Patents by Inventor Hans W. P. Koops
Hans W. P. Koops has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9583298Abstract: Nano granular materials (NGM) are provided that have the extraordinary capability to conduct current in a 100 fold current density compared to high Tc superconductors by charges moving in form of Bosons produced by Bose-Einstein-Condensation (BEC) in overlapping excitonic surface orbital states at room temperature and has a light dependent conductivity. The material is disposed between electrically conductive connections and is a nano-crystalline composite material. Also provided are electrical components comprising NGM and methods and arrangements for making it by corpuscular-beam induced deposition applied to a substrate, using inorganic compounds being adsorbed on the surface of the substrate owing to their vapor pressure, and which render a crystalline conducting phase embedded in an inorganic insolating matrix enclosing the material.Type: GrantFiled: September 6, 2013Date of Patent: February 28, 2017Assignee: HAWILKO GMBHInventor: Hans W. P. Koops
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Publication number: 20150255239Abstract: Nano granular materials (NGM) are provided that have the extraordinary capability to conduct current in a 100 fold current density compared to high Tc superconductors by charges moving in form of Bosons produced by Bose-Einstein-Condensation (BEC) in overlapping excitonic surface orbital states at room temperature and has a light dependent conductivity. The material is disposed between electrically conductive connections and is a nano-crystalline composite material. Also provided are electrical components comprising NGM and methods and arrangements for making it by corpuscular-beam induced deposition applied to a substrate, using inorganic compounds being adsorbed on the surface of the substrate owing to their vapor pressure, and which render a crystalline conducting phase embedded in an inorganic insolating matrix enclosing the material.Type: ApplicationFiled: September 6, 2013Publication date: September 10, 2015Applicant: HAWILKO GMBHInventor: Hans W.P. Koops
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Patent number: 8868156Abstract: A device (1) for use in optical spectroscopy and a method for its manufacture are described. The device includes at least one light source (8) and at least one spectrometer (3) fabricated integratively, the optical components of the at least one spectrometer (3) being optical microcomponents (11,13,16,19,20,21) which are mounted integratively on the top and/or bottom side (9,12) of a substrate board (2). In the method according to the present invention, at least one light source (8) is mounted on a substrate board (2), and at least one spectrometer (3) is produced monolithically in a three-dimensional integration on the substrate board (2). In this context, the spectrometer (3) that is produced according to the method is assembled from optical microcomponents (11,13,16,19,20,21).Type: GrantFiled: November 22, 2000Date of Patent: October 21, 2014Assignee: Deutsche Telekom AGInventors: Hans W. P. Koops, Andreas Reinhardt
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Patent number: 8648319Abstract: The invention relates to a device for generating electromagnetic THz radiation with free electron beams, comprising a dynatron tube, where the dynatron tube comprises an electron source, an extraction grid, and, an anode preferably coated with a material composition for high secondary electron emission, arranged in vacuum. The dynatron tube is connected to a voltage supply supplying an extractor voltage and an anode voltage and the extractor voltage is higher than the anode voltage. An oscillator modulates the anode voltage and the anode voltage is set to a work point voltage.Type: GrantFiled: July 26, 2011Date of Patent: February 11, 2014Inventor: Hans W. P. Koops
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Publication number: 20130264500Abstract: The invention relates to a device for generating electromagnetic THz radiation with free electron beams, comprising a dynatron tube, where the dynatron tube comprises an electron source, an extraction grid, and, an anode preferably coated with a material composition for high secondary electron emission, arranged in vacuum. The dynatron tube is connected to a voltage supply supplying an extractor voltage and an anode voltage and the extractor voltage is higher than the anode voltage. An oscillator modulates the anode voltage and the anode voltage is set to a work point voltage.Type: ApplicationFiled: July 26, 2011Publication date: October 10, 2013Inventor: Hans W. P. Koops
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Patent number: 7868290Abstract: A material processing system for processing a work piece is provided. The material processing is effected by supplying a reactive gas and energetic radiation for activation of the reactive gas to a surrounding of a location of the work piece to be processed. The radiation is preferably provided by an electron microscope. An objective lens of the electron microscope is preferably disposed between a detector of the electron microscope and the work piece. A gas supply arrangement of the material processing system comprises a valve disposed spaced apart from the processing location, a gas volume between the valve and a location of emergence of the reaction gas being small. The gas supply arrangement further comprises a temperature-adjusted, especially cooled reservoir for accommodating a starting material for the reactive gas.Type: GrantFiled: September 26, 2008Date of Patent: January 11, 2011Assignees: Carl Zeiss NTS GmbH, Nawotech GmbHInventors: Hans W. P. Koops, Peter Hoffrogge
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Publication number: 20090121132Abstract: A material processing system for processing a work piece is provided. The material processing is effected by supplying a reactive gas and energetic radiation for activation of the reactive gas to a surrounding of a location of the work piece to be processed. The radiation is preferably provided by an electron microscope. An objective lens of the electron microscope is preferably disposed between a detector of the electron microscope and the work piece. A gas supply arrangement of the material processing system comprises a valve disposed spaced apart from the processing location, a gas volume between the valve and a location of emergence of the reaction gas being small. The gas supply arrangement further comprises a temperature-adjusted, especially cooled reservoir for accommodating a starting material for the reactive gas.Type: ApplicationFiled: September 26, 2008Publication date: May 14, 2009Applicants: CARL ZEISS NTS GMBH, NAWOTEC GMBHInventors: Hans W.P. Koops, Peter Hoffrogge
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Patent number: 7435973Abstract: A material processing system for processing a work piece is provided. The material processing is effected by supplying a reactive gas and energetic radiation for activation of the reactive gas to a surrounding of a location of the work piece to be processed. The radiation is preferably provided by an electron microscope. An objective lens of the electron microscope is preferably disposed between a detector of the electron microscope and the work piece. A gas supply arrangement of the material processing system comprises a valve disposed spaced apart from the processing location, a gas volume between the valve and a location of emergence of the reaction gas being small. The gas supply arrangement further comprises a temperature-adjusted, especially cooled reservoir for accommodating a starting material for the reactive gas.Type: GrantFiled: August 7, 2006Date of Patent: October 14, 2008Assignees: Carl Zeiss NTS GmbH, NaWoTee GmbHInventors: Hans W. P. Koops, Peter Hoffrogge
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Patent number: 6967714Abstract: The matter for which the refractive index is to be determined, is made available in the form of a theoretically determinable scattering or diffraction pattern. Two or more orders of diffraction may then be defined to form at least one intensity ratio. At least one intensity distribution may be formed by irradiating the scattering pattern using one light beam of a defined shape. Subsequently thereto, the intensity ratio may be formed based on the orders of diffraction of the intensity distribution. In addition, at least one portion of a characteristic curve may be determined, which represents the dependency of the intensity ratio on the refractive index, and, with whose assistance, the corresponding refractive index can be assigned to the intensity ratio formed.Type: GrantFiled: March 24, 2001Date of Patent: November 22, 2005Assignee: NaWoTec GmbHInventors: Hans W. P. Koops, Alexander Kaya, Ottokar Leminger
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Patent number: 6909104Abstract: A miniaturized terahertz radiation source based on the Smith-Purcell effect is provided, in which, from a focused electron source, a high-energy bundle of electrons is transmitted at a defined distance over a reflection diffraction grating composed of transversely disposed grating rods, so that, in response to oscillating image charges, electromagnetic waves of one wavelength are emitted, the wavelength being adjustable as a function of the periodicity of the lines and of the electron velocity. The elements of the radiation source, such as field emitter (1), electrostatic lens (4), beam deflector (5), grating (7) of metal, and a second anode (8), are integrated on a semiconductor chip using additive nanolithographic methods. The field electron source is constructed to project, as a wire, out of the surface, using additive nanolithography, and is made of readily conductive material having stabilizing series resistance.Type: GrantFiled: May 10, 2000Date of Patent: June 21, 2005Assignee: NaWoTec GmbHInventors: Hans W. P. Koops, Tobias Bauer, Wolfgang Elsässer, Filip Floreani, Hartmut Roskos
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Patent number: 6903549Abstract: Inordinate localised systems are used at room temperature in a novel device in the form of an electron spectrometer for utilising single-electron electronic applications. Said electron spectrometer device consists of a nanocrystalline metal or a nanocrystalline semiconductor material used as conductor strip connection in the form of an inlet or an outlet for single-electron electronic components and circuits consisting of lithographically produced quantum dots. The resulting single-electron electronic device consisting of quantum dots is supplied with energetically very sharply defined electrons. Said device can thus be operated at room temperature, undisturbed by phonons.Type: GrantFiled: August 8, 2001Date of Patent: June 7, 2005Assignee: NaWoTec GmbHInventors: Hans W. P. Koops, Alexander Kaya
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Publication number: 20040204640Abstract: Inordinate localised systems are used at room temperature in a novel device in the form of an electron spectrometer for utilising single-electron electronic applications. Said electron spectrometer device consists of a nanocrystalline metal or a nanocrystalline semiconductor material used as conductor strip connection in the form of an inlet or an outlet for single-electron electronic components and circuits consisting of lithographically produced quantum dots. The resulting single-electron electronic device consisting of quantum dots is supplied with energetically very sharply defined electrons. Said device can thus be operated at room temperature, undisturbed by phonons.Type: ApplicationFiled: June 27, 2003Publication date: October 14, 2004Inventors: Hans W P Koops, Alexander Kaya
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Publication number: 20040173759Abstract: The invention relates to a device, to a set of tubes and to a method for carrying a gas or a liquid to a surface through a tube, especially in order to produce gas mixtures or to treat the surface using gas lithography. The tube or in the case of a set, each tube of the set has an inlet opening and an outlet opening. A shaft is allocated to each tube, this shaft being arranged in the axial direction of the tube and being displaceable in its longitudinal direction in relation to the tube, from a first position to a second position and vice versa. Each shaft bears a blocking body which blocks or unblocks the outlet when the shaft is in the first or second position. A gas reservoir and a supply line by which means the inside of the gas reservoir is connection to the inlet opening of each tube are also allocated to each tube, so that gas is able to flow from the insider of the gas reservoir into the tube.Type: ApplicationFiled: June 27, 2003Publication date: September 9, 2004Inventors: Hans W.P. Koops, Andreas Reinhardt
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Patent number: 6760513Abstract: The present invention is directed to an economical approach for compensating for the dispersion of optical signals having different wavelengths. In accordance with the present invention, photonic crystals (K1-Kn) are positioned on a common optical waveguide (2). In this context, each photonic crystal (K1-Kn) is tuned to reflect or deflect the signals of one wavelength and to transmit the signals of other wavelengths, unattenuated. The specific arrangement of the photonic crystals (K1-Kn) on the waveguide (2) and the specific arrangement of the deflecting elements in the photonic crystal are defined, in the process, as a function of the dispersion to be compensated for between the individual wavelengths. The approach of the present invention makes it possible to assemble permanently set or controllable photonic dispersion compensators of a high quality, which are approximately 1000 times shorter than conventional diffraction gratings.Type: GrantFiled: December 20, 2001Date of Patent: July 6, 2004Assignee: Deutsche Telekom AGInventors: Walter Heitmann, Hans W. P. Koops
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Publication number: 20030179365Abstract: In the context of the method according to the present invention, the matter for which the refractive index is to be determined, is made available in the form of a theoretically determinable scattering or diffraction pattern. Two or more orders of diffraction are then defined to form at least one intensity ratio. At least one intensity distribution is formed by irradiating the scattering pattern using one light beam of a defined shape. Subsequently thereto, the intensity ratio is formed based on the orders of diffraction of the intensity distribution. In addition, at least one portion of a characteristic curve is determined, which represents the dependency of the intensity ratio on the refractive index, and, with whose assistance, the corresponding refractive index can be assigned to the intensity ratio formed.Type: ApplicationFiled: May 22, 2003Publication date: September 25, 2003Inventors: Hans W.P. Koops, Alexander Kaya, Ottokar Leminger
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Patent number: 6093246Abstract: A photonic crystal device and method. The photonic crystal device comprises a substrate with at least one photonic crystal formed thereon by a charged-particle beam deposition method. Each photonic crystal comprises a plurality of spaced elements having a composition different from the substrate, and may further include one or more impurity elements substituted for spaced elements. Embodiments of the present invention may be provided as electromagnetic wave filters, polarizers, resonators, sources, mirrors, beam directors and antennas for use at wavelengths in the range from about 0.2 to 200 microns or longer. Additionally, photonic crystal devices may be provided with one or more electromagnetic waveguides adjacent to a photonic crystal for forming integrated electromagnetic circuits for use at optical, infrared, or millimeter-wave frequencies.Type: GrantFiled: December 19, 1995Date of Patent: July 25, 2000Assignee: Sandia CorporationInventors: Shawn-Yu Lin, Hans W. P. Koops
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Patent number: 6075915Abstract: One or more photonic crystals 11, 22, 40, 58, 59 are formed directly in the path of light within an optical fiber 13, 23, 42, 56. Light processed by the photonic crystal may be transmitted out of the fiber by means of a lens 48 or it may be measured by a photoresistive device 51, 60. The photonic crystal may be formed in a trench 12 as an array of dielectric rods 16 having one or more selective defects 17, or the crystal may be formed by providing holes 20 directly in the optical fiber. Filling the interstices between rods 16 with non-linear optical material, and subjecting the crystal to a varying electric field applied by electrodes or to a varying optical radiation can produce a tunable photonic crystal within an optical fiber.Type: GrantFiled: March 26, 1998Date of Patent: June 13, 2000Inventors: Hans W. P. Koops, Gerald Meltz
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Patent number: 5982962Abstract: A microlens 30 is formed on the outer surface of an optical fiber 20 having an in-fiber Bragg grating 24 (FBG) formed in the core 21, 36 thereof, to focus light diffracted by the FBG onto other fibers or optical devices, or to focus light received at the fiber onto the FBG. Various single- and multi-microlens configurations of one or more fibers perform a variety of functions such as signal coupling, multiplexing, signal splitting, spectrography, tapped delay, timed-delay phase adjusting, circulating storage, and so forth. The microlenses may employ angle-increasing prisms and may comprise Fresnel lenses.Type: GrantFiled: December 18, 1997Date of Patent: November 9, 1999Inventors: Hans W. P. Koops, Gerald Meltz