Patents by Inventor Hiroshi Akiyama
Hiroshi Akiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9223140Abstract: A coupling lens for coupling first light having a first wavelength from a first light source with a second light having a second wavelength from a second light source disposed adjacent to the first light source in substantially the same direction includes a first surface disposed to face the first and second light sources, the first surface including a first region transmitting the first light and having a first region curvature and a second region transmitting the second light and having a second region curvature, and a second surface opposite to the first surface and having a second-surface curvature. A position of a center of the first region curvature differs from a position of a center of the second region curvature. A center of the second surface curvature and the center of the first region curvature are disposed on an optical axis of the first or second light source.Type: GrantFiled: December 15, 2009Date of Patent: December 29, 2015Assignee: RICOH COMPANY, LTD.Inventors: Yoshitaka Takahashi, Hiroshi Akiyama
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Publication number: 20150320308Abstract: An ophthalmologic imaging apparatus includes: a first optical system that applies an accommodation stimulus to a subject's eye; a tomographic image forming unit that includes a second optical system that splits light from a light source into signal light and reference light, and detects interference light between the signal light having travelled via the subject's eye and the reference light, and creates a tomographic image of the subject's eye based on a detection result of the interference light; and an analyzer that compares a first tomographic image with a second tomographic image to acquire change information indicating a change in a tissue of the subject's eye due to an accommodation stimulus change. The first and second tomographic images are respectively created by the tomographic image forming unit for the subject's eye, to which first and second accommodation stimuli are respectively applied by the first and second optical systems.Type: ApplicationFiled: December 4, 2013Publication date: November 12, 2015Inventors: Masahiro AKIBA, Yasufumi FUKUMA, Hiroshi AKIYAMA, Hisashi TSUKADA, Eiichi YANAGI
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Patent number: 9176075Abstract: Provided are a contamination inspection method and a contamination inspection device for highly accurately detecting a defect in a wafer, a liquid crystal substrate and media or the like including patterns, for example, a semiconductor device or the like. The first aspect of the present invention is a contamination inspection device comprising: an irradiation optical system for irradiating lights on the inspection target substrate; and a spatial filter for shading diffracted lights form the inspection target substrate. Herein, the spatial filter comprises: a plurality of light shading materials; a control member for changing at least one of parameters selected from a shape, an angle and an interval with respect to the light shading material, and a control unit for controlling the control members.Type: GrantFiled: June 21, 2010Date of Patent: November 3, 2015Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Masanori Gunji, Tomonari Morioka, Hiroshi Akiyama, Hideki Fukushima
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Publication number: 20150238780Abstract: A scanning magnet of an irradiation nozzle is controlled to irradiate the ion beam irradiated from a synchrotron accelerator to a target position Pi,j of a spoti,j in a certain layer Li of a target volume, using a scanning control apparatus. A deviation Dj between the target position Pi,j and an actual irradiation position Pai,j is obtained. Using the deviation Dj, a systematic error Esi,j and a random error Eri,j of the actual irradiation position Pai,j are obtained. Whether the systematic error Esi,j exists within a first permissible range of the systematic error Esi,j is determined. Whether the random error Eri,j exists within a second permissible range of the random error Eri,j is determined. When the systematic error Esi,j or the random error Eri,j is deviated from the permissible range, the irradiation of the ion beam to the target volume is stopped.Type: ApplicationFiled: February 24, 2015Publication date: August 27, 2015Inventors: Arao Nishimura, Hiroshi Akiyama, Ryosuke Shinagawa, Takeshi Fujita
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Publication number: 20150217138Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.Type: ApplicationFiled: April 14, 2015Publication date: August 6, 2015Inventors: Rintaro FUJIMOTO, Yoshihiko NAGAMINE, Masumi UMEZAWA, Toru UMEKAWA, Yusuke FUJII, Hiroshi AKIYAMA
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Patent number: 9012873Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.Type: GrantFiled: June 30, 2014Date of Patent: April 21, 2015Assignee: Hitachi, Ltd.Inventors: Rintaro Fujimoto, Yoshihiko Nagamine, Masumi Umezawa, Toru Umekawa, Yusuke Fujii, Hiroshi Akiyama
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Patent number: 8874385Abstract: The present invention provides, at low cost, a multilayer radiation detector whose position relative to a beam axis can be verified. The radiation detector includes a plurality of sensors that react to radiation and are stacked in parallel inlayers in a traveling direction of the radiation. The sensors are each sectioned into a central region including the center of the sensor and another region surrounding the central region. The radiation detector independently measures signals measured by the central regions and signals measured by the other regions. Thus, the position of the radiation detector can be verified.Type: GrantFiled: January 25, 2011Date of Patent: October 28, 2014Assignee: Hitachi, Ltd.Inventors: Taisuke Takayanagi, Hideaki Nihongi, Yusuke Fujii, Hiroshi Akiyama, Masahiro Tadokoro, Rintaro Fujimoto
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Publication number: 20140316184Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.Type: ApplicationFiled: June 30, 2014Publication date: October 23, 2014Inventors: Rintaro FUJIMOTO, Yoshihiko NAGAMINE, Masumi UMEZAWA, Toru UMEKAWA, Yusuke FUJII, Hiroshi AKIYAMA
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Patent number: 8847179Abstract: A charged particle beam reduces treatment time in the uniform scanning or in the conformal layer stacking irradiation. In the uniform scanning, an optimum charged particle beam scan path for uniformly irradiating a collimator aperture area is calculated. In the conformal layer stacking irradiation, an optimum charged particle beam scan path for uniformly irradiating a multi-leaf collimator aperture area of each layer for each of the layers obtained by partitioning the target volume is calculated. Alternatively, a minimum irradiation field size that covers the multi-leaf collimator aperture area of each layer is calculated, and a scan path corresponding to the irradiation field size, prestored in a memory of a particle therapy control apparatus, is selected. The charged particle beam scan path is optimally changed in the lateral directions in conformity with the collimator aperture area in the uniform scanning or in each layer in the conformal layer stacking irradiation.Type: GrantFiled: April 17, 2012Date of Patent: September 30, 2014Assignee: Hitachi, Ltd.Inventors: Shinichiro Fujitaka, Yusuke Fujii, Rintaro Fujimoto, Kazuo Hiramoto, Hiroshi Akiyama
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Patent number: 8810880Abstract: An optical scan unit (10) is configured to include a light source (11), a divergent light conversion element (12) having such positive power as to convert divergent light from the light source (11) into convergent light to form a spot on a projection plane, an optical deflector (13) deflecting a light beam from the divergent light conversion element (12) to a first scan direction and a second scan direction which is orthogonal to the first scan direction, and a deflection angle conversion element 14 (14) having such negative power as to convert a deflection angle of the light deflected by the optical deflector (13).Type: GrantFiled: June 16, 2009Date of Patent: August 19, 2014Assignee: Ricoh Company, Ltd.Inventors: Yukiko Hamano, Hiroshi Akiyama, Yoshitaka Takahashi
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Patent number: 8796648Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.Type: GrantFiled: October 17, 2013Date of Patent: August 5, 2014Assignee: Hitachi, Ltd.Inventors: Rintaro Fujimoto, Yoshihiko Nagamine, Masumi Umezawa, Toru Umekawa, Yusuke Fujii, Hiroshi Akiyama
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Publication number: 20140046113Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.Type: ApplicationFiled: October 17, 2013Publication date: February 13, 2014Applicant: HITACHI, LTD.Inventors: Rintaro FUJIMOTO, Yoshihiko NAGAMINE, Masumi UMEZAWA, Toru UMEKAWA, Yusuke FUJII, Hiroshi AKIYAMA
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Patent number: 8630069Abstract: In one embodiment, a magnetic head includes a magnetoresistance effect sensor including a free layer, a hard bias magnetic film adapted for performing magnetic domain control of the free layer by biasing a magnetization direction of the free layer towards a predefined direction that is positioned on both sides of the free layer in a track-width direction, an upper shield positioned above the hard bias magnetic film and the magnetoresistance effect sensor; and an antiferromagnetic (AFM) layer positioned above the upper shield. The upper shield includes first and second upper shield layers, and an AFM coupling layer positioned between the first upper shield layer and the second upper shield layer that is adapted for antiferromagnetically coupling the first upper shield layer and the second upper shield layer, wherein a magnetization of the first upper shield layer is antiparallel with a magnetization of the hard magnetic bias layer.Type: GrantFiled: October 4, 2012Date of Patent: January 14, 2014Assignee: HGST Netherlands B.V.Inventors: Norihiro Okawa, Kouji Okazaki, Yoshibumi Matsuda, Hiroshi Akiyama
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Patent number: 8581218Abstract: In a particle therapy treatment planning system for creating treatment plan data, the movement of a target (patient's affected area) is extracted from plural tomography images of the target, and the direction of scanning is determined by projecting the extracted movement on a scanning plane scanned by scanning magnets. Irradiation positions are arranged on straight lines parallel with the scanning direction making it possible to calculate a scanning path for causing scanning to be made mainly along the direction of movement of the target. The treatment planning system can thereby realize dose distribution with improved uniformity.Type: GrantFiled: June 29, 2011Date of Patent: November 12, 2013Assignee: Hitachi, Ltd.Inventors: Rintaro Fujimoto, Yoshihiko Nagamine, Masumi Umezawa, Toru Umekawa, Yusuke Fujii, Hiroshi Akiyama
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Patent number: 8424207Abstract: A method of making a composite component and the composite component is disclosed. The composite component can comprise multiple portions with different materials. By configuring the composite component with different materials, the weight of the composite component can be reduced while maintaining the strength and support of the composite component for a cockpit assembly. Furthermore, the method provides for an increase in the efficiency of the die casting process used to create the composite component.Type: GrantFiled: October 27, 2008Date of Patent: April 23, 2013Assignee: Honda Motor Co., Ltd.Inventors: Takashi Nakano, Hiroshi Akiyama, Brent Andrees, Brad Klein, Charles Gagliano, Ryan Joseph Phillips, Steven Behm, Kyle Pearce, Martyn Morrish, Allen Sheldon
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Patent number: 8377696Abstract: A method for accurate and precise measurement of target proteins such as food allergen proteins in the specific foods is provided. The method is a method for immunological measurement of a food allergen protein in a processed food using an antibody against the food allergen protein, comprising adding animal tropomyosin to an assay solution upon measurement.Type: GrantFiled: April 4, 2008Date of Patent: February 19, 2013Assignees: Maruha Nichiro Seafoods, Inc., Japan as Represented by Director General of National Institute of Health SciencesInventors: Kosuke Seiki, Hiroshi Oda, Hisashi Yoshioka, Hiroshi Akiyama, Tamio Maitani
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Publication number: 20120264998Abstract: A charged particle beam reduces treatment time in the uniform scanning or in the conformal layer stacking irradiation. In the uniform scanning, an optimum charged particle beam scan path for uniformly irradiating a collimator aperture area is calculated. In the conformal layer stacking irradiation, an optimum charged particle beam scan path for uniformly irradiating a multi-leaf collimator aperture area of each layer for each of the layers obtained by partitioning the target volume is calculated. Alternatively, a minimum irradiation field size that covers the multi-leaf collimator aperture area of each layer is calculated, and a scan path corresponding to the irradiation field size, prestored in a memory of a particle therapy control apparatus, is selected. The charged particle beam scan path is optimally changed in the lateral directions in conformity with the collimator aperture area in the uniform scanning or in each layer in the conformal layer stacking irradiation.Type: ApplicationFiled: April 17, 2012Publication date: October 18, 2012Applicant: HITACHI, LTD.Inventors: Shinichiro FUJITAKA, Yusuke FUJII, Rintaro FUJIMOTO, Kazuo HIRAMOTO, Hiroshi AKIYAMA
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Patent number: 8253113Abstract: A charged particle beam irradiation system includes a synchrotron which accelerates an ion beam, an irradiation apparatus for irradiating an object with the ion beam introduced from the synchrotron, detection means for measuring an amount of accumulated charge of the ion beam that orbits in the synchrotron immediately before an extraction control period in an operating cycle of the synchrotron, and beam extraction control means for controlling extraction of the ion beam based on the measurement result of the accumulated beam charge amount so that extraction of a total amount of the ion beam is to be completed with an expiration of an extraction control time, the extraction control time representing a length of the extraction control period of the synchrotron and being set in advance.Type: GrantFiled: June 24, 2009Date of Patent: August 28, 2012Assignee: Hitachi, Ltd.Inventors: Hideaki Nishiuchi, Kazuyoshi Saito, Masahiro Tadokoro, Hiroshi Akiyama, Kazuo Hiramoto
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Publication number: 20120147364Abstract: Provided are a contamination inspection method and a contamination inspection device for highly accurately detecting a defect in a wafer, a liquid crystal substrate and media or the like including patterns, for example, a semiconductor device or the like. The first aspect of the present invention is a contamination inspection device comprising: an irradiation optical system for irradiating lights on the inspection target substrate; and a spatial filter for shading diffracted lights form the inspection target substrate. Herein, the spatial filter comprises: a plurality of light shading materials; a control member for changing at least one of parameters selected from a shape, an angle and an interval with respect to the light shading material, and a control unit for controlling the control members.Type: ApplicationFiled: June 21, 2010Publication date: June 14, 2012Inventors: Masanori Gunji, Tomonari Morioka, Hiroshi Akiyama, Hideki Fukushima
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Patent number: 8147069Abstract: A lighting device, including a first light source emitting light of a first wavelength; a second light source close to the first source, emitting light of a second wavelength in almost a same direction as that of the first source; a third light source located emitting light of a third wavelength in a direction different from that of the first and second sources; a coupling optical system coupling light from the first and second sources; another coupling optical system coupling light from the third source; and a light path synthesizer synthesizing a light path of light from the first, second and third sources, wherein the light path synthesizer includes a first surface reflecting light from the first source and transmitting light from the second and third sources and a second surface unparallel with the first surface, reflecting light from the second source and transmitting light from the third source.Type: GrantFiled: July 27, 2009Date of Patent: April 3, 2012Assignee: Ricoh Company, LimitedInventors: Manabu Seo, Hiroshi Akiyama, Shigeru Oouchida, Yukiko Hamano, Goichi Akanuma