Patents by Inventor Hirofumi Kadono

Hirofumi Kadono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Deformation measuring method and apparatus using electronic speckle pattern interferometry
    Patent number: 6943870
    Abstract: A deformation measuring method using electronic speckle pattern interferometry comprises the steps of subtracting an average intensity from the intensity in a time domain at each point of a speckle pattern image so as to compute the cosine component of intensity; subjecting the cosine component to Hilbert transform in a temporal domain so as to compute the sine component of intensity; determining the arctangent of the ratio between thus computed sine and cosine components so as to determine an object phase; carrying out an unwrapping operation; and outputting three-dimensional deformation distribution data in a displayable mode.
    Type: Grant
    Filed: January 2, 2003
    Date of Patent: September 13, 2005
    Assignee: President of Saitama University
    Inventors: Satoru Toyooka, Hirofumi Kadono
  • Deformation measuring method and apparatus using electronic speckle pattern interferometry
    Publication number: 20040057054
    Abstract: A deformation measuring method using electronic speckle pattern interferometry comprises the steps of subtracting an average intensity from the intensity in a time domain at each point of a speckle pattern image so as to compute the cosine component of intensity; subjecting the cosine component to Hilbert transform in a temporal domain so as to compute the sine component of intensity; determining the arctangent of the ratio between thus computed sine and cosine components so as to determine an object phase; carrying out an unwrapping operation; and outputting three-dimensional deformation distribution data in a displayable mode.
    Type: Application
    Filed: January 2, 2003
    Publication date: March 25, 2004
    Applicant: President of Saitama University
    Inventors: Satoru Toyooka, Hirofumi Kadono
  • Deformation measuring method and apparatus using electronic speckle pattern interferometry
    Publication number: 20040059526
    Abstract: A deformation measuring method using electronic speckle pattern interferometry comprises the steps of subtracting an average intensity from the intensity in a time domain at each point of a speckle pattern image so as to compute the cosine component of intensity; subjecting the cosine component to Hilbert transform in a temporal domain so as to compute the sine component of intensity; determining the arctangent of the ratio between thus computed sine and cosine components so as to determine an object phase; carrying out an unwrapping operation; and outputting three-dimensional deformation distribution data in a displayable mode.
    Type: Application
    Filed: February 5, 2003
    Publication date: March 25, 2004
    Applicant: President of Saitama University
    Inventors: Satoru Toyooka, Hirofumi Kadono