC) are disclosed. A disclosed circuit includes a divider circuit that is operable to receive a first signal at a first speed and output a second signal at a second speed based on the first signal. A recovery circuit is coupled to the divider circuit. The recovery circuit is operable to determine the frequency of the second signal and is further operable to generate a first ready signal and a recovered clock signal based on the second signal. A phase aligner circuit, operable to align a phase of the second signal with a phase of the recovered clocks signal based on the first ready signal, is coupled to the recovery circuit.

Abstract: Transceiver circuitry may include a storage element that receives data signals from an external element, an alignment detector circuit, and a register. The storage element has a write clock terminal that receives a channel clock signal and a read clock terminal that receives another channel clock signal. The alignment detector circuit is adapted to generate an asserted ready signal when a predefined pattern is detected in the received data signals. The register receives an output signal from the storage element and outputs the output signal based on the asserted ready signal that is generated by the alignment detector circuit. The register may be clocked by the same channel clock signal that is received at the read clock terminal of the storage element.

Abstract: Techniques and mechanisms determine latencies of transmitters of transceivers and use the determined latencies to adjust latencies of the transmitters. For example, a test pattern may be used to determine a first transmitter has a higher latency than a second transmitter. The second transmitter may be provided data indicating a delay to increase its latency such that it matches the first transmitter.

Abstract: Circuits and techniques for operating an integrated circuit (IC) are disclosed. A disclosed circuit includes a divider circuit that is operable to receive a first signal at a first speed and output a second signal at a second speed based on the first signal. A recovery circuit is coupled to the divider circuit. The recovery circuit is operable to determine the frequency of the second signal and is further operable to generate a first ready signal and a recovered clock signal based on the second signal. A phase aligner circuit, operable to align a phase of the second signal with a phase of the recovered clocks signal based on the first ready signal, is coupled to the recovery circuit.

Abstract: A system and method are disclosed for determining the minimum required processing speed for a quadrature decoder using measurements of encoder performance, and to assess the safety factor of a particular decoder processing speed. The system and method may also be used to indicate proper adjustment direction by displaying real-time error measurements during encoder alignment. The system measures a logic state width error and calculates alignment parameters, processing speed and a safety factor. The method allows a measured logic state width error to be used to calculate a minimum required processing speed and safety factor.