Abstract: To easily assess a feedback capacitance of a semiconductor element. An assessment method of assessing a feedback capacitance of a semiconductor element is provided, the assessment method including: acquiring a first characteristic correlated with the feedback capacitance and a second characteristic correlated with the feedback capacitance; and assessing the feedback capacitance based on the first characteristic and the second characteristic. The first characteristic may be a characteristic that corresponds to a withstanding voltage of the semiconductor element, and the second characteristic may be an on-resistance of the semiconductor element. In the assessing, the feedback capacitance may be assessed based on a ratio between the first characteristic and the second characteristic.

Abstract: To easily assess a feedback capacitance of a semiconductor element. An assessment method of assessing a feedback capacitance of a semiconductor element is provided, the assessment method including: acquiring a first characteristic correlated with the feedback capacitance and a second characteristic correlated with the feedback capacitance; and assessing the feedback capacitance based on the first characteristic and the second characteristic. The first characteristic may be a characteristic that corresponds to a withstanding voltage of the semiconductor element, and the second characteristic may be an on-resistance of the semiconductor element. In the assessing, the feedback capacitance may be assessed based on a ratio between the first characteristic and the second characteristic.

Abstract: To easily assess a feedback capacitance of a semiconductor element. An assessment method of assessing a feedback capacitance of a semiconductor element is provided, the assessment method including: acquiring a first characteristic correlated with the feedback capacitance and a second characteristic correlated with the feedback capacitance; and assessing the feedback capacitance based on the first characteristic and the second characteristic. The first characteristic may be a characteristic that corresponds to a withstanding voltage of the semiconductor element, and the second characteristic may be an on-resistance of the semiconductor element. In the assessing, the feedback capacitance may be assessed based on a ratio between the first characteristic and the second characteristic.

Abstract: To easily assess a feedback capacitance of a semiconductor element. An assessment method of assessing a feedback capacitance of a semiconductor element is provided, the assessment method including: acquiring a first characteristic correlated with the feedback capacitance and a second characteristic correlated with the feedback capacitance; and assessing the feedback capacitance based on the first characteristic and the second characteristic. The first characteristic may be a characteristic that corresponds to a withstanding voltage of the semiconductor element, and the second characteristic may be an on-resistance of the semiconductor element. In the assessing, the feedback capacitance may be assessed based on a ratio between the first characteristic and the second characteristic.

Abstract: Disclosed herein are methods and kits useful in the detection of protein folding and in the identification of compounds that promote proper protein folding. In one example approach, fluorophores and a protein tag are incorporated into a nascent polypeptide within a ribosome-nascent-chain complex during cell free translation and the resulting labeled ribosome-nascent-chain complex is conjugated to a solid surface via the tag. Fluorescence imaging via FRET is then preformed to assess the folding state of the ribosome-nascent-chain complex under a variety of conditions.

Abstract: Disclosed herein are methods and kits useful in the detection of protein folding and in the identification of compounds that promote proper protein folding. In one example approach, fluorophores and a protein tag are incorporated into a nascent polypeptide within a ribosome-nascent-chain complex during cell free translation and the resulting labeled ribosome-nascent-chain complex is conjugated to a solid surface via the tag. Fluorescence imaging via FRET is then preformed to assess the folding state of the ribosome-nascent-chain complex under a variety of conditions.