Abstract: Described herein is a device for determining the position and/or optical properties of an object (2). The device comprises at least one output element (4.1) for providing light, illuminating optics (11) for directing light from the output element to the object, a light sensor (8) and imaging optics (13) for collecting light from the object to the light sensor. The device is configured to determine the position and/or optical properties of the object (2) from the local maximum of the intensity distribution of the light detected by the light sensor (8), where the local maximum is a result of the light collected from the intersection of the object point (2.1) and one of the coincident focus points or focus areas formed by the illuminating (11) and imaging optics (11). The device can be used for determining intensity value for the light reflected from the object point (2.1) with at least with two different wavelengths.

Abstract: A measuring apparatus is provided for inspecting a seal of an item. The measuring apparatus includes a radiation source for providing radiation for illuminating the seal of the item, a detector for receiving radiation from the item for generating a corresponding detected signal, and a processing arrangement for processing the detected signal to generate an output signal indicative of a state of the seal. The radiation source is arranged to focus the radiation into a plurality of focal points at the seal of the item, wherein the focal points are mutually spatially spaced apart. Moreover, the detector is arranged to image one or more of the focal points and to be selectively sensitive to an intensity of radiation received from the one or more focal points to generate a detected signal.

Abstract: In the measuring device and measuring method, confocal measuring principle is utilized. A certain component of an optical measurement signal is, from the point of view of both illumination and imaging, in focus only at one point on the virtual measuring surface. In the measuring device, the surface to be measured always hits a common focus point of the illumination and imaging, whereby a reflection is generated. The reflected optical signal is directed to a detector belonging to the imaging unit, where one picture element of the detector corresponds to a certain focus point, respectively. The optical efficiency received by each picture element is indicated. The light reflecting from the intersection of the virtual measuring surface and the surface of the object produces an intensity maximum for the detector. This maximum point is indicated and converted in the imaging unit (13) into the height of the surface of the object.

Abstract: An arrangement for optically measuring the surface of an optionally glossy target object, includes: a diffusive, semi-transparent illumination structure defining a hollow surface shape configured to surround the target object at least partially, the surface being further provided with at least two apertures, a number of light sources optically coupled to the diffusive illumination structure for illuminating the target object via the surface of the illumination structure, at least two imaging devices, each configured to image the target object via an aperture, and a control entity configured to instruct the number of light sources to form a sequence of predetermined illumination patterns illuminating the target object, to instruct the at least two imaging devices to obtain an image of the target object relative to each illumination pattern, and to derive, through the utilization of the patterns utilized and images obtained, a predetermined surface-related property of the target object.

Abstract: The invention relates to a system and a method for optical measurement of a target, wherein the target is illuminated, either actively illuminated, reflecting ambient light, or self illuminating, and a measurement radiation beam received from the target or through it is detected. The measurement system has optical fibers for guiding radiation from/to target positions. Radiation of several target positions is simultaneously filtered by a Fabry-Perot interferometer and detected by a row detector, for example.

Abstract: A measuring apparatus (200) is provided for inspecting a seal (50) of an item (20). The measuring apparatus (200) includes a radiation source (510, 520) for providing radiation for illuminating the seal (50) of the item (20), a detector (530, 540) for receiving radiation from the item (20) for generating a corresponding detected signal, and a processing arrangement (160) for processing the detected signal to generate an output signal indicative of a state of the seal (50). The radiation source (510, 520) is arranged to focus the radiation into a plurality of focal points at the seal (50) of the item (20), wherein the focal points are mutually spatially spaced apart. Moreover, the detector (530, 540) is arranged to image one or more of the focal points and to be selectively sensitive to an intensity of radiation received from the one or more focal points to generate a detected signal.

Abstract: In the measuring device and measuring method, confocal measuring principle is utilized. A certain component of an optical measurement signal is, from the point of view of both illumination and imaging, in focus only at one point on the virtual measuring surface. In the measuring device, the surface to be measured always hits a common focus point of the illumination and imaging, whereby a reflection is generated. The reflected optical signal is directed to a detector belonging to the imaging unit, where one picture element of the detector corresponds to a certain focus point, respectively. The optical efficiency received by each picture element is indicated. The light reflecting from the intersection of the virtual measuring surface and the surface of the object produces an intensity maximum for the detector. This maximum point is indicated and converted in the imaging unit (13) into the height of the surface of the object.

Abstract: A measuring device includes a first optical sensor row and a second optical sensor row between which a planar object to be measured is placed. The direction of the first sensor row and the direction of the second sensor row differ from one another. Each sensor of the first sensor row forms data representing a distance between the object to be measured and the sensor. Each sensor of the second sensor row forms data representing a distance between the object to be measured and the sensor in order to determine at least one property of the object to be measured on the basis of the data.

Abstract: An arrangement for optically measuring the surface of an optionally glossy target object, includes: a diffusive, semi-transparent illumination structure defining a hollow surface shape configured to surround the target object at least partially, the surface being further provided with at least two apertures, a number of light sources optically coupled to the diffusive illumination structure for illuminating the target object via the surface of the illumination structure, at least two imaging devices, each configured to image the target object via an aperture, and a control entity configured to instruct the number of light sources to form a sequence of predetermined illumination patterns illuminating the target object, to instruct the at least two imaging devices to obtain an image of the target object relative to each illumination pattern, and to derive, through the utilization of the patterns utilized and images obtained, a predetermined surface-related property of the target object.

Abstract: A measurement device for the determination of the characteristics of the object's surface by means of the optical radiation, wherein a measurement device comprises an optical radiation source and a detector to receive the radiation reflected from the surface being measured. In addition, a measurement device comprises an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by an optical source into separate wavelengths and to direct said separate wavelengths to the object being measured in a direction, that differs from the normal of the surface being measured so, that at least the shortest and the longest wavelengths of said wavelengths are focused on different halves and different heights of the measured object's surface, in the direction of the normal of the surface being measured.

Abstract: The invention relates to a system and a method for optical measurement of a target, wherein the target is illuminated, either actively illuminated, reflecting ambient light, or self illuminating, and a measurement radiation beam received from the target or through it is detected. The measurement system has optical fibres for guiding radiation from/to target positions. Radiation of several target positions is simultaneously filtered by a Fabry-Perot interferometer and detected by a row detector, for example.

Abstract: The invention concerns a method and system for determining particle size information of particles contained in a sample, the method comprising illuminating the particles with at least three light sources placed on different locations, detecting light reflected from the particles using a detector capable of spatial resolution, and processing the output of the detector so as to determine the particle size information. According to the invention, the particles are illuminated simultaneously with the at least three light sources each operating at a different wavelength channel, and the wavelength channels are simultaneously detected at the detector. The invention reduces the need for sample preparation, among other benefits.

Abstract: The invention relates to a device and method for measuring the properties of a surface. The device comprises means for producing illuminating light, which means are arranged to aim the illuminating light at the surface to be measured using at least two different wavelengths and at least two different angles, as well as means for directing the light reflected or scattered from the surface to a detector, in order to create an image of the surface to be measured. The device according to the invention further comprises at least one reference surface, the contents of which can be placed in the vicinity of the surface to be measured, in such a way that the illuminating light is also aimed at the reference surface and the light reflected or scattered from the reference surface can also be directed to the detector. The invention makes possible excellent measurement precision and repeatability, using a simple device construction with low production costs.

Abstract: Optical radiation sources functioning on different optical bands radiate on different optical bands and focus optical radiation on a region in a web surface as pulses in such a manner that illumination areas of the pulses overlap on the plane of the web. At most one optical radiation band is focused on the web from the direction of the normal. The spatial intensity distribution of at least one optical band differs from the uniform distribution and the intensity distributions of at least two different optical bands differ from one another in a predetermined manner. A camera forms still images of the web surface region on each optical radiation band. An image-processing unit determines the surface topography of the web on the basis of the images. In addition, a controller may control the paper manufacturing process on the basis of the determined surface topography.

Abstract: A method and apparatus for determining the topography or optical properties of a moving surface of a subject are disclosed. Taking images of the moving surface at different moment in time by aiming different illuminations at the subject. Taking images of a reference area located near the moving surface synchronously with the images of the moving surface, in such a way that, in each image of the reference area, illumination of substantially the same type is aimed at the reference area, wherein the images created of the reference area are used to position image areas corresponding to the same area of the subject in the images of the moving surface.

Abstract: A measurement device for the determination of the characteristics of the object's surface by means of the optical radiation, wherein a measurement device comprises an optical radiation source and a detector to receive the radiation reflected from the surface being measured. In addition, a measurement device comprises an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by an optical source into separate wavelengths and to direct said separate wavelengths to the object being measured in a direction, that differs from the normal of the surface being measured so, that at least the shortest and the longest wavelengths of said wavelengths are focused on different halves and different heights of the measured object's surface, in the direction of the normal of the surface being measured.

Abstract: An optical radiation processing unit directs different wavelengths of the optical radiation emitted by an optical source to an object being measured from a direction that differs from the normal of a surface being measured so that the different wavelengths focus on different heights in the direction of the normal of the surface. A possible polarizer polarizes the reflected radiation in a direction perpendicular to the normal of the surface. The optical radiation processing unit directs to a detector polarized optical radiation that received from the object. The signal processing unit determines on the basis of a signal provided by the detector from the detected radiation the wavelength on which radiation is the highest, and determines the location of the surface by the determined wavelength. When measuring an object from both sides, the thickness of the object being measured is determinable using the locations of the surfaces.

Abstract: Optical radiation sources functioning on different optical bands radiate on different optical bands and focus optical radiation on a region in a web surface as pulses in such a manner that illumination areas of the pulses overlap on the plane of the web. At most one optical radiation band is focused on the web from the direction of the normal. The spatial intensity distribution of at least one optical band differs from the uniform distribution and the intensity distributions of at least two different optical bands differ from one another in a predetermined manner. A camera forms still images of the web surface region on each optical radiation band. An image-processing unit determines the surface topography of the web on the basis of the images. In addition, a controller may control the paper manufacturing process on the basis of the determined surface topography.

Abstract: An optical radiation processing unit directs different wavelengths of the optical radiation emitted by an optical source to an object being measured from a direction that differs from the normal of a surface being measured so that the different wavelengths focus on different heights in the direction of the normal of the surface. A possible polarizer polarizes the reflected radiation in a direction perpendicular to the normal of the surface. The optical radiation processing unit directs to a detector polarized optical radiation that received from the object. The signal processing unit determines on the basis of a signal provided by the detector from the detected radiation the wavelength on which radiation is the highest, and determines the location of the surface by the determined wavelength. When measuring an object from both sides, the thickness of the object being measured is determinable using the locations of the surfaces.

Abstract: The invention relates to a method for finding holes, and other related defects and measuring characteristics of sheets of industrial material. Optical detections systems are constantly plagued by intense ambient light and challenged in accuracy. The invention exhibits a defect detection method and means that is resistant to intense ambient light and is capable of inspecting sheets of material (410, 510, 610, 710) continuously, without integration of long periods. In the invention, synchronous detection between the optical transmitters and receivers is utilised. The invention is applicable for inspecting and measuring materials like paper, metal, rubber, plastic, aluminium foil, copper foil, film, coated metal sheet or any other sheet-like material that could run on a production line. The invention is also applicable for finding special defects like holes, pinholes, scratches, spots, cracks, edge faults, streaks, surface faults or any other conceivable defects.