Patents by Inventor Hirohiko Obinata

Hirohiko Obinata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9194823
    Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.
    Type: Grant
    Filed: February 27, 2012
    Date of Patent: November 24, 2015
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Hirohiko Obinata, Kumiko Horikoshi
  • Patent number: 8829459
    Abstract: A radiation detection apparatus includes a radiation detection unit that detects a first intensity of a radiation that has been transmitted through an inspection target to generate a first measurement value, the inspection target being disposed between a radiation source that irradiates the radiation and the radiation detection unit, a transmission ionization chamber that detects a second intensity of the radiation that has not reached the inspection target to generate a second measurement value, the transmission ionization chamber having an enclosed structure, the transmission ionization chamber being disposed between the radiation source and the inspection target, the transmission ionization chamber including an entrance window through which the radiation enters the transmission ionization chamber and an exit window through which the radiation goes out of the transmission ionization chamber, and an operation unit that calculates a physical quantity of the inspection target.
    Type: Grant
    Filed: December 20, 2010
    Date of Patent: September 9, 2014
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasushi Ichizawa, Hirohiko Obinata, Yuusaku Koga
  • Patent number: 8483355
    Abstract: A radiation inspection apparatus includes a conveying unit configured to convey a sheet-like sample, a radiation source configured to emit radiation to the sheet-like sample, a line sensor configured to measure a physical property of the sheet-like sample, the liner sensor disposed to be opposed to the radiation source across the sheet-like sample, and a gas ejecting unit configured to eject gas to the sheet-like sample to reduce vertical conveyance swinging produced by a tension of the sheet-like sample, the gas ejecting unit placed in close proximity to at least one side face of the line sensor.
    Type: Grant
    Filed: September 10, 2010
    Date of Patent: July 9, 2013
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasushi Ichizawa, Hirohiko Obinata
  • Patent number: 8447012
    Abstract: A radiation inspection apparatus includes a radiation source, a measurement radiation detecting unit being a rectangle having a long side, and a reference radiation detecting unit that is disposed between the radiation source and an inspection target, the reference radiation detecting unit being disposed near a path of a radiation from the radiation source to the measurement radiation detecting unit not to interrupt the radiation from the radiation source to the measurement radiation detecting unit. An intensity of the radiation source are corrected by calculating a change value of the intensity and the intensity distribution from an output of the reference radiation detecting unit and by correcting the output of the measurement radiation detecting unit based on the change value.
    Type: Grant
    Filed: July 12, 2010
    Date of Patent: May 21, 2013
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasushi Ichizawa, Hirohiko Obinata
  • Publication number: 20120221275
    Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.
    Type: Application
    Filed: February 27, 2012
    Publication date: August 30, 2012
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Hirohiko OBINATA, Kumiko HORIKOSHI
  • Publication number: 20110147603
    Abstract: A radiation detection apparatus includes a radiation detection unit that detects a first intensity of a radiation that has been transmitted through an inspection target to generate a first measurement value, the inspection target being disposed between a radiation source that irradiates the radiation and the radiation detection unit, a transmission ionization chamber that detects a second intensity of the radiation that has not reached the inspection target to generate a second measurement value, the transmission ionization chamber having an enclosed structure, the transmission ionization chamber being disposed between the radiation source and the inspection target, the transmission ionization chamber including an entrance window through which the radiation enters the transmission ionization chamber and an exit window through which the radiation goes out of the transmission ionization chamber, and an operation unit that calculates a physical quantity of the inspection target.
    Type: Application
    Filed: December 20, 2010
    Publication date: June 23, 2011
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yasushi ICHIZAWA, Hirohiko OBINATA, Yuusaku KOGA
  • Publication number: 20110069813
    Abstract: A radiation inspection apparatus includes a conveying unit configured to convey a sheet-like sample, a radiation source configured to emit radiation to the sheet-like sample, a line sensor configured to measure a physical property of the sheet-like sample, the liner sensor disposed to be opposed to the radiation source across the sheet-like sample, and a gas ejecting unit configured to eject gas to the sheet-like sample to reduce vertical conveyance swinging produced by a tension of the sheet-like sample, the gas ejecting unit placed in close proximity to at least one side face of the line sensor.
    Type: Application
    Filed: September 10, 2010
    Publication date: March 24, 2011
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yasushi ICHIZAWA, Hirohiko OBINATA
  • Publication number: 20110013748
    Abstract: A radiation inspection apparatus includes a radiation source, a measurement radiation detecting unit being a rectangle having a long side, and a reference radiation detecting unit that is disposed between the radiation source and an inspection target, the reference radiation detecting unit being disposed near a path of a radiation from the radiation source to the measurement radiation detecting unit not to interrupt the radiation from the radiation source to the measurement radiation detecting unit. An intensity of the radiation source are corrected by calculating a change value of the intensity and the intensity distribution from an output of the reference radiation detecting unit and by correcting the output of the measurement radiation detecting unit based on the change value.
    Type: Application
    Filed: July 12, 2010
    Publication date: January 20, 2011
    Applicant: Yokogawa Electric Corporation
    Inventors: Yasushi ICHIZAWA, Hirohiko Obinata
  • Patent number: 7551283
    Abstract: An orientation meter for measuring an orientation of a measuring object, the orientation meter including: a plurality of light emitting elements for irradiating light to the measuring object; a light receiving element for receiving reflected light being reflected by the measuring object; and a gain adjusting light emitting element arranged at a vicinity of the light receiving element, wherein the plurality of light emitting elements is arranged around the light receiving element, and the orientation of the measuring object is measured based on a signal from the light receiving element.
    Type: Grant
    Filed: September 20, 2006
    Date of Patent: June 23, 2009
    Assignee: Yokogawa Electric Corporation
    Inventor: Hirohiko Obinata
  • Publication number: 20070091313
    Abstract: An orientation meter for measuring an orientation of a measuring object, the orientation meter including: a plurality of light emitting elements for irradiating light to the measuring object; a light receiving element for receiving reflected light being reflected by the measuring object; and a gain adjusting light emitting element arranged at a vicinity of the light receiving element, wherein the plurality of light emitting elements is arranged around the light receiving element, and the orientation of the measuring object is measured based on a signal from the light receiving element.
    Type: Application
    Filed: September 20, 2006
    Publication date: April 26, 2007
    Inventor: Hirohiko Obinata