Abstract: A functional polarizing element for insert molding is provided which is constituted by a polarizing film; a cured coating film formed on a concave surface of the polarizing film by applying and drying a coating material containing 100 parts by mass of a transparent adhesive and 4 to 20 parts by mass of a functional dye; and a cured coating film of a transparent adhesive, and coating a convex surface of the polarizing film. Also, a functional polarizing lens is provided which is obtained by insert molding using the functional polarizing element.

Abstract: A polarizing element is superposed upon a lens base material. The polarizing element has an average light transmittance of light having a wavelength of 400 to 760 nm in a visible region is 30% or more. A light transmittance of light having a wavelength of 410 to 700 nm in a near infrared region is 0 to 2% when the polarizing element and an identical polarizing element are superposed one upon the other with their polarization axes perpendicular to each other. One of a film integral with the polarizing lens and the lens base material contains a near infrared ray absorption dye such that a light transmittance of light having a wavelength of 700 to 800 nm in a near infrared region is 0 to 2% when the polarizing lens and an identical polarizing lens are superposed one upon the other with their polarization axes perpendicular to each other.

Abstract: Provided is a prober capable of suppressing the increase in installation area and the increase in device cost, and also improving the throughput, while maintaining the accuracy of the moving position of an alignment device shared by each of measuring units. The prober includes: a plurality of measuring units, each of which has a probe card electrically connected to a test head; a wafer chuck that holds a wafer in which a plurality of chips are formed; an alignment device which performs relative alignment between the probe card and the wafer held by the wafer chuck; a moving device which moves the alignment device among the measuring units; and a positioning and fixing device which is provided for every of the measuring units, and positions and fixes the alignment device which is moved to each of the measuring units.

Abstract: Abbe error that needs to be considered in high accuracy positioning of a device to be maintained, is suppressed. A prober includes: a plurality of measurement sections arranged between a conveyance area and a maintenance area, each of the measurement sections having a device to be maintained which is used for inspection of a semiconductor element formed on a wafer, and a draw-out mechanism configured to draw out the device to be maintained to a side of the maintenance area; a conveyance unit configured to convey an object to be conveyed to a destination measurement section; and a loading part configured to load the object to be conveyed from the side of the maintenance area to the measurement section. The object to be conveyed is loadable into the measurement section from a conveyance area side and the maintenance area side.

Abstract: A functional laminated spectacle lens is provided which includes, as constituent layers, an outer lens, a polarizing film, and an inner lens. A functional layer is formed on at least one of the constituent layers. Another constituent layer is laminated on and joined to the functional layer through an adhesive layer. The functional layer is formed using a spin coating material which is obtained by incorporating a functional pigment into an acrylic urethane resin containing, as a main component, an acrylic polyol containing 4-hydroxybutyl acrylate, and, as a curable component, a polyisocyanate. Once the spin coating material cures, the required functional pigment is reliably maintained in the functional layer by a three-dimensional network structure, the migration of the functional pigment into an adjacent resin monomer-containing layer is prevented, and the functional pigment is made less susceptible to the effect of an organic peroxide contained in the resin.

Abstract: Provided is a prober capable of maintaining parallelism between a probe card and a wafer as well as performing wafer-level inspection with high accuracy. A test head is held by a test head holding part, and the test head and a probe card are sucked and fixed to a pogo frame attached to a head stage. A wafer chuck is moved toward a probe card while being fixed to a Z-axis movement-rotation unit in a detachable manner, and the wafer chuck is drawn toward the probe card by reducing pressure in an air-tight space formed between the wafer chuck and the probe card using a pressure reducing unit. Then, an electrical inspection of a wafer is performed while the test head, the pogo frame, the probe card, and the wafer chuck are integrated with respect to the head stage.

Abstract: Abbe error that needs to be considered in high accuracy positioning of a device to be maintained, is suppressed. A prober includes: a plurality of measurement sections arranged between a conveyance area and a maintenance area, each of the measurement sections having a device to be maintained which is used for inspection of a semiconductor element formed on a wafer, and a draw-out mechanism configured to draw out the device to be maintained to a side of the maintenance area; a conveyance unit configured to convey an object to be conveyed to a destination measurement section; and a loading part configured to load the object to be conveyed from the side of the maintenance area to the measurement section. The object to be conveyed is loadable into the measurement section from a conveyance area side and the maintenance area side.

Abstract: A polarizing lens for spectacles is provided including a polarizing element superposed upon a lens base material. The polarizing element has an average light transmittance of light having a wavelength of 400 to 760 nm in a visible region is 30% or more. A light transmittance of light having a wavelength of 410 to 700 nm in a near infrared region is 0 to 2% if two of the polarizing elements are superposed one upon the other with their polarization axes perpendicular to each other. A film integral with the lens base material or the polarizing lens contains a near infrared ray absorption dye such that a light transmittance of light having a wavelength of 700 to 800 rim in a near infrared region is 0 to 2% if two of the polarizing lenses are superposed one upon the other with their polarization axes perpendicular to each other.

Abstract: Provided is a prober capable of maintaining parallelism between a probe card and a wafer as well as performing wafer-level inspection with high accuracy. A test head is held by a test head holding part, and the test head and a probe card are sucked and fixed to a pogo frame attached to a head stage. A wafer chuck is moved toward a probe card while being fixed to a Z-axis movement-rotation unit in a detachable manner, and the wafer chuck is drawn toward the probe card by reducing pressure in an air-tight space formed between the wafer chuck and the probe card using a pressure reducing unit. Then, an electrical inspection of a wafer is performed while the test head, the pogo frame, the probe card, and the wafer chuck are integrated with respect to the head stage.

Abstract: A functional laminated spectacle lens is provided which includes, as constituent layers, an outer lens, a polarizing film, and an inner lens. A functional layer is formed on at least one of the constituent layers. Another constituent layer is laminated on and joined to the functional layer through an adhesive layer. The functional layer is formed using a spin coating material which is obtained by incorporating a functional pigment into an acrylic urethane resin containing, as a main component, an acrylic polyol containing 4-hydroxybutyl acrylate, and, as a curable component, a polyisocyanate. Once the spin coating material cures, the required functional pigment is reliably maintained in the functional layer by a three-dimensional network structure, the migration of the functional pigment into an adjacent resin monomer-containing layer is prevented, and the functional pigment is made less susceptible to the effect of an organic peroxide contained in the resin.

Abstract: Provided is a prober capable of suppressing the increase in installation area and the increase in device cost, and also improving the throughput, while maintaining the accuracy of the moving position of an alignment device shared by each of measuring units. The prober includes: a plurality of measuring units, each of which has a probe card electrically connected to a test head; a wafer chuck that holds a wafer in which a plurality of chips are formed; an alignment device which performs relative alignment between the probe card and the wafer held by the wafer chuck; a moving device which moves the alignment device among the measuring units; and a positioning and fixing device which is provided for every of the measuring units, and positions and fixes the alignment device which is moved to each of the measuring units.

Abstract: The present invention concerns an ingress noise control system and an ingress noise blocking device which are used in a cable system to suppress ingress noise. In the cable system providing two-way communication using different frequency bands for transmission of upstream and downstream signals, the ingress noise control system includes, within a distribution unit, a two-way amplification unit, etc. provided in an upstream signal transmission path, a synchronous detection controller 6 for synchronously detecting the upstream signal transmitted from terminal equipment and separated by a low-pass filter 4 in a second separation filter 2, a gate switch circuit 5 which is turned on by the synchronous detection controller 6 to pass the upstream signal only when the upstream signal is synchronously detected, and an indicator 7 for indicating the on/off state of the gate switch circuit 5.

Abstract: A CATV transmission center apparatus, a subscriber terminal device, a CATV distribution system, and a method of distributing a program, will solve the problems of the need to change transmission facilities for handling more channels, the costly CATV infrastructure per program, the expensive subscriber terminal devices, and the tedious and time-consuming process of selecting desired programs. When there is a request to view a program which is not being distributed from the subscriber terminal device to the CATV transmission center apparatus, an empty channel is searched for. If an empty channel is found, the requested program is distributed via the empty channel. All subscriber terminal devices are notified that the program which has started to be distributed is being distributed. The CATV transmission center apparatus distributes only those programs which are actually viewed by subscribers.