Abstract: Current consumption in a nonvolatile memory apparatus operable on two or more different power voltages is to be substantially reduced in its standby mode. A stepped-down power supply unit provided in a flash memory to generate an internal power voltage, when supplied from outside with about 3.3 V as a power voltage, causes a first stepped-down power supply circuit to output the internal power voltage to control circuits when in normal operation. In a low power consumption mode, a second stepped-down power supply circuit outputs the internal power voltage to the control circuits, and in a standby mode a third stepped-down power supply circuit outputs to the control circuits an internal power voltage stepped down by an N-channel MOS transistor.

Abstract: Current consumption in a nonvolatile memory apparatus operable on two or more different power voltages is to be substantially reduced in its standby mode. A stepped-down power supply unit provided in a flash memory to generate an internal power voltage, when supplied from outside with about 3.3 V as a power voltage, causes a first stepped-down power supply circuit to output the internal power voltage to control circuits when in normal operation. In a low power consumption mode, a second stepped-down power supply circuit outputs the internal power voltage to the control circuits, and in a standby mode a third stepped-down power supply circuit outputs to the control circuits an internal power voltage stepped down by an N-channel MOS transistor.

Abstract: Current consumption in a nonvolatile memory apparatus operable on two or more different power voltages is to be substantially reduced in its standby mode. A stepped-down power supply unit provided in a flash memory to generate an internal power voltage, when supplied from outside with about 3.3 V as a power voltage, causes a first stepped-down power supply circuit to output the internal power voltage to control circuits when in normal operation. In a low power consumption mode, a second stepped-down power supply circuit outputs the internal power voltage to the control circuits, and in a standby mode a third stepped-down power supply circuit outputs to the control circuits an internal power voltage stepped down by an N-channel MOS transistor.

Abstract: Current consumption in a nonvolatile memory apparatus operable on two or more different power voltages is to be substantially reduced in its standby mode. A stepped-down power supply unit provided in a flash memory to generate an internal power voltage, when supplied from outside with about 3.3 V as a power voltage, causes a first stepped-down power supply circuit to output the internal power voltage to control circuits when in normal operation. In a low power consumption mode, a second stepped-down power supply circuit outputs the internal power voltage to the control circuits, and in a standby mode a third stepped-down power supply circuit outputs to the control circuits an internal power voltage stepped down by an N-channel MOS transistor.

Abstract: A clock generation circuit including a clock duty adjusting circuit in the subsequent stage of a variable delay circuit to control the delay of the variable delay circuit with the rising edge of an external clock. When the phase of the rising edge is matched with the reference clock, the duty of an output clock is matched with the duty of the reference clock by adjusting the pulse width of the signal with the duty adjusting circuit at the falling edge.

Abstract: A DLL circuit or the like is configured so as to be capable of measuring the optimum number of cycles for a delay amount from the input of an external clock to the output of data through the use of a variable delay circuit and performing lock according to the measured number of cycles, whereby a clock generation circuit having a wide lock range can be implemented regardless of the performance of the variable delay circuit and a clock access time.

Abstract: A DLL circuit or the like is configured so as to be capable of measuring the optimum number of cycles for a delay amount from the input of an external clock to the output of data through the use of a variable delay circuit and performing lock according to the measured number of cycles, whereby a clock generation circuit having a wide lock range can be implemented regardless of the performance of the variable delay circuit and a clock access time.

Abstract: A DLL circuit or the like is configured so as to be capable of measuring the optimum number of cycles for a delay amount from the input of an external clock to the output of data through the use of a variable delay circuit and performing lock according to the measured number of cycles, whereby a clock generation circuit having a wide lock range can be implemented regardless of the performance of the variable delay circuit and a clock access time.

Abstract: A DLL circuit or the like is configured so as to be capable of measuring the optimum number of cycles for a delay amount from the input of an external clock to the output of data through the use of a variable delay circuit and performing lock according to the measured number of cycles, whereby a clock generation circuit having a wide lock range can be implemented regardless of the performance of the variable delay circuit and a clock access time.

Abstract: A clock duty adjusting circuit is provided in the subsequent stage of a variable delay circuit to control the delay of the variable delay circuit with the rising edge of clock. When the phase of the rising edge is matched with the reference clock, the duty of output clock is matched with the duty of the reference clock by adjusting the pulse width of the signal with the duty adjusting circuit at the falling edge.