Abstract: The present invention relates to stratiform biomatrices that are formed from regularly shaped, uniformly arranged portions which are connected to one another by continuous, straight-through perforations, and also to the use thereof as cosmetic or pharmaceutical agents, such as, in particular, as agents for wound treatment. The present invention further relates to a process for producing stratiform biomatrices of such a type, and also to the combination thereof in kit-of-parts arrangements.

Abstract: The present invention relates to stratiform biomatrices that are formed from regularly shaped, uniformly arranged portions which are connected to one another by continuous, straight-through perforations, and also to the use thereof as cosmetic or pharmaceutical agents, such as, in particular, as agents for wound treatment. The present invention further relates to a process for producing stratiform biomatrices of such a type, and also to the combination thereof in kit-of-parts arrangements.

Abstract: An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.

Abstract: A memory circuit comprises a memory cell array with dynamic memory cells arranged on word lines and bit lines, a selection unit providing selection information and a refresh circuit selecting the memory cells in each case in dependence on the selection information and refreshing the selected memory cells so that any information stored therein is retained in each case.

Abstract: An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.

Abstract: A component holder for testing electronic components having a carrier, at least one component socket arranged on the carrier and having a group of component contacts to accommodate and make contact with a component, and at least one group of adapter contacts, which are arranged in a predefined standard arrangement on the carrier and are connected to the component contacts.

Abstract: In a pointer instrument (1), a pointer drive (3) is used to deflect a pointer (4) arranged on a supporting element (2). The supporting element (2) is shaped essentially like a circular ring and is mounted by bearing points (7) equally distributed over its circumference. The central area of the pointer instrument (1) is therefore free of apertures and, as a result, permits the arrangement of a display (9), for example an LCD display, which can be read irrespective of the angular position of the pointer (4).

Abstract: In a pointer instrument (1), a pointer drive (3) is used to deflect a pointer (4) arranged on a supporting element (2). The supporting element (2) is shaped essentially like a circular ring and is mounted by bearing points (7) equally distributed over its circumference. The central area of the pointer instrument (1) is therefore free of apertures and, as a result, permits the arrangement of a display (9), for example an LCD display, which can be read irrespective of the angular position of the pointer (4).

Abstract: The prior art for handling components to be tested is to insert (to load) the components for each of the testing steps in each case individually into the testing device respectively used and to remove them again after each test. This requires very awkward handling of the components and loads the connecting contacts of the components during each testing operation. In addition, it is necessary, for each testing device and for each component, to provide a holder which permits the mechanical and electrical connection between component and testing device. A further disadvantage is to be seen in the fact that components can be interchanged during sorting.