Patents by Inventor Heyin Li

Heyin Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11474558
    Abstract: The present disclosure discloses a time synchronous hybrid analog and digital sensor data acquisition system and method, comprising analog sensors, digital modules, digital sensors, hubs for networking a plurality of heterogeneous sensors, a local-area network device and a data processing terminal. The present disclosure solves the problem that data cannot be compared due to time difference in acquisition for the reason that the sampling time of different sensors cannot be synchronized precisely in the existing experiments and practical engineering, and also solves the problems of single function, low integration level and manpower consumption when different sensor instruments work separately. The data acquisition system of the present disclosure can be directly connected to various heterogeneous sensors to realize synchronous acquisition, synchronous transmission and simple and fast operation.
    Type: Grant
    Filed: November 12, 2020
    Date of Patent: October 18, 2022
    Assignees: DALIAN UNIVERSITY OF TECHNOLOGY, CHENGDU SCIENIC LIMITED COMPANY
    Inventors: Dezhi Ning, Yichao Sun, Chongwei Zhang, Di Wu, Qing Zhou, Heyin Li
  • Publication number: 20220043476
    Abstract: The present disclosure discloses a time synchronous hybrid analog and digital sensor data acquisition system and method, comprising analog sensors, digital modules, digital sensors, hubs for networking a plurality of heterogeneous sensors, a local-area network device and a data processing terminal. The present disclosure solves the problem that data cannot be compared due to time difference in acquisition for the reason that the sampling time of different sensors cannot be synchronized precisely in the existing experiments and practical engineering, and also solves the problems of single function, low integration level and manpower consumption when different sensor instruments work separately. The data acquisition system of the present disclosure can be directly connected to various heterogeneous sensors to realize synchronous acquisition, synchronous transmission and simple and fast operation.
    Type: Application
    Filed: November 12, 2020
    Publication date: February 10, 2022
    Inventors: Dezhi NING, Yichao SUN, Chongwei ZHANG, Di WU, Qing ZHOU, Heyin LI
  • Patent number: 10732520
    Abstract: Methods and systems for optimizing a set of measurement library control parameters for a particular metrology application are presented herein. Measurement signals are collected from one or more metrology targets by a target measurement system. Values of user selected parameters of interest are resolved by fitting a pre-computed measurement library function to the measurement signals for a given set of library control parameters. Values of one or more library control parameters are optimized such that differences between the values of the parameters of interest estimated by the library based measurement and reference values associated with trusted measurements of the parameters of interest are minimized. The optimization of the library control parameter values is performed without recalculating the pre-computed measurement library.
    Type: Grant
    Filed: May 20, 2019
    Date of Patent: August 4, 2020
    Assignee: KLA Tencor Corporation
    Inventors: Meng Cao, Lie-Quan Lee, Qiang Zhao, Heyin Li, Mengmeng Ye
  • Patent number: 10502692
    Abstract: Methods and systems for evaluating and ranking the measurement efficacy of multiple sets of measurement system combinations and recipes for a particular metrology application are presented herein. Measurement efficacy is based on estimates of measurement precision, measurement accuracy, correlation to a reference measurement, measurement time, or any combination thereof. The automated the selection of measurement system combinations and recipes reduces time to measurement and improves measurement results. Measurement efficacy is quantified by a set of measurement performance metrics associated with each measurement system and recipe. In one example, the sets of measurement system combinations and recipes most capable of measuring the desired parameter of interest are presented to the user in rank order based on corresponding values of one or more measurement performance metrics. A user is able to select the appropriate measurement system combination in an objective, quantitative manner.
    Type: Grant
    Filed: May 27, 2016
    Date of Patent: December 10, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Meng Cao, Lie-Quan Lee, Qiang Zhao, Heyin Li, Mengmeng Ye
  • Patent number: 10345721
    Abstract: Methods and systems for optimizing a set of measurement library control parameters for a particular metrology application are presented herein. Measurement signals are collected from one or more metrology targets by a target measurement system. Values of user selected parameters of interest are resolved by fitting a pre-computed measurement library function to the measurement signals for a given set of library control parameters. Values of one or more library control parameters are optimized such that differences between the values of the parameters of interest estimated by the library based measurement and reference values associated with trusted measurements of the parameters of interest are minimized. The optimization of the library control parameter values is performed without recalculating the pre-computed measurement library.
    Type: Grant
    Filed: June 16, 2016
    Date of Patent: July 9, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Meng Cao, Lie-Quan Lee, Qiang Zhao, Heyin Li, Mengmeng Ye
  • Publication number: 20170023491
    Abstract: Methods and systems for evaluating and ranking the measurement efficacy of multiple sets of measurement system combinations and recipes for a particular metrology application are presented herein. Measurement efficacy is based on estimates of measurement precision, measurement accuracy, correlation to a reference measurement, measurement time, or any combination thereof. The automated the selection of measurement system combinations and recipes reduces time to measurement and improves measurement results. Measurement efficacy is quantified by a set of measurement performance metrics associated with each measurement system and recipe. In one example, the sets of measurement system combinations and recipes most capable of measuring the desired parameter of interest are presented to the user in rank order based on corresponding values of one or more measurement performance metrics. A user is able to select the appropriate measurement system combination in an objective, quantitative manner.
    Type: Application
    Filed: May 27, 2016
    Publication date: January 26, 2017
    Inventors: Meng Cao, Lie-Quan Lee, Qiang Zhao, Heyin Li, Mengmeng Ye