Patents by Inventor Harvey E. Tobin

Harvey E. Tobin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Linear near field test facility and process
    Patent number: 5485158
    Abstract: A method to measure the far field antenna pattern of an experimental antenna on a smaller range than conventionally used. The basic innovation of the present invention is that the implementation is moved in straight line, toward or away from the antenna under test (AUT), and the measurements are taken while the AUT is rotated about its phase center in a manner that is synchronized with the radial probe.
    Type: Grant
    Filed: July 21, 1994
    Date of Patent: January 16, 1996
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Robert J. Mailloux, Peter R. Franchi, Harvey E. Tobin
  • Elliptical near field test facility
    Patent number: 5432523
    Abstract: In order to measure the far field antenna pattern of a phased array antenna, the phased array is focused at a probe antenna which is a specific distance away from the aperture. The antenna pattern is then measured by moving the probe antenna on an elliptical arc about the antenna under test.
    Type: Grant
    Filed: August 20, 1993
    Date of Patent: July 11, 1995
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Jeffrey Simmers, Peter R. Franchi, Harvey E. Tobin
  • ARC range test facility
    Patent number: 5204685
    Abstract: In order to measure the far field antenna pattern of a phased array antenna, the phased array is focused at a probe antenna which is a specific distance away from the aperture. The antenna pattern is then measured by moving the probe antenna on a constant focal arc. This arc minimizes phase aberrations due to defocusing error. To minimize amplitude errors, the pattern of the probe antenna is carefully matched to compensate for the variation induced amplitude error.
    Type: Grant
    Filed: July 1, 1992
    Date of Patent: April 20, 1993
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Peter R. Franchi, Harvey E. Tobin