Abstract: An inspection apparatus including an image generation device which generates a second image corresponding to a first image, and a defect detection device which detects a defect in the second image. Each of the first and second image includes partial regions each including pixels. The defect detection device is configured to estimate a first value indicating a position difference between the first and second image for each of the partial regions, based on a luminance difference between the first and second image, estimate a second value indicating a reliability of the first value for each of the partial regions, and estimate a position difference between the first and second image for each of the pixels, based on the first and second value estimated for each of the partial regions.

Abstract: According to one embodiment, an inspection apparatus includes an image generation device which generates a second image corresponding to a first image and a defect detection device which detects a defect in the second image with respect to the first image. The defect detection device is configured to extract a first partial region in which an amount of change of a luminance of the first image and an amount of change of a luminance of the second image have a correlation, and correct, in the first partial region, the luminance of the first image with respect to the luminance of the second image.

Abstract: According to one embodiment, an optical deflection element includes a substrate and three or more electrodes. The substrate has an incidence plane which the laser light enters and an emission plane from which the laser light exits. The three or more electrodes are arranged on the substrate at first intervals in a first direction. Electrodes allow a surface acoustic wave having a first wavelength to be generated in the substrate by applying a voltage thereto. Wiring is provided such that a voltage is selectively applied to the electrodes at an interval between at least two electrodes. The electrodes allow a surface acoustic wave having a second wavelength to be generated in the substrate by applying a voltage selectively at second intervals.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: Provided is a light source device including a laser light source group including at least one multi-emitter laser light source and at least one non-multi-emitter laser light source that emits a colored light different from that of the multi-emitter laser light source, a collimator lens having at least one cylindrical surface that adjusts a laser light emitted from the at least one multi-emitter laser light source, and a light guide unit that performs color synthesis of a laser light emitted from the at least one multi-emitter laser light source and having passed through the cylindrical surface and a laser light emitted from the at least one non-multi-emitter laser light source.

Abstract: According to one embodiment, an optical inspection apparatus includes a first illuminator, an image-forming optical system, a scattering light selector, and an imaging element. The first illuminator is configured to emit a first light beam. The first light beam reflected by an object is incident on the image-forming optical system. The scattering light selector is configured to emit passing light beams of at least two mutually different wavelength regions, at the same time as the first light beam passes, a wavelength spectrum of at least one of the passing light beams being different from a wavelength spectrum of the reflected first light beam. The passing light beams simultaneously form an image on the imaging element.

Abstract: According to an embodiment, an optical device includes a light selection unit, an imaging element, and a deriving unit. The light selection unit splits an irradiated light beam into a plurality of spectral beams of different wavelength regions. The imaging element captures a subject irradiated with the spectral beams including beams of at least two different wavelengths to acquire a spectral image. The deriving unit derives a surface property or shape information of the subject from a specified result obtained by specifying, by the deriving unit, an irradiation region irradiated with each of the spectral beams on the subject based on a mixing ratio of the spectral beams and received light intensity of each of the spectral beams included in the spectral image.

Abstract: According to one embodiment, a fluid controller includes a fluid channel deforming portion and a mixing portion provided downstream from the fluid channel deforming portion. The fluid channel deforming portion includes an upstream end portion, a first channel, a second channel and a channel terminating portion. At least one of the first and second channels is deformed between the upstream end portion and the channel terminating portion. A region of the second channel in a second cross-section, is increased more than a region of the second channel in the first cross-section, between the upstream end portion ad the channel terminating portion. The mixing portion mixes a plurality of fluids flowing through the fluid channel deforming portion.

Abstract: According to an embodiment, an optical apparatus includes a lighting unit, an imaging unit, and a processor. The lighting unit emits illumination rays. The imaging unit includes: a wavelength selecting unit including first and second wavelength selection regions; and a sensor. The first wavelength selection region converts a first ray passing through the first wavelength selection region into a first selected ray. The second wavelength selection region converts a second ray passing through the second wavelength selection region into a second selected ray. The sensor can acquire color phase information indicating color phases of the first selected ray and the second selected ray. The processor estimates a ray direction of the first ray and a ray direction of the second ray based on the color phase information and a relative position of the wavelength selecting unit in the imaging unit.

Abstract: An imaging lens that includes, sequentially from an imaging object side, a first lens group having a positive refractive power and a second lens group having a negative refractive power, and in which the first lens group includes a first lens (L1) having a positive refractive power; a second lens (L2) having a positive refractive power; a third lens (L3) having a negative refractive power; a fourth lens (L4) having a positive or a negative refractive power; a fifth lens (L5) having a positive or a negative refractive power; a sixth lens (L6) having a positive or a negative refractive power; and a seventh lens (L7) having a negative refractive power, and the second lens group includes, sequentially from the imaging object side, an eighth lens (L8) having a positive or a negative refractive power; and a ninth lens (L9) having a positive or a negative refractive power, and that causes an imaging device (201) to form an image of a subject is provided.

Abstract: It is an object to improve uniformity of a laser light generated by a light source device including a multi-emitter type laser light source. The present technology provides a light source device including a laser light source group including at least one multi-emitter laser light source (111R-1 and the like) and at least one non-multi-emitter laser light source (111B-1 and the like) that emits a colored light different from that of the multi-emitter laser light source, a collimator lens (112R-1 and the like) having at least one cylindrical surface that adjusts a laser light emitted from the at least one multi-emitter laser light source (111R-1 and the like), and a light guide unit (113, 114, and the like) that performs color synthesis of a laser light emitted from the at least one multi-emitter laser light source (111R-1 and the like) and having passed through the cylindrical surface and a laser light emitted from the at least one non-multi-emitter laser light source (111B-1 and the like).

Abstract: According to an embodiment, an optical device includes a light selection unit, an imaging element, and a deriving unit. The light selection unit splits an irradiated light beam into a plurality of spectral beams of different wavelength regions. The imaging element captures a subject irradiated with the spectral beams including beams of at least two different wavelengths to acquire a spectral image. The deriving unit derives a surface property or shape information of the subject from a specified result obtained by specifying, by the deriving unit, an irradiation region irradiated with each of the spectral beams on the subject based on a mixing ratio of the spectral beams and received light intensity of each of the spectral beams included in the spectral image.

Abstract: According to one embodiment, an inspection apparatus includes an image generation device which generates a second image corresponding to a first image and a defect detection device which detects a defect in the second image with respect to the first image. The defect detection device is configured to extract a first partial region in which an amount of change of a luminance of the first image and an amount of change of a luminance of the second image have a correlation, and correct, in the first partial region, the luminance of the first image with respect to the luminance of the second image.

Abstract: An inspection apparatus including an image generation device which generates a second image corresponding to a first image, and a defect detection device which detects a defect in the second image. Each of the first and second image includes partial regions each including pixels. The defect detection device is configured to estimate a first value indicating a position difference between the first and second image for each of the partial regions, based on a luminance difference between the first and second image, estimate a second value indicating a reliability of the first value for each of the partial regions, and estimate a position difference between the first and second image for each of the pixels, based on the first and second value estimated for each of the partial regions.

Abstract: According to one embodiment, an optical inspection apparatus includes a first illuminator, an image-forming optical system, a scattering light selector, and an imaging element. The first illuminator is configured to emit a first light beam. The first light beam reflected by an object is incident on the image-forming optical system. The scattering light selector is configured to emit passing light beams of at least two mutually different wavelength regions, at the same time as the first light beam passes, a wavelength spectrum of at least one of the passing light beams being different from a wavelength spectrum of the reflected first light beam. The passing light beams simultaneously form an image on the imaging element.

Abstract: According to one embodiment, an inspection device includes: an image generation device configured to generate a second image corresponding to a first image; and a defect detection device configured to estimate a nonlinear shift based on a plurality of partial region sets, each of the partial region sets including a first partial region in the first image and a second partial region in the second image corresponding to the first partial region, and detect a defect in the second image from the first image.

Abstract: According to one embodiment, an optical imaging apparatus includes a polarizer assembly, a polarization image sensor, and a lens assembly. The polarizer assembly is configured to acquire a first light ray of a first polarization component and a second light ray of a second polarization component which is different from the first polarization component, by using a light flux from an identical direction. The polarization image sensor is located in a position facing the polarizer assembly. The polarization image sensor is configured to acquire an image of the first polarization component and an image of the second polarization component at once or at the same time. The lens assembly includes a first lens configured to form the images on the polarization image sensor.

Abstract: According to one embodiment, an edge detection device includes a light source, an imaging part, and a detector. The light source includes at least three light-emitting parts for irradiating a plurality of objects adjacent with a light. The imaging part images a surface of the objects irradiated by each of the light-emitting parts, and generates a plurality of image data of the surface. The detector detects edges of the surface imaged, based on at least two different combinations of the plurality of image data.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to one embodiment, an optical deflection element includes a substrate and three or more electrodes. The substrate has an incidence plane which the laser light enters and an emission plane from which the laser light exits. The three or more electrodes are arranged on the substrate at first intervals in a first direction. Electrodes allow a surface acoustic wave having a first wavelength to be generated in the substrate by applying a voltage thereto. Wiring is provided such that a voltage is selectively applied to the electrodes at an interval between at least two electrodes. The electrodes allow a surface acoustic wave having a second wavelength to be generated in the substrate by applying a voltage selectively at second intervals.