Patents by Inventor Hidekazu Himezawa

Hidekazu Himezawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7930259
    Abstract: A nondestructive inspection apparatus includes a sensor unit for detecting vibrations transmitted through a test object from a vibration generator and a signal input unit for extracting a target signal from an electric signal outputted from the sensor unit. An amount of characteristics extracting unit is also included for extracting multiple frequency components from the test signal as an amount of characteristics. Further, a decision unit has a competitive learning neural network for determining whether the amount of the characteristics belongs to a category, wherein the competitive learning neural network has been trained by using training samples belong to the category representing an internal state of the test object, wherein distributions of membership degrees of the training samples are set in the decision unit.
    Type: Grant
    Filed: December 14, 2007
    Date of Patent: April 19, 2011
    Assignee: Panasonic Electric Works Co., Ltd.
    Inventors: Yoshihito Hashimoto, Hidekazu Himezawa
  • Publication number: 20080144927
    Abstract: A nondestructive inspection apparatus includes a sensor unit for detecting vibrations transmitted through a test object from a vibration generator and a signal input unit for extracting a target signal from an electric signal outputted from the sensor unit. An amount of characteristics extracting unit is also included for extracting multiple frequency components from the test signal as an amount of characteristics. Further, a decision unit has a competitive learning neural network for determining whether the amount of the characteristics belongs to a category, wherein the competitive learning neural network has been trained by using training samples belong to the category representing an internal state of the test object, wherein distributions of membership degrees of the training samples are set in the decision unit.
    Type: Application
    Filed: December 14, 2007
    Publication date: June 19, 2008
    Applicant: Matsushita Electric Works, Ltd.
    Inventors: Yoshihito Hashimoto, Hidekazu Himezawa
  • Patent number: 4912748
    Abstract: A personal body detecting device makes it possible to determine the presence and absence of a personal body in a detecting zone by sensing infrared rays in the zone with a plurality of infrared ray detecting elements, detecting at a discriminating means a peak level and output time in connection with respective outputs of the infrared ray detecting elements, and comparing them with each other. The personal body having reached the detecting zone in any direction thereto can be reliably detected, and a highly reliable detecting operation can be realized.
    Type: Grant
    Filed: September 23, 1988
    Date of Patent: March 27, 1990
    Assignee: Matsushita Electric Works, Ltd.
    Inventors: Takashi Horii, Hiroshi Matsuda, Hidekazu Himezawa, Shinji Kirihata, Tsunehiko Araki
  • Patent number: 4849737
    Abstract: A person-number detecting system which comprises a detector for detecting infrared rays emitted from persons' bodies to generate an output signal while a scanning optical means circularly scans a visual field of the infrared ray detector, a means for amplifying the output signal of the detector, a means for converting it to a signal necessary for detection of the number of persons located within the field, a means for discriminating the number of persons on the basis of the converted signal, and a means for outputting person number information. The system can be made simple and inexpensive, while realizing a highly precise detection of the number of persons in a wide detection zone.
    Type: Grant
    Filed: November 19, 1987
    Date of Patent: July 18, 1989
    Assignee: Matsushita Electric Works, Ltd.
    Inventors: Shinji Kirihata, Tsunehiko Araki, Yuuki Yorifuji, Takashi Horii, Hiroshi Matsuda, Hidekazu Himezawa
  • Patent number: 4737847
    Abstract: An abnormality supervising system compares an input picture with a previously stored reference picture having no abnormality, provides a compared picture signal to an abnormality discrimination means having preliminarily stored information for abnormality discrimination, and, upon presence of an abnormality, operates an output means for informing operation, whereby the abnormality discrimination means can effectively attain the abnormality discrimination on the basis of the preliminarily stored information, in a highly reliable manner.
    Type: Grant
    Filed: September 30, 1986
    Date of Patent: April 12, 1988
    Assignee: Matsushita Electric Works, Ltd.
    Inventors: Tsunehiko Araki, Satoshi Furukawa, Tadashi Satake, Hidekazu Himezawa