Abstract: The invention relates to an X-ray examination apparatus and a method for forming an X-ray image by means of a processing unit (2) for the correction of image data. In order to achieve automatic correction of imaging defects that are caused by imperfections in the imaging and processing chain, the processing unit (2) is succeeded by a defect detection unit (3) for the detection of image defects that can be detected on the basis of image parameters that can be extracted from image data acquired during clinical examinations, and is suitable for adapting processing parameters (15–21) that are used in the processing unit (2) in dependence on the detected image defects.

Abstract: The invention relates to an X-ray system which includes an X-ray source and an X-ray detector for deriving an image signal. The X-ray detector includes an X-ray matrix sensor, such as an FDXD, which includes a matrix of sensor elements. Preferably, the sensor elements are light-sensitive &agr;-Si sensor elements (photodiodes) and the FDXD is provided with a scintillator layer which converts X-rays into light. The sensor elements generate electric charges that are read out in the form of an image signal that represents the X-ray image. The X-ray matrix sensor is provided with an additional array of detection elements which are arranged between the sensor elements and the X-ray source. More specifically, the detection elements are also &agr;-Si light-sensitive photodiodes. The scintillator layer is arranged between the X-ray matrix sensor and the additional array of detector elements. A partly transparent coating is disposed between the additional array of detector elements and the scintillator layer.

Abstract: The invention relates to an X-ray system which includes an X-ray source and an X-ray detector for deriving an image signal. The X-ray detector includes an X-ray matrix sensor, such as an FDXD, which includes a matrix of sensor elements. Preferably, the sensor elements are light-sensitive &agr;-Si sensor elements (photodiodes) and the FDXD is provided with a scintillator layer which converts X-rays into light. The sensor elements generate electric charges that are read out in the form of an image signal that represents the X-ray image.

Abstract: The invention relates to an X-ray examination apparatus and a method for forming an X-ray image by means of a processing unit (2) for the correction of image data. In order to achieve automatic correction of imaging defects that are caused by imperfections in the imaging and processing chain, the processing unit (2) is succeeded by a defect detection unit (3) for the detection of image defects that can be detected on the basis of image parameters that can be extracted from image data acquired during clinical examinations, and is suitable for adapting processing parameters (15-21) that are used in the processing unit (2) in dependence on the detected image defects.