Patents by Inventor Hideki Morii

Hideki Morii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11940463
    Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.
    Type: Grant
    Filed: August 31, 2023
    Date of Patent: March 26, 2024
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Natsumi Hayashi, Hideki Morii, Tetsuo Yoshida, Toshiyuki Kimura
  • Patent number: 11859969
    Abstract: A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part is attached so as to swing around the swing center integrally with the probe part, and the scale is attached to the arm part. When thermal expansion coefficients of the probe part, the arm part and the scale are ?, ? and ? respectively, the measurement device satisfies a condition of (?+?)?1/2????(?+?)+1/2?.
    Type: Grant
    Filed: October 28, 2022
    Date of Patent: January 2, 2024
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Hideki Morii, Takuya Inoue
  • Publication number: 20230417797
    Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.
    Type: Application
    Filed: August 31, 2023
    Publication date: December 28, 2023
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Natsumi HAYASHI, Hideki MORII, Tetsuo YOSHIDA, Toshiyuki KIMURA
  • Patent number: 11740072
    Abstract: The inner surface shape measurement device, which measures an inner surface shape of a small hole formed in a workpiece, includes: a rotating body for rotating the workpiece around a rotation axis, and a linear-and-tilting-motion stage; an elongated probe capable of being inserted into the small hole of the workpiece; a probe linear-and-tilting-motion mechanism capable of adjusting posture of the probe; a camera, configured to be rotatable integrally with the rotating body, for imaging the probe from at least three circumferential positions on a rotation trajectory centered on a rotation axis; and a controller for adjusting the posture of the probe using the probe linear-and-tilting-motion mechanism based on an image taken by the camera at each of the circumferential positions.
    Type: Grant
    Filed: September 7, 2022
    Date of Patent: August 29, 2023
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Hideki Morii, Katsufumi Moriyama
  • Patent number: 11740074
    Abstract: The following are observed using a camera: a first position of a small hole of a workpiece, which is fixed to a linear-and-tilting-motion stage and rotating with a rotating body, and a second position thereof different from the first position, at a first rotation angle of the rotating body; and the first position and the second position of the small hole of the workpiece at a second rotation angle different from the first rotation angle of the rotating body. A position and a tilt of the small hole are calculated from coordinates of the respective observed positions, and small hole information, which includes the position and the tilt of the small hole, is outputted.
    Type: Grant
    Filed: September 7, 2022
    Date of Patent: August 29, 2023
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Hideki Morii, Katsufumi Moriyama, Hiroaki Kimura
  • Publication number: 20230064860
    Abstract: A shape measurement device includes: a displacement detector configured to detect displacement of a contact; a relative movement mechanism configured to relatively move the displacement detector with respect to the measurement object, and allow the contact to trace a surface to be measured of the measurement object; a position detecting sensor configured to detect a relative position of the displacement detector with respect to the measurement object; a camera configured to image the contact, and output a captured image of the contact; and a synchronization controller configured to repetitively execute three actions in synchronization together while the relative movement is being performed by the relative movement mechanism, the actions including detection of the relative position by the position detecting sensor, detection of the displacement by the displacement detector, and imaging by the camera.
    Type: Application
    Filed: November 10, 2022
    Publication date: March 2, 2023
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Hikaru MASUTA, Hideki MORII
  • Publication number: 20230052870
    Abstract: A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part is attached so as to swing around the swing center integrally with the probe part, and the scale is attached to the arm part. When thermal expansion coefficients of the probe part, the arm part and the scale are ?, ? and ? respectively, the measurement device satisfies a condition of ? + ? ? 1 ? / ? 2 ? ? ? ? ? ? ? ? ? + ? + 1 ? / ? 2 ? .
    Type: Application
    Filed: October 28, 2022
    Publication date: February 16, 2023
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Hideki MORII, Takuya INOUE
  • Publication number: 20230028748
    Abstract: The following are observed using a camera: a first position of a small hole of a workpiece, which is fixed to a linear-and-tilting-motion stage and rotating with a rotating body, and a second position thereof different from the first position, at a first rotation angle of the rotating body; and the first position and the second position of the small hole of the workpiece at a second rotation angle different from the first rotation angle of the rotating body. A position and a tilt of the small hole are calculated from coordinates of the respective observed positions, and small hole information, which includes the position and the tilt of the small hole, is outputted.
    Type: Application
    Filed: September 7, 2022
    Publication date: January 26, 2023
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Hideki MORII, Katsufumi MORIYAMA, Hiroaki KIMURA
  • Publication number: 20230003510
    Abstract: The inner surface shape measurement device, which measures an inner surface shape of a small hole formed in a workpiece, includes: a rotating body for rotating the workpiece around a rotation axis, and a linear-and-tilting-motion stage; an elongated probe capable of being inserted into the small hole of the workpiece; a probe linear-and-tilting-motion mechanism capable of adjusting posture of the probe; a camera, configured to be rotatable integrally with the rotating body, for imaging the probe from at least three circumferential positions on a rotation trajectory centered on a rotation axis; and a controller for adjusting the posture of the probe using the probe linear-and-tilting-motion mechanism based on an image taken by the camera at each of the circumferential positions.
    Type: Application
    Filed: September 7, 2022
    Publication date: January 5, 2023
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Hideki MORII, Katsufumi MORIYAMA
  • Patent number: 11435175
    Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: September 6, 2022
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventor: Hideki Morii
  • Patent number: 11397073
    Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: July 26, 2022
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventor: Hideki Morii
  • Publication number: 20210285751
    Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.
    Type: Application
    Filed: June 2, 2021
    Publication date: September 16, 2021
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventor: Hideki MORII
  • Patent number: 11112628
    Abstract: A charge pull-out period is set after power off, and an all-on control signal is set to a high level in the charge pull-out period. A high-level voltage which is output to a scanning line drive circuit formed on a liquid crystal panel is kept at a high level even after power off until a middle of the charge pull-out period. A common electrode control circuit for connecting a common electrode to a ground when the all-on control signal is at the high level and the high-level voltage is at an operation level is configured using two resistors, a NOT circuit, and two FETs, and is provided to a liquid crystal display device. With this, a liquid crystal display device which can lower a common electrode voltage to a ground level when power off and can prevent burn-in after power on is provided.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: September 7, 2021
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Yuta Ueyama, Masami Ozaki, Hideki Morii
  • Patent number: 10724841
    Abstract: There are provided a detector, a surface property measuring machine and a roundness measuring machine for automatically measuring a plurality of surfaces to shorten the time necessary for measurement. This problem is solved by a detector provided with a stylus for supporting a contact coming in contact with a surface of an object to be measured, a holder configured to hold the stylus, a measuring part configured to hold the holder to be capable of swinging by a rotating shaft and detect a displacement of the holder, and a body configured to accommodate the measuring part, wherein the holder holds the stylus such that a stylus axis as an axis of the stylus and a body axis as an axis of the body are in parallel, and the stylus axis and the body axis are offset in a first direction perpendicular to the body axis and the rotating shaft.
    Type: Grant
    Filed: August 19, 2019
    Date of Patent: July 28, 2020
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Hideki Morii
  • Publication number: 20200150475
    Abstract: A charge pull-out period is set after power off, and an all-on control signal is set to a high level in the charge pull-out period. A high-level voltage which is output to a scanning line drive circuit formed on a liquid crystal panel is kept at a high level even after power off until a middle of the charge pull-out period. A common electrode control circuit for connecting a common electrode to a ground when the all-on control signal is at the high level and the high-level voltage is at an operation level is configured using two resistors, a NOT circuit, and two FETs, and is provided to a liquid crystal display device. With this, a liquid crystal display device which can lower a common electrode voltage to a ground level when power off and can prevent burn-in after power on is provided.
    Type: Application
    Filed: June 8, 2018
    Publication date: May 14, 2020
    Inventors: YUTA UEYAMA, MASAMI OZAKI, HIDEKI MORII
  • Patent number: 10571238
    Abstract: The detector for a surface measuring device includes: an arm including a contact at a tip end of the arm; a rotation shaft configured to rotatably support the arm; a transmission part having one end connected to the arm at a position on a side opposite to the contact with respect to the rotation shaft; an elastic part having one end connected to another end of the transmission part and configured to generate a measuring force to be applied to the contact; a position adjusting part connected to another end of the elastic part and configured to move a position of the another end of the elastic part in a moving direction; and a tilt adjusting part connected to the arm and including a contact part arranged at position where the contact part can be brought into contact with the transmission part.
    Type: Grant
    Filed: August 8, 2019
    Date of Patent: February 25, 2020
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Hideki Morii
  • Publication number: 20190368855
    Abstract: There are provided a detector, a surface property measuring machine and a roundness measuring machine for automatically measuring a plurality of surfaces to shorten the time necessary for measurement. This problem is solved by a detector provided with a stylus for supporting a contact coming in contact with a surface of an object to be measured, a holder configured to hold the stylus, a measuring part configured to hold the holder to be capable of swinging by a rotating shaft and detect a displacement of the holder, and a body configured to accommodate the measuring part, wherein the holder holds the stylus such that a stylus axis as an axis of the stylus and a body axis as an axis of the body are in parallel, and the stylus axis and the body axis are offset in a first direction perpendicular to the body axis and the rotating shaft.
    Type: Application
    Filed: August 19, 2019
    Publication date: December 5, 2019
    Inventor: Hideki MORII
  • Publication number: 20190360793
    Abstract: The detector for a surface measuring device includes: an arm including a contact at a tip end of the arm; a rotation shaft configured to rotatably support the arm; a transmission part having one end connected to the arm at a position on a side opposite to the contact with respect to the rotation shaft; an elastic part having one end connected to another end of the transmission part and configured to generate a measuring force to be applied to the contact; a position adjusting part connected to another end of the elastic part and configured to move a position of the another end of the elastic part in a moving direction; and a tilt adjusting part connected to the arm and including a contact part arranged at position where the contact part can be brought into contact with the transmission part.
    Type: Application
    Filed: August 8, 2019
    Publication date: November 28, 2019
    Inventor: Hideki MORII
  • Publication number: 20190206355
    Abstract: In a liquid crystal display device, a gate ON voltage (VGH) is supplied to a scanning signal line in a case where the scanning signal line is selected, a gate OFF voltage (VGL) is supplied to the scanning signal line in a case where the scanning signal line is not selected, and a common voltage (Vcom) is supplied to a common electrode. The liquid crystal display device is driven in a first mode and in a second mode in which the liquid crystal display device is driven at a lower frequency than in the first mode. In the second mode, the absolute value of the gate ON voltage (H2) is smaller than that (H1) in the first mode and the common voltage (M2) is different from that (M1) in the first mode.
    Type: Application
    Filed: December 17, 2018
    Publication date: July 4, 2019
    Inventor: HIDEKI MORII
  • Patent number: 9642257
    Abstract: The liquid crystal display device includes a liquid crystal panel including a display area for displaying images and a non-display area other than the display area, a rigid board configured to connect with an external signal source, and a flexible board. The liquid crystal panel and the flexible board are arranged in a first direction. A direction perpendicular to the first direction and along a plate surface of the liquid crystal panel is a second direction. The flexible board is larger in a dimension in the second direction than the rigid board, and includes an end portion including at least an outer portion located outside of the rigid board in the second direction, and a middle portion located about a middle of the flexible board with respect to the end portion in the second direction. The end portion is larger in dimension in the first direction than the middle portion.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: May 2, 2017
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Toru Kuriyama, Hideki Morii, Hirofumi Miyamoto, Takayuki Mizunaga, Yuta Ueyama, Toshihiro Yanagi