Patents by Inventor Harry D. Cobb
Harry D. Cobb has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8011089Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: GrantFiled: August 25, 2009Date of Patent: September 6, 2011Assignee: FormFactor, Inc.Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb
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Publication number: 20110171838Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: ApplicationFiled: March 28, 2011Publication date: July 14, 2011Applicant: FORMFACTOR, INC.Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb
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Publication number: 20100043226Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: ApplicationFiled: August 25, 2009Publication date: February 25, 2010Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb
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Patent number: 7578057Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: GrantFiled: June 27, 2006Date of Patent: August 25, 2009Assignee: FormFactor, Inc.Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb
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Patent number: 7215131Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: GrantFiled: June 7, 1999Date of Patent: May 8, 2007Assignee: Formfactor, Inc.Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb
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Patent number: 7065870Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: GrantFiled: September 22, 2003Date of Patent: June 27, 2006Assignee: FormFactor, Inc.Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb
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Publication number: 20040058487Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: ApplicationFiled: September 22, 2003Publication date: March 25, 2004Applicant: FormFactor, Inc.Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb
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Patent number: 6640415Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: GrantFiled: July 25, 2002Date of Patent: November 4, 2003Assignee: FormFactor, Inc.Inventors: Mohammad Eslamy, David V Pedersen, Harry D. Cobb
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Publication number: 20030057975Abstract: A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.Type: ApplicationFiled: July 25, 2002Publication date: March 27, 2003Applicant: FormFactor, Inc.Inventors: Mohammad Eslamy, David V. Pedersen, Harry D. Cobb