Patents by Inventor Hirohiko Obinata
Hirohiko Obinata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9194823Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.Type: GrantFiled: February 27, 2012Date of Patent: November 24, 2015Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Hirohiko Obinata, Kumiko Horikoshi
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Patent number: 8829459Abstract: A radiation detection apparatus includes a radiation detection unit that detects a first intensity of a radiation that has been transmitted through an inspection target to generate a first measurement value, the inspection target being disposed between a radiation source that irradiates the radiation and the radiation detection unit, a transmission ionization chamber that detects a second intensity of the radiation that has not reached the inspection target to generate a second measurement value, the transmission ionization chamber having an enclosed structure, the transmission ionization chamber being disposed between the radiation source and the inspection target, the transmission ionization chamber including an entrance window through which the radiation enters the transmission ionization chamber and an exit window through which the radiation goes out of the transmission ionization chamber, and an operation unit that calculates a physical quantity of the inspection target.Type: GrantFiled: December 20, 2010Date of Patent: September 9, 2014Assignee: Yokogawa Electric CorporationInventors: Yasushi Ichizawa, Hirohiko Obinata, Yuusaku Koga
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Patent number: 8483355Abstract: A radiation inspection apparatus includes a conveying unit configured to convey a sheet-like sample, a radiation source configured to emit radiation to the sheet-like sample, a line sensor configured to measure a physical property of the sheet-like sample, the liner sensor disposed to be opposed to the radiation source across the sheet-like sample, and a gas ejecting unit configured to eject gas to the sheet-like sample to reduce vertical conveyance swinging produced by a tension of the sheet-like sample, the gas ejecting unit placed in close proximity to at least one side face of the line sensor.Type: GrantFiled: September 10, 2010Date of Patent: July 9, 2013Assignee: Yokogawa Electric CorporationInventors: Yasushi Ichizawa, Hirohiko Obinata
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Patent number: 8447012Abstract: A radiation inspection apparatus includes a radiation source, a measurement radiation detecting unit being a rectangle having a long side, and a reference radiation detecting unit that is disposed between the radiation source and an inspection target, the reference radiation detecting unit being disposed near a path of a radiation from the radiation source to the measurement radiation detecting unit not to interrupt the radiation from the radiation source to the measurement radiation detecting unit. An intensity of the radiation source are corrected by calculating a change value of the intensity and the intensity distribution from an output of the reference radiation detecting unit and by correcting the output of the measurement radiation detecting unit based on the change value.Type: GrantFiled: July 12, 2010Date of Patent: May 21, 2013Assignee: Yokogawa Electric CorporationInventors: Yasushi Ichizawa, Hirohiko Obinata
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Publication number: 20120221275Abstract: A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.Type: ApplicationFiled: February 27, 2012Publication date: August 30, 2012Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Hirohiko OBINATA, Kumiko HORIKOSHI
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Publication number: 20110147603Abstract: A radiation detection apparatus includes a radiation detection unit that detects a first intensity of a radiation that has been transmitted through an inspection target to generate a first measurement value, the inspection target being disposed between a radiation source that irradiates the radiation and the radiation detection unit, a transmission ionization chamber that detects a second intensity of the radiation that has not reached the inspection target to generate a second measurement value, the transmission ionization chamber having an enclosed structure, the transmission ionization chamber being disposed between the radiation source and the inspection target, the transmission ionization chamber including an entrance window through which the radiation enters the transmission ionization chamber and an exit window through which the radiation goes out of the transmission ionization chamber, and an operation unit that calculates a physical quantity of the inspection target.Type: ApplicationFiled: December 20, 2010Publication date: June 23, 2011Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Yasushi ICHIZAWA, Hirohiko OBINATA, Yuusaku KOGA
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Publication number: 20110069813Abstract: A radiation inspection apparatus includes a conveying unit configured to convey a sheet-like sample, a radiation source configured to emit radiation to the sheet-like sample, a line sensor configured to measure a physical property of the sheet-like sample, the liner sensor disposed to be opposed to the radiation source across the sheet-like sample, and a gas ejecting unit configured to eject gas to the sheet-like sample to reduce vertical conveyance swinging produced by a tension of the sheet-like sample, the gas ejecting unit placed in close proximity to at least one side face of the line sensor.Type: ApplicationFiled: September 10, 2010Publication date: March 24, 2011Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Yasushi ICHIZAWA, Hirohiko OBINATA
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Publication number: 20110013748Abstract: A radiation inspection apparatus includes a radiation source, a measurement radiation detecting unit being a rectangle having a long side, and a reference radiation detecting unit that is disposed between the radiation source and an inspection target, the reference radiation detecting unit being disposed near a path of a radiation from the radiation source to the measurement radiation detecting unit not to interrupt the radiation from the radiation source to the measurement radiation detecting unit. An intensity of the radiation source are corrected by calculating a change value of the intensity and the intensity distribution from an output of the reference radiation detecting unit and by correcting the output of the measurement radiation detecting unit based on the change value.Type: ApplicationFiled: July 12, 2010Publication date: January 20, 2011Applicant: Yokogawa Electric CorporationInventors: Yasushi ICHIZAWA, Hirohiko Obinata
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Patent number: 7551283Abstract: An orientation meter for measuring an orientation of a measuring object, the orientation meter including: a plurality of light emitting elements for irradiating light to the measuring object; a light receiving element for receiving reflected light being reflected by the measuring object; and a gain adjusting light emitting element arranged at a vicinity of the light receiving element, wherein the plurality of light emitting elements is arranged around the light receiving element, and the orientation of the measuring object is measured based on a signal from the light receiving element.Type: GrantFiled: September 20, 2006Date of Patent: June 23, 2009Assignee: Yokogawa Electric CorporationInventor: Hirohiko Obinata
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Publication number: 20070091313Abstract: An orientation meter for measuring an orientation of a measuring object, the orientation meter including: a plurality of light emitting elements for irradiating light to the measuring object; a light receiving element for receiving reflected light being reflected by the measuring object; and a gain adjusting light emitting element arranged at a vicinity of the light receiving element, wherein the plurality of light emitting elements is arranged around the light receiving element, and the orientation of the measuring object is measured based on a signal from the light receiving element.Type: ApplicationFiled: September 20, 2006Publication date: April 26, 2007Inventor: Hirohiko Obinata