Patents by Inventor Hanyue Li

Hanyue Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240150300
    Abstract: The present invention relates to an S-configuration-containing amino benzamide pyridazinone compound, a preparation method therefor, and a pharmaceutical composition and application thereof. Specifically, the present invention relates to a compound represented by the following general formula I or a pharmaceutically acceptable salt thereof, a preparation method therefor, and a pharmaceutical composition and application thereof. The S-configuration compound of the present application has very strong binding activity on class I histone deacetylase (HDAC1), and shows inhibitory activity on in-vitro proliferation of various tumor cells.
    Type: Application
    Filed: February 18, 2022
    Publication date: May 9, 2024
    Inventors: Youhong HU, Meiyu GENG, Daqiang LI, Aijun SHEN, Zhuo ZHANG, Yalei LI, Huajie YANG, Hongchun LIU, Hanyue ZHONG, Jian DING
  • Patent number: 10230386
    Abstract: A method of offset calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration bit (B*LSB; B*MSB), analyzing a bit of the digital signal (COUT) and the calibration bit (B*LSB; B*MSB), determining an indication of a presence of offset error, and calibrating the offset error. As the determination of the calibration bit (B*LSB; B*MSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and thus can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: March 12, 2019
    Assignee: Stichting IMEC Nederland
    Inventors: Ming Ding, Hanyue Li, Pieter Harpe
  • Patent number: 10050638
    Abstract: A method of gain calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of gain error in the gain module, and calibrating the gain error. As the determination of the calibration bit (B*LSB) requires only one additional comparison, as compared to normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: August 14, 2018
    Assignee: Stichting IMEC Nederland
    Inventors: Ming Ding, Pieter Harpe, Hanyue Li
  • Patent number: 10027339
    Abstract: A method of DAC mismatch calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of DAC mismatch, and calibrating the DAC mismatch. As the determination of the calibration bit (B*LSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Grant
    Filed: December 6, 2017
    Date of Patent: July 17, 2018
    Assignee: Stichting IMEC Nederland
    Inventors: Ming Ding, Pieter Harpe, Hanyue Li
  • Publication number: 20180175874
    Abstract: A method of gain calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of gain error in the gain module, and calibrating the gain error. As the determination of the calibration bit (B*LSB) requires only one additional comparison, as compared to normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Application
    Filed: December 7, 2017
    Publication date: June 21, 2018
    Inventors: Ming DING, Pieter Harpe, Hanyue Li
  • Publication number: 20180167079
    Abstract: A method of offset calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration bit (B*LSB; B*MSB), analyzing a bit of the digital signal (COUT) and the calibration bit (B*LSB; B*MSB), determining an indication of a presence of offset error, and calibrating the offset error. As the determination of the calibration bit (B*LSB; B*MSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and thus can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Application
    Filed: December 7, 2017
    Publication date: June 14, 2018
    Inventors: Ming Ding, Hanyue Li, Pieter HARPE
  • Publication number: 20180167078
    Abstract: A method of DAC mismatch calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*RES) and a calibration bit (B*LSB), analyzing a least significant bit of the digital signal (COUT) and the calibration bit (B*LSB), determining an indication of a presence of DAC mismatch, and calibrating the DAC mismatch. As the determination of the calibration bit (B*LSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.
    Type: Application
    Filed: December 6, 2017
    Publication date: June 14, 2018
    Inventors: Ming Ding, Pieter Harpe, Hanyue Li