Patents by Inventor Heon C. Kim

Heon C. Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Interface test circuitry and methods
    Patent number: 7698088
    Abstract: In some embodiments, an apparatus includes conductors, and a transmitter including transmitter test circuitry to embed test properties in test pattern signals, and transmit the test pattern signals to the conductors. In some embodiments, an apparatus includes conductors to carry test pattern signals with embedded test properties, and receiver test circuitry to receive the test pattern signals and extract the test properties and determine whether the extracted test properties match expected test properties. Other embodiments are described and claimed.
    Type: Grant
    Filed: April 30, 2007
    Date of Patent: April 13, 2010
    Assignee: Silicon Image, Inc.
    Inventors: Chinsong Sul, Heon C. Kim, Gijung Ahn
  • INTERFACE TEST CIRCUITRY AND METHODS
    Publication number: 20080114562
    Abstract: In some embodiments, an apparatus includes conductors, and a transmitter including transmitter test circuitry to embed test properties in test pattern signals, and transmit the test pattern signals to the conductors. In some embodiments, an apparatus includes conductors to carry test pattern signals with embedded test properties, and receiver test circuitry to receive the test pattern signals and extract the test properties and determine whether the extracted test properties match expected test properties. Other embodiments are described and claimed.
    Type: Application
    Filed: April 30, 2007
    Publication date: May 15, 2008
    Inventors: Chinsong Sul, Heon C. Kim, Gijung Ahn