Patents by Inventor Hans Casper Gerritsen

Hans Casper Gerritsen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for observing a sample with a particle beam and an optical microscope
    Patent number: 7671333
    Abstract: An apparatus for observing a sample (1) with a TEM column and an optical high resolution scanning microscope (10). The sample position when observing the sample with the TEM column differs from the sample position when observing the sample with the optical microscope in that in the latter case the sample is tilted towards the light-optical microscope. By using an optical microscope of the scanning type, and preferably using monochromatic light, the lens elements (11) of the optical microscope facing the sample position can be sufficiently small to be positioned between the pole faces (8A, 8B) of the (magnetic) particle-optical objective lens (7). This is in contrast with the objective lens systems conventionally used in optical microscopes, which show a large diameter. Furthermore the optical microscope, or at least the parts (11) close to the sample, may be retractable so as to free space when imaging in TEM mode.
    Type: Grant
    Filed: February 5, 2008
    Date of Patent: March 2, 2010
    Assignee: FEI Company
    Inventors: Alexandra Valerievna Agronskaja, Hans Casper Gerritsen, Adrianus Johannes Verkleij, Abraham Johannes Koster
  • APPARATUS FOR OBSERVING A SAMPLE WITH A PARTICLE BEAM AND AN OPTICAL MICROSCOPE
    Publication number: 20080210869
    Abstract: An apparatus for observing a sample (1) with a TEM column and an optical high resolution scanning microscope (10). The sample position when observing the sample with the TEM column differs from the sample position when observing the sample with the optical microscope in that in the latter case the sample is tilted towards the light-optical microscope. By using an optical microscope of the scanning type, and preferably using monochromatic light, the lens elements (11) of the optical microscope facing the sample position can be sufficiently small to be positioned between the pole faces (8A, 8B) of the (magnetic) particle-optical objective lens (7). This is in contrast with the objective lens systems conventionally used in optical microscopes, which show a large diameter. Furthermore the optical microscope, or at least the parts (11) close to the sample, may be retractable so as to free space when imaging in TEM mode.
    Type: Application
    Filed: February 5, 2008
    Publication date: September 4, 2008
    Applicant: FEI COMPANY
    Inventors: Hans Casper Gerritsen, Adrianus Johannes Verkleij, Alexandra Valerievna Agronskaja, Abraham Johannes Koster