Abstract: In a JTAG test and debug environment, the signal groups may have a variable length, a fixed length of a combination of both fixed and variable signal groups to be transferred to the target processor. To implement the three types of data transfers, the storage unit associated with the scan control unit includes two types of storage locations, fixed signal length storage locations and variable length storage locations. The software can select the mode of data transfer and this selection is provided to the scan controller by a command.

Abstract: In a scan controller in a test and debug system using a JTAG protocol for polling for a signal value, a poll command logic unit compares the value of each logic signal received from a target processor with the value of the expected logic value. The position in the received data stream of each logic value is compared with an expected position. When the expected value and the expected position coincide, a flag is forwarded to the test and debug unit indicating a successful polling operation. A command in the command register of the scan controller enables the apparatus to continue to poll the target processing unit in the absence of the (success) flag.

Abstract: In a test and debug environment using a JTAG protocol to test a target processing unit, apparatus for multi-value polling permits a poll unit, associated with the scan controller, to determine whether one of several possible signal groups is present in the received data stream. The test and debug unit generates a series of numbers, each number corresponding to a preselected signal groups. The corresponding field in the received data stream is decoded to provide a series of output signals, each output signal corresponding to one group. The output signals of the decoder are compared to corresponding numbers of the expected value. When a signal from the decoder unit is found to correspond to one of the selected data number, the poll operation is a success.

Abstract: In a JTAG test and debug environment, the signal groups may have a variable length, a fixed length or a combination of both fixed and variable signal groups to be transferred to the target processor. To implement the three types of data transfers, the storage unit associated with the scan control unit includes two types of storage locations, fixed signal length storage locations and variable length storage locations. The software can select the mode of data transfer and this selection is provided to the scan controller by a command.

Abstract: In a JTAG test and debug environment, the parameters that are accessed by command include a delay parameter. The delay parameter prevents the subsequent command from being executed until both the original command has been executed and the clock cycles indicated by the delay parameter have been completed. Because the time delay is included as a parameter identified by the command, the delay parameter can be programmed.

Abstract: In a JTAG test and debug environment, the signal groups for boundary scans can have several lengths including signal groups that are longer that the shift register out. A storage unit is provided with a plurality of storage location lengths. The boundary scan signal groups are stored in a location having a suitable storage capacity. The command that transfers the boundary scan signal group includes a parameter identifying the relevant location. The scan control unit, upon receiving the command, transfers the entire boundary scan signal group as a result this command even if several transfers through the shift register out are required.

Abstract: In a JTAG test and debug configuration for testing a target processor, the scan controller includes apparatus for performing the polling operation without the intervention of the test and debug unit. The test and debug unit transfers a command and an expected value to the scan controller. In response to the command and the expected value, the scan controller repeatedly polls the selected location to determine if the expected value is present. When the expected value is identified, the test and debug unit is notified. Provision is made for a timeout of the polling procedure to prevent the polling procedure from monopolizing the scan controller activity.

Abstract: In a JTAG test and debug environment, a test signal group from the target processor is provided with a status field. The status field is compared with the expected status field. In response to this comparison, the fixed signal groups are stored in a first storage unit, expected signal groups are stored in a second storage unit, and other signal groups are stored in a third storage unit. The status field of the signal group transferred from the target processor permits the analysis of the transferred signal group by the test and debug unit.