Patents by Inventor Hiroki Yazawa
Hiroki Yazawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20210307602Abstract: A model eye is disposed on a reference light path of reference light in a reference optical system so as to reflect or scatter the reference light at a model retina in order to form an interference optical system used to obtain interference light from the reference light of the reference optical system and signal light illuminated onto an examined eye in a signal optical system.Type: ApplicationFiled: May 23, 2019Publication date: October 7, 2021Applicant: NIKON CORPORATIONInventor: Hiroki YAZAWA
-
Patent number: 10393661Abstract: A structured illumination microscopic device includes a first spatial modulation unit spatially modulating a fluorescent sample using an excitation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency ?1 for shifting a fluorescent substance to an excitation level; a second spatial modulation unit spatially modulating the fluorescent sample using a stimulation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency ?2 for shifting the excited fluorescent substance to a base level; and an imaging unit obtaining, as a modulated image, an image of the fluorescent sample with spontaneously emitted light generated at the fluorescent sample in accordance with the excitation light and the stimulation light.Type: GrantFiled: October 20, 2016Date of Patent: August 27, 2019Assignee: NIKON CORPORATIONInventors: Fumihiro Dake, Hiroki Yazawa
-
Patent number: 10222334Abstract: A super-resolution observation device includes an illumination optical system collecting a first illuminating light having a first optical frequency ?1 on a first region of an observation object, collecting a second illuminating light having a second optical frequency ?2? on a second region partially overlapping the first region, and collecting a third illuminating light having a third optical frequency ?2 on a third region containing a non-overlap region which is a region of the first region and does not overlap the second region; and an extraction unit extracting a signal light generated in accordance with a change in an energy level of a substance in the non-overlap region from a light generated in all of the first region, the second region, and the third region.Type: GrantFiled: September 26, 2016Date of Patent: March 5, 2019Assignee: NIKON CORPORATIONInventors: Fumihiro Dake, Tomoko Ujike, Hiroki Yazawa
-
Patent number: 10054545Abstract: A super-resolution observation device includes an illumination optical system that focus a first illuminating light at optical frequency ?1 and a second illuminating light at optical frequency ?2 on a region of an observation object plane; a modulation unit that modulates a property of the first illuminating light heading toward the region at a modulation frequency fm; and an extraction unit that extracts a component at the optical frequency ?1 or ?2 from a light generated in the region according to the first illuminating light and the second illuminating light, the component of which the property changes at a frequency higher than the modulation frequency fm.Type: GrantFiled: September 26, 2016Date of Patent: August 21, 2018Assignee: NIKON CORPORATIONInventors: Fumihiro Dake, Hiroki Yazawa
-
Publication number: 20170082545Abstract: A super-resolution observation device includes an illumination optical system collecting a first illuminating light having a first optical frequency co, on a first region of an observation object, collecting a second illuminating light having a second optical frequency ?2? on a second region partially overlapping the first region, and collecting a third illuminating light having a third optical frequency ?2 on a third region containing a non-overlap region which is a region of the first region and does not overlap the second region; and an extraction unit extracting a signal light generated in accordance with a change in an energy level of a substance in the non-overlap region from a light generated in all of the first region, the second region, and the third region.Type: ApplicationFiled: September 26, 2016Publication date: March 23, 2017Applicant: NIKON CORPORATIONInventors: Fumihiro DAKE, Tomoko UJIKE, Hiroki YAZAWA
-
Publication number: 20170082546Abstract: A super-resolution observation device includes an illumination optical system that focus a first illuminating light at optical frequency ?1 and a second illuminating light at optical frequency ?2 on a region of an observation object plane; a modulation unit that modulates a property of the first illuminating light heading toward the region at a modulation frequency fm; and an extraction unit that extracts a component at the optical frequency ?1 or ?2 from a light generated in the region according to the first illuminating light and the second illuminating light, the component of which the property changes at a frequency higher than the modulation frequency fm.Type: ApplicationFiled: September 26, 2016Publication date: March 23, 2017Applicant: NIKON CORPORATIONInventors: Fumihiro DAKE, Hiroki YAZAWA
-
Publication number: 20170038300Abstract: A structured illumination microscopic device includes a first spatial modulation unit spatially modulating a fluorescent sample using an excitation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency ?1 for shifting a fluorescent substance to an excitation level; a second spatial modulation unit spatially modulating the fluorescent sample using a stimulation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency ?2 for shifting the excited fluorescent substance to a base level; and an imaging unit obtaining, as a modulated image, an image of the fluorescent sample with spontaneously emitted light generated at the fluorescent sample in accordance with the excitation light and the stimulation light.Type: ApplicationFiled: October 20, 2016Publication date: February 9, 2017Applicant: NIKON CORPORATIONInventors: Fumihiro DAKE, Hiroki YAZAWA
-
Patent number: 9261690Abstract: A phase-contrast microscope system includes: an illumination optical system that illuminates a specimen with an illumination light from a light source; an imaging optical system that forms an image of the specimen from a light from the specimen; a first spatial modulation element that is disposed in a position of a pupil of the imaging optical system and changes an amplitude transmittance distribution of the light from the specimen; an image sensor that detects the image of the specimen by the imaging optical system and outputs a picture signal; a calculation section that calculates the amplitude transmittance distribution of the light from the specimen appropriate for observing the specimen on the basis of the output data detected by the image sensor and the amplitude transmittance distribution of the light from the specimen formed by the first spatial modulation element.Type: GrantFiled: January 26, 2012Date of Patent: February 16, 2016Assignee: NIKON CORPORATIONInventors: Naoki Fukutake, Hiroki Yazawa, Shigeru Nakayama, Shinichi Nakajima
-
Publication number: 20120293644Abstract: A phase-contrast microscope system includes: an illumination optical system that illuminates a specimen with an illumination light from a light source; an imaging optical system that forms an image of the specimen from a light from the specimen; a first spatial modulation element that is disposed in a position of a pupil of the imaging optical system and changes an amplitude transmittance distribution of the light from the specimen; an image sensor that detects the image of the specimen by the imaging optical system and outputs a picture signal; a calculation section that calculates the amplitude transmittance distribution of the light from the specimen appropriate for observing the specimen on the basis of the output data detected by the image sensor and the amplitude transmittance distribution of the light from the specimen formed by the first spatial modulation element.Type: ApplicationFiled: January 26, 2012Publication date: November 22, 2012Inventors: Naoki FUKUTAKE, Hiroki Yazawa, Shigeru Nakayama, Shinichi Nakajima