Abstract: A device apparatus and method are detailed that allow for improved bit error rate (BER) testing, configuration, and operation of a communication device and associated physical communication link, in particular on a HDSL communication device and link. The improved communication device apparatus and method additionally allow for the communication device to utilize an embedded BER tester (BERT) to run commonly utilized BER tests on high speed communication channels (downstream and upstream) associated with the communication device. The device apparatus and method also allow for a BER test to be configured and initiated remotely, with loopback at a remote device and masking of alarm states at the remote device or local device until the BER test is complete.

Abstract: An apparatus and method are described that allows for improved wander jitter reduction in communication devices and associated communication links, in particular on HDSL communication devices and links. The improved device apparatus and method detects the current data rate offset of the HDSL data rate being utilized and the data rate of the datastream being transmitted through the HDSL communication link and allows for the transmitting HDSL communication device to adjust the HDSL data rate to avoid high wander jitter “sweet spots”. The improved device apparatus and method also allows for the profiling of communication devices for their specific high wander jitter sweet spot maximum points by sweeping the input data rate being transmitted at differing HDSL data rates.

Abstract: An apparatus and method are described that allows for improved wander jitter reduction in communication devices and associated communication links, in particular on HDSL communication devices and links. The improved device apparatus and method detects the current data rate offset of the HDSL data rate being utilized and the data rate of the datastream being transmitted through the HDSL communication link and allows for the transmitting HDSL communication device to adjust the HDSL data rate to promote instantaneous data rate offsets that are close to wander jitter minimum points. The improved device apparatus and method also allows for the characterization of communication devices for their specific wander jitter low activity points by sweeping the input data rate being transmitted at differing HDSL data rates.

Abstract: A device apparatus and method are detailed that allow for improved bit error rate (BER) testing, configuration, and operation of a communication device and associated physical communication link, in particular on a HDSL communication device and link. The improved communication device apparatus and method additionally allow for the communication device to utilize an embedded BER tester (BERT) to run commonly utilized BER tests on high speed communication channels (downstream and upstream) associated with the communication device. The device apparatus and method also allow for a BER test to be configured and initiated remotely, with loopback at a remote device and masking of alarm states at the remote device or local device until the BER test is complete.