Abstract: Methods and articles for receiving times and temperatures for stages of a profile including solder heating stages to rework a populated printed circuit board (PCB), the rework including removing a first integrated circuit (IC) from the PCB, focusing heat on the first integrated circuit using an oven element during rework of the PCB, collecting actual temperature information from a plurality of temperature sensing elements to detect actual temperature information associated with the first integrated circuit, and generating a suggested modification for an operator to modify the time and/or the temperature of at least one of the stages in the profile in response to a fail status indicating that the collected actual temperature information did not meet temperatures for a variable.

Abstract: Methods and articles for receiving times and temperatures for stages of a profile including solder heating stages to rework a populated printed circuit board (PCB), the rework including removing a first integrated circuit (IC) from the PCB, focusing heat on the first integrated circuit using an oven element during rework of the PCB, collecting actual temperature information from a plurality of temperature sensing elements to detect actual temperature information associated with the first integrated circuit, and generating a suggested modification for an operator to modify the time and/or the temperature of at least one of the stages in the profile in response to a fail status indicating that the collected actual temperature information did not meet temperatures for a variable.

Abstract: A system includes a first module to store times and temperatures for phases in a profile to rework a populated printed circuit board (PCB) for a first integrated circuit (IC) on the PCB and a second module to store suggestions for modifying one or more of the times and the temperatures in the profile to generate a revised profile, the suggestions being associated with pass/fail indications determined from actual temperature information for the profile.

Abstract: A system includes a first module to store times and temperatures for phases in a profile to rework a populated printed circuit board (PCB) for a first integrated circuit (IC) on the PCB and a second module to store suggestions for modifying one or more of the times and the temperatures in the profile to generate a revised profile, the suggestions being associated with pass/fail indications determined from actual temperature information for the profile.