Abstract: Provided is an imaging device and a defective pixel correction method which can improve the accuracy of a defective pixel correction. In a case where a correction target pixel is a G pixel, a defective pixel correction unit determines whether there is an edge portion around the G pixel; when there is an edge portion, the defective pixel correction unit performs a defect correction by using G pixels adjacent to the G pixel in a X shaped direction; when there is no edge portion, it performs the defect correction using G pixels adjacent to the G pixel in the cross direction.

Abstract: An image processing method includes: acquiring a mosaic image photographed by image pickup means including an image pickup element in which a basic array pattern is repeatedly arranged in horizontal and vertical directions, storing first correction data containing a coordinate of a defective pixel and correction information associated with a position of the defective pixel in the basic array pattern, and second correction data containing a correction pattern corresponding to the correction information and indicating positions, relative to the defective pixel, of plural peripheral pixels that have a same color as the defective pixel, reading the correction pattern based on the correction information, calculating coordinates of the peripheral pixels based on the first correction data and the read correction pattern, extracting pixel values corresponding to the peripheral pixels at the calculated coordinates from the mosaic image, and calculating the pixel value of the defective pixel.

Abstract: An image processing method includes: acquiring a mosaic image photographed by image pickup means including an image pickup element in which a basic array pattern is repeatedly arranged in horizontal and vertical directions, storing first correction data containing a coordinate of a defective pixel and correction information associated with a position of the defective pixel in the basic array pattern, and second correction data containing a correction pattern corresponding to the correction information and indicating positions, relative to the defective pixel, of plural peripheral pixels that have a same color as the defective pixel, reading the correction pattern based on the correction information, calculating coordinates of the peripheral pixels based on the first correction data and the read correction pattern, extracting pixel values corresponding to the peripheral pixels at the calculated coordinates from the mosaic image, and calculating the pixel value of the defective pixel.

Abstract: Provided is an imaging device and a defective pixel correction method which can improve the accuracy of a defective pixel correction. In a case where a correction target pixel is a G pixel, a defective pixel correction unit determines whether there is an edge portion around the G pixel; when there is an edge portion, the defective pixel correction unit performs a defect correction by using G pixels adjacent to the G pixel in a X shaped direction; when there is no edge portion, it performs the defect correction using G pixels adjacent to the G pixel in the cross direction.

Abstract: An imaging device includes a CCD-type solid-state imaging element, an imaging control section, a fill light firing section, and a light firing amount calculation section. The CCD-type solid-state imaging element includes a first photoelectric conversion element and a second photoelectric conversion element adjacent to the first photoelectric conversion element. A charge is independently readable from the first photoelectric conversion element and the second photoelectric conversion element. The imaging control section, in response to one photographing command, executes imaging by the solid-state imaging element in two exposure time periods of a first exposure time period exposing the first photoelectric conversion element and a second exposure time period exposing the second photoelectric conversion element. The second exposure time period overlaps the first exposure time period and is shorter than the first exposure time period. The fill light firing section fires fill light.