Patents by Inventor Hasan Fakhruddin

Hasan Fakhruddin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring expansion of materials
    Patent number: 7978342
    Abstract: Methods for measuring expansion of a test sample. One method includes establishing a diffraction slit between two blades, with the position of at least one of the blades being dependent upon the length of a test sample of material. As the temperature of the sample changes, the width of the slit changes. Light is projected through the slit onto a target and an diffraction pattern is measured. Changes in the light diffraction pattern correspond to the thermal expansion of the sample. Another method includes establishing a diffraction slit between two blades, with the position of at least one of the blades being dependent upon a length along a test sample of material. As a load is applied to the test sample, the width of the slit changes. Changes in the light diffraction pattern correspond to Young's Modulus for the sample.
    Type: Grant
    Filed: January 17, 2008
    Date of Patent: July 12, 2011
    Assignee: Ball State University Board of Trustees
    Inventor: Hasan Fakhruddin
  • METHOD AND APPARATUS FOR MEASURING EXPANSION OF MATERIALS
    Publication number: 20080170236
    Abstract: Methods for measuring expansion of a test sample. One method includes establishing a diffraction slit between two blades, with the position of at least one of the blades being dependent upon the length of a test sample of material. As the temperature of the sample changes, the width of the slit changes. Light is projected through the slit onto a target and an diffraction pattern is measured. Changes in the light diffraction pattern correspond to the thermal expansion of the sample. Another method includes establishing a diffraction slit between two blades, with the position of at least one of the blades being dependent upon a length along a test sample of material. As a load is applied to the test sample, the width of the slit changes. Changes in the light diffraction pattern correspond to Young's Modulus for the sample.
    Type: Application
    Filed: January 17, 2008
    Publication date: July 17, 2008
    Applicant: BALL STATE UNIVERSITY BOARD OF TRUSTEES
    Inventor: Hasan Fakhruddin