Patents by Inventor Hans Peter Sprong

Hans Peter Sprong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9370084
    Abstract: The present invention relates to determining changes in the X-ray emission yield of an X-ray tube, in particular determining dose degradation. In order to provide determination of such changes, an X-ray source is provided comprising a cathode, an anode; and at least one X-ray sensor (16). The cathode emits electrons towards the anode and the anode comprises a target area on which the electrons impinge, generating X-ray radiation. An X-ray barrier (24) is provided with an aperture (26) for forming an emitting X-ray beam from the X-ray radiation, wherein the emitting X-ray beam has a beam formation (30) with a central axis. The at least one X-ray sensor is arranged within the beam formation and measures the X-ray intensity for a specific direction of X-ray emission with an angle with respect to the central axis. The at least one X-ray sensor can be positioned inside the beam formation (30), but outside the “actual field of view” (40) as determined by a diaphragm (36).
    Type: Grant
    Filed: November 2, 2011
    Date of Patent: June 14, 2016
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Hans Peter Sprong, Martin Kimutai Duerr, Rainer Kiewitt
  • Publication number: 20130223594
    Abstract: The present invention relates to determining changes in the X-ray emission yield of an X-ray tube, in particular determining dose degradation. In order to provide determination of such changes, an X-ray source is provided comprising a cathode, an anode; and at least one X-ray sensor (16). The cathode emits electrons towards the anode and the anode comprises a target area on which the electrons impinge, generating X-ray radiation. An X-ray barrier (24) is provided with an aperture (26) for forming an emitting X-ray beam from the X-ray radiation, wherein the emitting X-ray beam has a beam formation (30) with a central axis. The at least one X-ray sensor is arranged within the beam formation and measures the X-ray intensity for a specific direction of X-ray emission with an angle with respect to the central axis. The at least one X- ray sensor can be positioned inside the beam formation (30), but outside the “actual field of view” (40) as determined by a diaphragm (36).
    Type: Application
    Filed: November 2, 2011
    Publication date: August 29, 2013
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Hans Peter Sprong, Martin Kimutai Sprong, Rainer Kiewitt