Patents by Inventor Hiroshi Akiyama

Hiroshi Akiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9223140
    Abstract: A coupling lens for coupling first light having a first wavelength from a first light source with a second light having a second wavelength from a second light source disposed adjacent to the first light source in substantially the same direction includes a first surface disposed to face the first and second light sources, the first surface including a first region transmitting the first light and having a first region curvature and a second region transmitting the second light and having a second region curvature, and a second surface opposite to the first surface and having a second-surface curvature. A position of a center of the first region curvature differs from a position of a center of the second region curvature. A center of the second surface curvature and the center of the first region curvature are disposed on an optical axis of the first or second light source.
    Type: Grant
    Filed: December 15, 2009
    Date of Patent: December 29, 2015
    Assignee: RICOH COMPANY, LTD.
    Inventors: Yoshitaka Takahashi, Hiroshi Akiyama
  • Publication number: 20150320308
    Abstract: An ophthalmologic imaging apparatus includes: a first optical system that applies an accommodation stimulus to a subject's eye; a tomographic image forming unit that includes a second optical system that splits light from a light source into signal light and reference light, and detects interference light between the signal light having travelled via the subject's eye and the reference light, and creates a tomographic image of the subject's eye based on a detection result of the interference light; and an analyzer that compares a first tomographic image with a second tomographic image to acquire change information indicating a change in a tissue of the subject's eye due to an accommodation stimulus change. The first and second tomographic images are respectively created by the tomographic image forming unit for the subject's eye, to which first and second accommodation stimuli are respectively applied by the first and second optical systems.
    Type: Application
    Filed: December 4, 2013
    Publication date: November 12, 2015
    Inventors: Masahiro AKIBA, Yasufumi FUKUMA, Hiroshi AKIYAMA, Hisashi TSUKADA, Eiichi YANAGI
  • Patent number: 9176075
    Abstract: Provided are a contamination inspection method and a contamination inspection device for highly accurately detecting a defect in a wafer, a liquid crystal substrate and media or the like including patterns, for example, a semiconductor device or the like. The first aspect of the present invention is a contamination inspection device comprising: an irradiation optical system for irradiating lights on the inspection target substrate; and a spatial filter for shading diffracted lights form the inspection target substrate. Herein, the spatial filter comprises: a plurality of light shading materials; a control member for changing at least one of parameters selected from a shape, an angle and an interval with respect to the light shading material, and a control unit for controlling the control members.
    Type: Grant
    Filed: June 21, 2010
    Date of Patent: November 3, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masanori Gunji, Tomonari Morioka, Hiroshi Akiyama, Hideki Fukushima
  • Publication number: 20150238780
    Abstract: A scanning magnet of an irradiation nozzle is controlled to irradiate the ion beam irradiated from a synchrotron accelerator to a target position Pi,j of a spoti,j in a certain layer Li of a target volume, using a scanning control apparatus. A deviation Dj between the target position Pi,j and an actual irradiation position Pai,j is obtained. Using the deviation Dj, a systematic error Esi,j and a random error Eri,j of the actual irradiation position Pai,j are obtained. Whether the systematic error Esi,j exists within a first permissible range of the systematic error Esi,j is determined. Whether the random error Eri,j exists within a second permissible range of the random error Eri,j is determined. When the systematic error Esi,j or the random error Eri,j is deviated from the permissible range, the irradiation of the ion beam to the target volume is stopped.
    Type: Application
    Filed: February 24, 2015
    Publication date: August 27, 2015
    Inventors: Arao Nishimura, Hiroshi Akiyama, Ryosuke Shinagawa, Takeshi Fujita
  • Publication number: 20150217138
    Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.
    Type: Application
    Filed: April 14, 2015
    Publication date: August 6, 2015
    Inventors: Rintaro FUJIMOTO, Yoshihiko NAGAMINE, Masumi UMEZAWA, Toru UMEKAWA, Yusuke FUJII, Hiroshi AKIYAMA
  • Patent number: 9012873
    Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.
    Type: Grant
    Filed: June 30, 2014
    Date of Patent: April 21, 2015
    Assignee: Hitachi, Ltd.
    Inventors: Rintaro Fujimoto, Yoshihiko Nagamine, Masumi Umezawa, Toru Umekawa, Yusuke Fujii, Hiroshi Akiyama
  • Patent number: 8874385
    Abstract: The present invention provides, at low cost, a multilayer radiation detector whose position relative to a beam axis can be verified. The radiation detector includes a plurality of sensors that react to radiation and are stacked in parallel inlayers in a traveling direction of the radiation. The sensors are each sectioned into a central region including the center of the sensor and another region surrounding the central region. The radiation detector independently measures signals measured by the central regions and signals measured by the other regions. Thus, the position of the radiation detector can be verified.
    Type: Grant
    Filed: January 25, 2011
    Date of Patent: October 28, 2014
    Assignee: Hitachi, Ltd.
    Inventors: Taisuke Takayanagi, Hideaki Nihongi, Yusuke Fujii, Hiroshi Akiyama, Masahiro Tadokoro, Rintaro Fujimoto
  • Publication number: 20140316184
    Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.
    Type: Application
    Filed: June 30, 2014
    Publication date: October 23, 2014
    Inventors: Rintaro FUJIMOTO, Yoshihiko NAGAMINE, Masumi UMEZAWA, Toru UMEKAWA, Yusuke FUJII, Hiroshi AKIYAMA
  • Patent number: 8847179
    Abstract: A charged particle beam reduces treatment time in the uniform scanning or in the conformal layer stacking irradiation. In the uniform scanning, an optimum charged particle beam scan path for uniformly irradiating a collimator aperture area is calculated. In the conformal layer stacking irradiation, an optimum charged particle beam scan path for uniformly irradiating a multi-leaf collimator aperture area of each layer for each of the layers obtained by partitioning the target volume is calculated. Alternatively, a minimum irradiation field size that covers the multi-leaf collimator aperture area of each layer is calculated, and a scan path corresponding to the irradiation field size, prestored in a memory of a particle therapy control apparatus, is selected. The charged particle beam scan path is optimally changed in the lateral directions in conformity with the collimator aperture area in the uniform scanning or in each layer in the conformal layer stacking irradiation.
    Type: Grant
    Filed: April 17, 2012
    Date of Patent: September 30, 2014
    Assignee: Hitachi, Ltd.
    Inventors: Shinichiro Fujitaka, Yusuke Fujii, Rintaro Fujimoto, Kazuo Hiramoto, Hiroshi Akiyama
  • Patent number: 8810880
    Abstract: An optical scan unit (10) is configured to include a light source (11), a divergent light conversion element (12) having such positive power as to convert divergent light from the light source (11) into convergent light to form a spot on a projection plane, an optical deflector (13) deflecting a light beam from the divergent light conversion element (12) to a first scan direction and a second scan direction which is orthogonal to the first scan direction, and a deflection angle conversion element 14 (14) having such negative power as to convert a deflection angle of the light deflected by the optical deflector (13).
    Type: Grant
    Filed: June 16, 2009
    Date of Patent: August 19, 2014
    Assignee: Ricoh Company, Ltd.
    Inventors: Yukiko Hamano, Hiroshi Akiyama, Yoshitaka Takahashi
  • Patent number: 8796648
    Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.
    Type: Grant
    Filed: October 17, 2013
    Date of Patent: August 5, 2014
    Assignee: Hitachi, Ltd.
    Inventors: Rintaro Fujimoto, Yoshihiko Nagamine, Masumi Umezawa, Toru Umekawa, Yusuke Fujii, Hiroshi Akiyama
  • Publication number: 20140046113
    Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.
    Type: Application
    Filed: October 17, 2013
    Publication date: February 13, 2014
    Applicant: HITACHI, LTD.
    Inventors: Rintaro FUJIMOTO, Yoshihiko NAGAMINE, Masumi UMEZAWA, Toru UMEKAWA, Yusuke FUJII, Hiroshi AKIYAMA
  • Patent number: 8630069
    Abstract: In one embodiment, a magnetic head includes a magnetoresistance effect sensor including a free layer, a hard bias magnetic film adapted for performing magnetic domain control of the free layer by biasing a magnetization direction of the free layer towards a predefined direction that is positioned on both sides of the free layer in a track-width direction, an upper shield positioned above the hard bias magnetic film and the magnetoresistance effect sensor; and an antiferromagnetic (AFM) layer positioned above the upper shield. The upper shield includes first and second upper shield layers, and an AFM coupling layer positioned between the first upper shield layer and the second upper shield layer that is adapted for antiferromagnetically coupling the first upper shield layer and the second upper shield layer, wherein a magnetization of the first upper shield layer is antiparallel with a magnetization of the hard magnetic bias layer.
    Type: Grant
    Filed: October 4, 2012
    Date of Patent: January 14, 2014
    Assignee: HGST Netherlands B.V.
    Inventors: Norihiro Okawa, Kouji Okazaki, Yoshibumi Matsuda, Hiroshi Akiyama
  • Patent number: 8581218
    Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.
    Type: Grant
    Filed: June 29, 2011
    Date of Patent: November 12, 2013
    Assignee: Hitachi, Ltd.
    Inventors: Rintaro Fujimoto, Yoshihiko Nagamine, Masumi Umezawa, Toru Umekawa, Yusuke Fujii, Hiroshi Akiyama
  • Patent number: 8424207
    Abstract: A method of making a composite component and the composite component is disclosed. The composite component can comprise multiple portions with different materials. By configuring the composite component with different materials, the weight of the composite component can be reduced while maintaining the strength and support of the composite component for a cockpit assembly. Furthermore, the method provides for an increase in the efficiency of the die casting process used to create the composite component.
    Type: Grant
    Filed: October 27, 2008
    Date of Patent: April 23, 2013
    Assignee: Honda Motor Co., Ltd.
    Inventors: Takashi Nakano, Hiroshi Akiyama, Brent Andrees, Brad Klein, Charles Gagliano, Ryan Joseph Phillips, Steven Behm, Kyle Pearce, Martyn Morrish, Allen Sheldon
  • Patent number: 8377696
    Abstract: A method for accurate and precise measurement of target proteins such as food allergen proteins in the specific foods is provided. The method is a method for immunological measurement of a food allergen protein in a processed food using an antibody against the food allergen protein, comprising adding animal tropomyosin to an assay solution upon measurement.
    Type: Grant
    Filed: April 4, 2008
    Date of Patent: February 19, 2013
    Assignees: Maruha Nichiro Seafoods, Inc., Japan as Represented by Director General of National Institute of Health Sciences
    Inventors: Kosuke Seiki, Hiroshi Oda, Hisashi Yoshioka, Hiroshi Akiyama, Tamio Maitani
  • Publication number: 20120264998
    Abstract: A charged particle beam reduces treatment time in the uniform scanning or in the conformal layer stacking irradiation. In the uniform scanning, an optimum charged particle beam scan path for uniformly irradiating a collimator aperture area is calculated. In the conformal layer stacking irradiation, an optimum charged particle beam scan path for uniformly irradiating a multi-leaf collimator aperture area of each layer for each of the layers obtained by partitioning the target volume is calculated. Alternatively, a minimum irradiation field size that covers the multi-leaf collimator aperture area of each layer is calculated, and a scan path corresponding to the irradiation field size, prestored in a memory of a particle therapy control apparatus, is selected. The charged particle beam scan path is optimally changed in the lateral directions in conformity with the collimator aperture area in the uniform scanning or in each layer in the conformal layer stacking irradiation.
    Type: Application
    Filed: April 17, 2012
    Publication date: October 18, 2012
    Applicant: HITACHI, LTD.
    Inventors: Shinichiro FUJITAKA, Yusuke FUJII, Rintaro FUJIMOTO, Kazuo HIRAMOTO, Hiroshi AKIYAMA
  • Patent number: 8253113
    Abstract: A charged particle beam irradiation system includes a synchrotron which accelerates an ion beam, an irradiation apparatus for irradiating an object with the ion beam introduced from the synchrotron, detection means for measuring an amount of accumulated charge of the ion beam that orbits in the synchrotron immediately before an extraction control period in an operating cycle of the synchrotron, and beam extraction control means for controlling extraction of the ion beam based on the measurement result of the accumulated beam charge amount so that extraction of a total amount of the ion beam is to be completed with an expiration of an extraction control time, the extraction control time representing a length of the extraction control period of the synchrotron and being set in advance.
    Type: Grant
    Filed: June 24, 2009
    Date of Patent: August 28, 2012
    Assignee: Hitachi, Ltd.
    Inventors: Hideaki Nishiuchi, Kazuyoshi Saito, Masahiro Tadokoro, Hiroshi Akiyama, Kazuo Hiramoto
  • Publication number: 20120147364
    Abstract: Provided are a contamination inspection method and a contamination inspection device for highly accurately detecting a defect in a wafer, a liquid crystal substrate and media or the like including patterns, for example, a semiconductor device or the like. The first aspect of the present invention is a contamination inspection device comprising: an irradiation optical system for irradiating lights on the inspection target substrate; and a spatial filter for shading diffracted lights form the inspection target substrate. Herein, the spatial filter comprises: a plurality of light shading materials; a control member for changing at least one of parameters selected from a shape, an angle and an interval with respect to the light shading material, and a control unit for controlling the control members.
    Type: Application
    Filed: June 21, 2010
    Publication date: June 14, 2012
    Inventors: Masanori Gunji, Tomonari Morioka, Hiroshi Akiyama, Hideki Fukushima
  • Patent number: 8147069
    Abstract: A lighting device, including a first light source emitting light of a first wavelength; a second light source close to the first source, emitting light of a second wavelength in almost a same direction as that of the first source; a third light source located emitting light of a third wavelength in a direction different from that of the first and second sources; a coupling optical system coupling light from the first and second sources; another coupling optical system coupling light from the third source; and a light path synthesizer synthesizing a light path of light from the first, second and third sources, wherein the light path synthesizer includes a first surface reflecting light from the first source and transmitting light from the second and third sources and a second surface unparallel with the first surface, reflecting light from the second source and transmitting light from the third source.
    Type: Grant
    Filed: July 27, 2009
    Date of Patent: April 3, 2012
    Assignee: Ricoh Company, Limited
    Inventors: Manabu Seo, Hiroshi Akiyama, Shigeru Oouchida, Yukiko Hamano, Goichi Akanuma