Abstract: An electronic controlling device and method is disclosed. One embodiment provides at least one module performing specific functions within one of a plurality of module modes on reception of a corresponding module mode request. A system control unit is provided to operate the at least module in one of a plurality of module modes by distributing a corresponding system mode request. The at least one module is adapted to translate the distributed system mode request to a module mode request which is configurable.

Abstract: In accordance with one aspect of the invention, a system for generating compact function trace data for leaf functions includes a central processing unit (CPU), configured to output program flow information needed for generating a program flow trace, and a trace unit, coupled to the CPU. The trace unit is configured to receive the program flow information from the CPU for generating compact function trace data. The trace unit further comprises a first output mode and a second output mode and is further configured to select either the first output mode or the second output mode for generating compact function trace data.

Abstract: An arrangement for processing trace data information is provided, the arrangement including, a chip including one or more memory circuits configured to store trace data information relating to a series of instructions, and a trace data information port configured to provide off-chip access to the trace data information; and a direct memory access controller circuit configured to control the transportation of trace data information from the one or more memory circuits to the trace data information port.

Abstract: An interface device is adapted to: in a first mode, in reaction to test signals and corresponding to a test standard, output signals corresponding to the test standard via at least one signal line. In a second mode it is adapted to, in reaction to test signals and corresponding to the test standard, output signals that do not correspond to the test standard via the at least one signal line.

Abstract: In accordance with an aspect of the application, there is provided a system for testing, including a first chip, a second chip, and first and second connections. The first connection is configured to couple a first pin of the first chip to a first pin of the second chip, and to transmit an initial signal from the first chip to the second chip. The second connection is configured to couple a second pin of the first chip to a second pin of the second chip to return the signal as a returned signal to the first chip. The first chip comprises comparison circuitry configured to compare the returned signal with the initial signal.

Abstract: In accordance with one aspect of the invention, a system for generating compact function trace data for leaf functions includes a central processing unit (CPU), configured to output program flow information needed for generating a program flow trace, and a trace unit, coupled to the CPU. The trace unit is configured to receive the program flow information from the CPU for generating compact function trace data. The trace unit further comprises a first output mode and a second output mode and is further configured to select either the first output mode or the second output mode for generating compact function trace data.

Abstract: A dosing device for liquids, with a distributor rail and a plurality of dosing units for the liquid that are hydraulically connected to the replaceable distributor rail. Each dosing unit has a valve unit, preferably a suction valve, a discharge valve and a discharge cannula. A piston-cylinder unit is detachably arranged on each valve unit for drawing in and measured discharging of the liquid. Each valve unit has a hydraulic connection element for detachable hydraulic connection to the distributor rail. The distributor rail has an elongate fluid supply line, a supply connection for the liquid being provided on an end of the distributor rail and dosing unit connections being distributed laterally along the length of the rail. Each of the dosing unit connections are detachably coupled to the hydraulic connection elements of the dosing units. The distributor rail is a replaceable part made of a preferably recyclable, injection-moldable plastic.

Abstract: An arrangement for processing trace data information is provided, the arrangement including, a chip including one or more memory circuits configured to store trace data information relating to a series of instructions, and a trace data information port configured to provide off-chip access to the trace data information; and a direct memory access controller circuit configured to control the transportation of trace data information from the one or more memory circuits to the trace data information port.

Abstract: A processor generates a signature value indicating a sequence of executed instructions, and the signature value is compared to signature values calculated for two or more possible sequences of executed instructions to determine which instruction sequence was executed. The signature is generated via a signature generator during program execution, and is provided external to the processor via a signature message.

Abstract: An interface device is adapted to: in a first mode, in reaction to test signals and corresponding to a test standard, output signals corresponding to the test standard via at least one signal line. In a second mode it is adapted to, in reaction to test signals and corresponding to the test standard, output signals that do not correspond to the test standard via the at least one signal line.

Abstract: A semiconductor device test system has an interface for use with a semiconductor device test method, and a semiconductor device test method. In a first mode of an interface, in reaction to test signals corresponding to a test standard, for example, a JTAG test standard, and received by the interface from a test device, the interface outputs signals corresponding to the test standard to a semiconductor device to be tested. In a second mode of the interface, in reaction to test signals corresponding to the test standard and received by the interface from a test device, the interface outputs signals that do not correspond to the test standard to a semiconductor device to be tested.

Abstract: The invention relates to a method and apparatus for formatting and preselecting trace data, and includes a trace message generator, an address checker, and a memory connected to the trace message generator and address checker. The trace message generator is configured to receive an address and associated data and generate a trace message with the associated data for the received address. The address checker is configured to receive the address, check the received address with the aid of the memory, and generate an output signal that indicates whether or not the trace message generated for the address is intended to be stored. The memory is configured to receive the trace message generated by the trace message generator, receive the output signal generated by the address checker, and store the received trace message if the output signal indicates that the trace message is intended to be stored.

Abstract: A system and method for integrated circuit emulation. One embodiment provides a system for in-circuit emulation of an integrated circuit device with program-controlled components. The system includes an integrated circuit device with program-controlled components used in a system for normal operation. The integrated circuit device having at least one program-controlled emulation unit emulating at least one of the program-controlled components of the integrated circuit device, and at least one statistics memory for storing statistical data of the program-controlled emulation unit during emulation.

Abstract: A system and method for signal transmission, a signal modulation and a signal demodulation device, and a method for signal transmission are disclosed. One embodiment includes transmitting a first pulse signal via a first line; and transmitting a second pulse signal complementary to the first pulse signal via a second line, wherein the point in time of the transmitting of the second signal relative to the point in time of the transmitting of the first signal is varied as a function of the respective digital data to be transmitted.

Abstract: A semiconductor device test system has an interface for use with a semiconductor device test method, and a semiconductor device test method. In a first mode of an interface, in reaction to test signals corresponding to a test standard, for example, a JTAG test standard, and received by the interface from a test device, the interface outputs signals corresponding to the test standard to a semiconductor device to be tested. In a second mode of the interface, in reaction to test signals corresponding to the test standard and received by the interface from a test device, the interface outputs signals that do not correspond to the test standard to a semiconductor device to be tested.

Abstract: A semiconductor device test system has an interface for use with a semiconductor device test method, and a semiconductor device test method. In a first mode of an interface, in reaction to test signals corresponding to a test standard, for example, a JTAG test standard, and received by the interface from a test device, the interface outputs signals corresponding to the test standard to a semiconductor device to be tested. In a second mode of the interface, in reaction to test signals corresponding to the test standard and received by the interface from a test device, the interface outputs signals that do not correspond to the test standard to a semiconductor device to be tested.

Abstract: An integrated circuit having a subordinate test interface and method for transmitting digital data is disclosed. The integrated circuit includes at least one test interface that is adapted to write and read data in and from a data memory, the at least one test interface includes, for transmitting and receiving data of different content categories, one signal line each for every content category. The integrated circuit further includes an interface module for receiving and transmitting data, and that the interface module is, via the signal lines, connected with the test interface for transmitting the data of the different content categories.

Abstract: A dosing device for liquids, with a distributor rail and a plurality of dosing units for the liquid that are hydraulically connected to the distributor rail. Each dosing unit has a valve unit, preferably a suction valve, a discharge valve and a discharge cannula. A piston-cylinder unit is detachably arranged on each valve unit for drawing in and measured discharging of the liquid. Each valve unit has a hydraulic connection element for detachable hydraulic connection to the distributor rail. The distributor rail has an elongate fluid supply line, a supply connection for the liquid being provided on an end of the distributor rail and dosing unit connections being distributed laterally along the length of the rail. Each of the dosing unit connections are detachably coupled to the hydraulic connection elements of the dosing units. The distributor rail is a replaceable part made of a preferably recyclable, injection-moldable plastic.

Abstract: In accordance with an aspect of the application, there is provided a system for testing, including a first chip, a second chip, and first and second connections. The first connection is configured to couple a first pin of the first chip to a first pin of the second chip, and to transmit an initial signal from the first chip to the second chip. The second connection is configured to couple a second pin of the first chip to a second pin of the second chip to return the signal as a returned signal to the first chip.

Abstract: A semiconductor device system and a method for modifying a semiconductor device is disclosed. In one embodiment, a function provided by a circuit positioned on the semiconductor device is replaced, modified, and/or supplemented by a function provided by a circuit positioned on a further semiconductor device.