Patents by Inventor Hideo Ota

Hideo Ota has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230323012
    Abstract: A urea resin composition capable of providing a polyurea foam exhibiting excellent flame retardancy and shape retention during combustion, capable of suppressing deterioration over time in a wet-heat environment, exhibiting excellent adhesion to an adherend during coating, being hardly cracked even if flame contact occurs, and hardly allowing carbonization to proceed to a deep portion of the foam. A urea resin composition comprising a polyisocyanate compound (A), a polyamine compound (B), a trimerization catalyst, a foaming agent, a foam stabilizer, and a flame retardant.
    Type: Application
    Filed: June 30, 2021
    Publication date: October 12, 2023
    Inventors: Yoshitaka ITOU, Atsushi MIYATA, Hideo OTA
  • Publication number: 20220389292
    Abstract: A laminate 10 includes: a foamed polyurethane layer 11 obtained from a foamable polyurethane resin composition containing an active hydrogen group-containing tin ricinoleate and a phosphorus-containing solid flame retardant; and a coating layer 15 adhered to the foamed polyurethane layer 11 by a polyurethane hot melt adhesive 13 containing a polyurethane prepolymer (I) obtained by using a polyol component (A) and a polyisocyanate component (B) as raw materials, and a catalyst (II).
    Type: Application
    Filed: August 5, 2022
    Publication date: December 8, 2022
    Applicants: INOAC CORPORATION, INOAC TECHNICAL CENTER CO., LTD.
    Inventors: Yuya NAGANO, Hideo OTA, Takahiro INOUE, Shimpei TOKAI
  • Patent number: 11442024
    Abstract: In order to prevent an erroneous determination of an on-film defect, the sensitivity of the post-inspection is reduced so that a film swelling due to a minute defect would not be detected. Classification is performed to determine whether a defect is at least one of an on-film defect and a film swelling, by performing a coordinate correction on the result of a post-inspection by an actual-defect fine alignment using the result of a pre-inspection performed with two-stage thresholds, and by checking defects against each other. In addition, classification is performed to determine whether a defect is at least one of an on-film defect and a film swelling by, during the post-inspection, preparing instruction data from information of the refractive index and thickness of a film formed on a wafer and comparing the instruction data with a signal intensity ratio of a detection system.
    Type: Grant
    Filed: September 11, 2017
    Date of Patent: September 13, 2022
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takanori Kondo, Toshifumi Honda, Akira Hamamatsu, Hideo Ota, Yoshio Kimoto
  • Patent number: 11440286
    Abstract: The present invention provides a laminate 10 including: a foamed polyurethane layer 11 obtained from a foamable polyurethane resin composition containing an active hydrogen group-containing tin ricinoleate and a phosphorus-containing solid flame retardant; and a coating layer 15 adhered to the foamed polyurethane layer 11 by a polyurethane hot melt adhesive 13 containing a polyurethane prepolymer (I) obtained by using a polyol component (A) and a polyisocyanate component (B) as raw materials, and a catalyst (II).
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: September 13, 2022
    Assignees: INOAC CORPORATION, INOAC TECHNICAL CENTER CO., LTD.
    Inventors: Yuya Nagano, Hideo Ota, Takahiro Inoue, Shimpei Tokai
  • Publication number: 20200316905
    Abstract: The present invention provides a laminate 10 including: a foamed polyurethane layer 11 obtained from a foamable polyurethane resin composition containing an active hydrogen group-containing tin ricinoleate and a phosphorus-containing solid flame retardant; and a coating layer 15 adhered to the foamed polyurethane layer 11 by a polyurethane hot melt adhesive 13 containing a polyurethane prepolymer (I) obtained by using a polyol component (A) and a polyisocyanate component (B) as raw materials, and a catalyst (II).
    Type: Application
    Filed: December 21, 2018
    Publication date: October 8, 2020
    Applicants: INOAC CORPORATION, INOAC TECHNICAL CENTER CO., LTD.
    Inventors: Yuya NAGANO, Hideo OTA, Takahiro INOUE, Shimpei TOKAI
  • Publication number: 20200256807
    Abstract: The present invention addresses the problem of a film formation process in that a minute defect that an inspection before film formation (pre-inspection) has failed to detect becomes a larger film swelling due to film formation, and that, since the film swelling cannot be distinguished from an on-film defect, the film swelling is detected during an inspection after the film formation (post-inspection) as being an on-film defect that is on the film. In order to prevent the erroneous determination of the on-film defect, the sensitivity of the post-inspection has been reduced so that a film swelling due to a minute defect would not be detected.
    Type: Application
    Filed: September 11, 2017
    Publication date: August 13, 2020
    Inventors: Takanori KONDO, Toshifumi HONDA, Akira HAMAMATSU, Hideo OTA, Yoshio KIMOTO
  • Publication number: 20150258219
    Abstract: A vesicle comprising fine metal particles, which has a membrane formed from both a first polymer of (a) or (b) shown below and a second polymer of (c) or (d) shown below (with the proviso that a combination of (b) and (d) is excepted), wherein partial crosslinking occurs between a cationic segment and an anionic segment in the above polymers: First polymer: (a) a block copolymer (I) having both an electrically non-charged hydrophilic segment and a cationic segment (b) an amino acid polymer (I) having a cationic segment Second polymer: (c) a block copolymer (II) having both an electrically non-charged hydrophilic segment and an anionic segment (d) an amino acid polymer (II) having an anionic segment.
    Type: Application
    Filed: October 11, 2013
    Publication date: September 17, 2015
    Applicants: THE UNIVERSITY OF TOKYO, TEIJIN LIMITED
    Inventors: Kazunori Kataoka, Akihiro Kishimura, Yasutaka Anraku, Mitsuru Sakai, Hideo Ota, Shiro Kondo, Miho Momose
  • Patent number: 8831899
    Abstract: A system and method for determining measurement results of a dark-field inspection apparatus up to a microscopic area. A dark-field inspection apparatus is calibrated using a reference wafer having microroughness of an irregular asperity pattern accurately formed on a surface, and the microroughness of the surface having an ensured microroughness degree. This microroughness is measured by using an AFM, and an expected haze value is obtained based on the measured value. Then, haze of the surface of the reference wafer is measured by the dark-field inspection apparatus to be inspected to obtain an actually-measured haze value, and a difference between the expected haze value and the actually-measured haze value is obtained. Based on this difference, a haze measurement parameter of the dark-field inspection apparatus is adjusted so that the actually-measured haze value and the expected haze value match each other.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: September 9, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kazunori Nemoto, Akira Hamamatsu, Hideo Ota, Kenji Oka, Takahiro Jingu
  • Publication number: 20110276299
    Abstract: A technology capable of ensuring measurement results of a dark-field inspection apparatus up to a microscopic area is provided. A dark-field inspection apparatus is calibrated using a bulk wafer as a reference wafer, the bulk wafer having microroughness of an irregular asperity pattern accurately formed on a surface, and the microroughness of the surface having an ensured microroughness degree. The microroughness can be more accurately formed by a chemical treatment with a chemical solution. This microroughness is measured by using an AFM, and an expected haze value is obtained based on the measured value. Then, haze of the surface of the reference wafer is measured by the dark-field inspection apparatus to be inspected to obtain an actually-measured haze value, and a difference between the expected haze value and the actually-measured haze value is obtained.
    Type: Application
    Filed: October 15, 2009
    Publication date: November 10, 2011
    Inventors: Kazunori Nemoto, Akira Hamamatsu, Hideo Ota, Kenji Oka, Takahiro Jingu
  • Patent number: 5180091
    Abstract: A nailing machine includes a driver guide mounted on a body. A driver is provided and is reciprocally movable within a nail guide channel formed within the driver guide. A nail magazine is mounted on the driver guide and includes therein a nail storing channel in communication with the nail guide channel. A pusher is disposed within the nail storing channel for pressing nails stored therein toward the nail guide channel. The pusher is movable within the nail storing channel according to the amount of nails stored within the nail storing channel. A trigger is mounted on the body and is operably by an operator to move between a starting position for actuating the drive device of the driver and a stopping position for stopping the same. A stopper is connected with the trigger and is movable between a first position corresponding to the starting position of the trigger and a second position corresponding to the stopping position.
    Type: Grant
    Filed: November 29, 1991
    Date of Patent: January 19, 1993
    Assignee: Makita Corporation
    Inventor: Hideo Ota
  • Patent number: 5137802
    Abstract: A silver halide photographic material having a layer containing an electrically conductive material formed on one surface of a support and at least one silver halide emulsion layer formed on the other surface of the support is disclosed, wherein the outermost layer on the side where the silver halide emulsion layer is formed contains an organopolysiloxane and a nonionic surfactant having a polyoxyethylene unit, the latter being optionally combined with, or replaced by, a fluorine-containing compound.
    Type: Grant
    Filed: December 28, 1990
    Date of Patent: August 11, 1992
    Assignee: Konishiroku Photo Industry Co., Ltd.
    Inventors: Eiichi Ueda, Noriki Tachibana, Nobuaki Kagawa, Minoru Ishikawa, Hideo Ota
  • Patent number: 4956270
    Abstract: A silver halide photographic material that has at least one hydrophilic colloidal layer on a support is disclosed, wherein said at least one hydrophilic colloidal layer contains an organic fluoro-compound and/or a nonionic surfactant having a polyoxuehylene unit and is hardened with a high-molecular weight hardening agent.
    Type: Grant
    Filed: February 28, 1989
    Date of Patent: September 11, 1990
    Assignee: Konishiroku Photo Industry Co., Ltd.
    Inventors: Noriki Tachibana, Eiichi Ueda, Nobuaki Kagawa, Hideo Ota
  • Patent number: 4941192
    Abstract: In a method of recognizing a pattern of a gray level image the image to be processed is subjected to a normalization process, local gray level feature parameters are extracted from the normalized image at its sampling points, and the pattern is identified by using the extracted feature parameters in accordance with a predetermined recognition procedure. An apparatus for recognizing a pattern of a gray level includes a memory for storing a gray level image having several brightness tone levels, a normalization circuit for normalizing the brightness of the gray level image to be processed, an extraction circuit for extracting local gray level feature parameters from the obtained normality image at specific points, and a recognition circuit for identifying the pattern by using the feature parameters in accordance with a predetermined.
    Type: Grant
    Filed: April 19, 1988
    Date of Patent: July 10, 1990
    Assignee: Hitachi, Ltd.
    Inventors: Tadaaki Mishima, Morio Kanasaki, Masao Takatoo, Hideo Ota
  • Patent number: 4695964
    Abstract: Distortion models consisting of two forward and backward reciprocating planes that let a corrected image correspond to an uncorrected image for each scanning direction are constituted to let an uncorrected satellite image scanned by a reciprocating scanning sensor with scanning overlap or scanning underlap correspond to a corrected image after distortion correction, by means of a continuous mapping function on a 1:1 basis. It is determined whether each point on the corrected image is a point on an overlapping scan or on an underlapping scan or on a normal scan from the existence of a real point on the distortion models.
    Type: Grant
    Filed: November 30, 1984
    Date of Patent: September 22, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Youichi Seto, Koichi Homma, Fuminobu Komura, Hideo Ota
  • Patent number: 4499179
    Abstract: A silver halide photographic light-sensitive element having on a support, at least one silver halide light-sensitive emulsion layer which has thereon a protective layer composed of a binder containing a non-light-sensitive hydrophilic colloid. The protective layer is made up of an outer layer and an inner layer. The outer layer contains oil particles in the form of water-insoluble liquid droplets finely dispersed in the binder and the inner layer contains fine solid particles wherein the ratio of the thickness of the inner layer to the outer layer is at least 1.5.
    Type: Grant
    Filed: February 22, 1983
    Date of Patent: February 12, 1985
    Assignee: Konishiroku Photo Industry Co., Ltd.
    Inventors: Hideo Ota, Kiyotoshi Yamashita
  • Patent number: 4442485
    Abstract: A data input/output system is provided for transfer of data between a large capacity data source and a large-capacity memory. The data input/output control information is supplied from a processor. If the actual time between input/output information units from the large-capacity data source is shorter than that time determined by a program in the processor, an interruption signal is generated to be in time for the input/output timing of the next input/output data unit. The system permits continuous data transfer switching from one input/output data unit to the next input/output data unit without use of the program in the processor.
    Type: Grant
    Filed: December 5, 1980
    Date of Patent: April 10, 1984
    Assignee: Hitachi, Ltd.
    Inventors: Hideo Ota, Yutaka Kubo