Abstract: An apparatus is provided for determining thickness and thermal conductivity for an insulative coating disposed on a substrate in an object. The apparatus includes a source for rapidly applying a multiple optical pulses on a surface of the object, where the surface comprises the insulative coating. The system further includes a recording system configured to collect data representative of the propagation of the optical pulses in the object. The apparatus further includes a processor coupled to the recording system and configured to receive the data from the recording system and configured to determine a thickness value and a thermal conductivity value for the insulative coating.

Abstract: An actively quenched lamp includes a lamp and an active quenching means configured to quench the lamp. An infrared (“IR”) thermography imaging system includes at least one lamp configured to heat a surface of an object to be imaged, at least one active quenching means configured to quench the lamp, and an IR camera configured to capture a number of IR image frames of the object. A method, for actively controlling flash duration for IR thermography, includes generating an initial control signal T0, a lamp control signal T1, and a control signal T2. The method further includes activating a quenching means in response to initial control signal T0, to allow current I to flow to a lamp, activating the lamp in response to lamp trigger signal T1, and turning off the quenching means in response to control signal T2 to cut off the current I to the lamp.