Patents by Inventor Hiren Thacker

Hiren Thacker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • APPARATUSES AND METHODS FOR WIRELESSLY POWERED CHARGE-BALANCED ELECTRICAL STIMULATION
    Publication number: 20230046820
    Abstract: Apparatuses and methods are disclosed for efficient wireless powering of an electrical load with precise external control over pulsed voltage waveform and metering of charge delivered. The system interfaces to an inductive coil for RF power delivery from an external duty-cycled RF power transmitter, and the electrical load. The electrical load may be a photosensitive array of electrodes for an optically addressed, electrically activated retinal prosthesis. The voltage waveform to activate the load is controlled by the transmitted RF amplitude, including switching between cathodic and anodic phases of electrical stimulation. Charge delivered to the load is quantified as discharge events through a series capacitor, transmitted by backtelemetry to the receiver for continuous monitoring throughout the stimulation phases.
    Type: Application
    Filed: February 10, 2021
    Publication date: February 16, 2023
    Inventors: Abraham Akinin, Gert Cauwenberghs, Chul Kim, Patrick Mercier, Hiren Thacker
  • Edge coupling of optical devices
    Patent number: 9217836
    Abstract: A system includes optical modules. Each module includes a different base and one or more module waveguides on the base. Module waveguides from different modules are aligned such that the aligned module waveguides exchange light signals. At least a portion of one of the aligned module waveguides is between the base of one of the modules and the base of another module. First electronics operate a transmitter on a first one of the optical modules so as to generate one of the light signals. Second electronics operate a receiver on a second one of the modules such that the electronics generate an electrical signal in response to the receiver receiving one of the light signals.
    Type: Grant
    Filed: October 23, 2012
    Date of Patent: December 22, 2015
    Assignee: Kotura, Inc.
    Inventors: Mehdi Asghari, Roshanak Shafiiha, Daniel C. Lee, Dazeng Feng, Xuezhe Zheng, Ashok Krishnamoorthy, Hiren Thacker, John E. Cunningham
  • Edge coupling of optical devices
    Publication number: 20140133864
    Abstract: A system includes optical modules. Each module includes a different base and one or more module waveguides on the base. Module waveguides from different modules are aligned such that the aligned module waveguides exchange light signals. At least a portion of one of the aligned module waveguides is between the base of one of the modules and the base of another module. First electronics operate a transmitter on a first one of the optical modules so as to generate one of the light signals. Second electronics operate a receiver on a second one of the modules such that the electronics generate an electrical signal in response to the receiver receiving one of the light signals.
    Type: Application
    Filed: October 23, 2012
    Publication date: May 15, 2014
    Inventors: Mehdi Asghari, Roshanak Shafiiha, Daniel C. Lee, Dazeng Feng, Xuezhe Zheng, Ashok Krishnamoorthy, Hiren Thacker, John E. Cunningham
  • High input/output density optoelectronic probe card for wafer-level test of electrical and optical interconnect components, methods of fabrication, and methods of use
    Patent number: 7554347
    Abstract: Optoelectronic probe cards, methods of fabrication, and methods of use, are disclosed. Briefly described, one exemplary embodiment includes an optoelectronic probe card adapted to test an electrical quality and an optical quality of an optoelectronic structure under test having electrical and optical components.
    Type: Grant
    Filed: March 17, 2003
    Date of Patent: June 30, 2009
    Assignee: Georgia Tech Research Corporation
    Inventors: Tony Mule′, Hiren Thacker, Muhannad Bakir, James D. Meindl, Thomas K. Gaylord, Kevin P. Martin, Paul Kohl
  • Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication
    Publication number: 20060109015
    Abstract: Probe modules, methods of use of probe modules, and methods of preparing probe modules, are disclosed.
    Type: Application
    Filed: August 31, 2005
    Publication date: May 25, 2006
    Inventors: Hiren Thacker, Oluwafemi Ogunsola, James Meindl
  • Systems and methods for three-dimensional lithography and nano-indentation
    Publication number: 20050257709
    Abstract: Systems and methods for three dimensional lithography, nano-indentation, and combinations thereof are disclosed.
    Type: Application
    Filed: October 31, 2003
    Publication date: November 24, 2005
    Inventors: Tony Mule, Paul Kohl, Muhannad Bakir, Kevin Martin, James Meindl, Hiren Thacker
  • High input/output density optoelectronic probe card for wafer-level test of electrical and optical interconnect components, methods of fabrication, and methods of use
    Publication number: 20040017215
    Abstract: Optoelectronic probe cards, methods of fabrication, and methods of use, are disclosed. Briefly described, one exemplary embodiment includes an optoelectronic probe card adapted to test an electrical quality and an optical quality of an optoelectronic structure under test having electrical and optical components.
    Type: Application
    Filed: March 17, 2003
    Publication date: January 29, 2004
    Inventors: Tony Mule, Hiren Thacker, Muhannad Bakir, James D. Meindl, Thomas K. Gaylord, Kevin P. Martin, Paul Kohn