Abstract: According to one embodiment, an optical imaging apparatus includes: an image-forming optical portion, a wavelength selection portion, and an imaging portion. The image-forming optical portion forms an image of an object by means of light beams that include a first wavelength and a second wavelength different from the first wavelength. The first wavelength selection portion has wavelength selection regions. The wavelength selection regions are an anisotropic wavelength selection opening having a different distribution of the wavelength selection regions depending on a direction along a first axis and a direction along a second axis. The imaging portion is configured to simultaneously acquire an image of the first light beam and the second light beam.

Abstract: According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.

Abstract: A laser module includes: a laser diode bar including a plurality of emitters configured to emit laser light from a front surface and leak light from a rear surface; a housing including a reflecting surface configured to surround a space together with the laser diode bar and reflect, toward the space, light leaked from the rear surface, in a scattering manner; and a detector configured to detect light reflected by the reflecting surface. A laser module includes: a laser diode bar including a plurality of emitters configured to emit laser light from a front surface and leak light from a rear surface; a condenser lens on which light leaked from rear surfaces of all of the plurality of emitters impinges; and a detector configured to detect light transmitted through the condenser lens.

Abstract: According to one embodiment, an optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.

Abstract: According to an embodiment, an optical apparatus includes a lighting unit, an imaging unit, and a processor. The lighting unit emits illumination rays. The imaging unit includes: a wavelength selecting unit including first and second wavelength selection regions; and a sensor. The first wavelength selection region converts a first ray passing through the first wavelength selection region into a first selected ray. The second wavelength selection region converts a second ray passing through the second wavelength selection region into a second selected ray. The sensor can acquire color phase information indicating color phases of the first selected ray and the second selected ray. The processor estimates a ray direction of the first ray and a ray direction of the second ray based on the color phase information and a relative position of the wavelength selecting unit in the imaging unit.

Abstract: In a WBC system of the present disclosure, an LD bar array constituted by a plurality of LD bars is configured such that a main axis direction of an off-angle of at least one LD bar is reversed with respect to a main axis direction of an off-angle of the other LD bar. By doing so, even in the LD bar in which a wavelength distribution in a wafer exists, a difference between a designed lock wavelength and a gain peak wavelength can be kept within a range where an LD oscillation due to an external resonance is possible for all emitters in the LD bar, thereby an output in the WBC system can be maximized.

Abstract: An optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.

Abstract: According to one embodiment, a processing device includes an acquisition part, and a processor. The acquisition part and the processor are configured to perform a first operation. The acquisition part is configured to acquire first image data, second image data, and third image data in the first operation. The first image data includes data related to a first object member image of an object member transmitting a first light. The second image data includes data related to a second object member image of the object member transmitting a second light. The third image data includes data related to a third object member image of the object member transmitting a third light. The processor is configured to derive first derived data based on the first, second, and third image data in the first operation.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to the embodiment, an optical element assembly includes a wavelength selection portion and an imaging optical element. The wavelength selection portion includes a plurality of wavelength selection regions. The wavelength selection portion is configured to emit wavelengths different among the plurality of wavelength selection regions. The imaging optical element includes a plurality of different regions. The plurality of regions of the imaging optical element has focal lengths different from each other. Each of the regions of the imaging optical element optically faces corresponding one of the wavelength selection regions of the wavelength selection portion.

Abstract: According to the embodiment, an optical inspection method for a surface state of a subject includes acquiring and discriminating. The acquiring includes acquiring a color vector of a color corresponding to a wavelength spectrum in a color coordinate system of n dimensions (n is a natural number equal to or larger than 1), which is equal to or smaller than a number of a plurality of color channels of pixels of an image sensor, with optical imaging using a wavelength spectrum selection portion that selectively allows a plurality of wavelength spectra different from one another from a surface of the subject to pass. The discriminating includes discriminating the surface state of the subject based on a direction of the color vector in the color coordinate system.

Abstract: According to the embodiment, a processing apparatus includes an arithmetic section. The arithmetic section is configured to calculate a refractive index distribution forming a light beam path based on an estimated output calculated by inputting light beam data indicating the light beam path to an estimation model, an updated output calculated based on the light beam data and the estimated output, and an evaluation index of the estimation model calculated from a ray equation independent of a time which the light beam path follows.

Abstract: In an embodiment, a processing device relating to an inspection of an inspection object by a photography unit is provided. A processor of the processing device calculates a plurality of photography points as positions photographing the inspection object based on shape data in which a shape of a surface of the inspection object is indicated by a point group, and information relating to a position and a normal vector on the surface of the inspection object is defined by the point group. The processor executes analysis regarding a path that passes through all of the calculated photography points and minimizes a sum of a movement cost from each of the photography points to a photography point of a next movement destination, and calculates a path corresponding to an analysis result as a path for moving the photography unit.

Abstract: A surface-emitting semiconductor light-emitting device includes a semiconductor substrate; a first semiconductor layer on a front surface of the semiconductor substrate, an active layer on the first semiconductor layer; a photonic crystal layer on the active layer, a second semiconductor layer on the photonic crystal layer, a first electrode on the second semiconductor layer; and a second electrode on a back surface of the semiconductor substrate. The photonic crystal layer includes a plurality of protrusions arranged along an upper surface of the active layer. The second electrode includes a planar contact portion contacting the back surface of the semiconductor substrate, and at least one fine wire contact portion extending into a surface-emitting region in the back surface of the semiconductor substrate. The light radiated from the active layer is externally emitted from the surface-emitting region. The fine wire contact portion is arranged in the surface-emitting region with rotationally asymmetric.

Abstract: According to the embodiment, an optical inspection method includes: emitting, acquiring, and comparing. The emitting includes emitting light beams having a first wavelength and a second wavelength toward an imaging unit in accordance with light beam directions from a subject, with light beam intensities of the first wavelength and the second wavelength being in a complementary relationship. The acquiring includes acquiring each of information of a first image related to the first wavelength and information of a second image related to the second wavelength with the imaging unit. The comparing includes comparing the information of the first image and the information of the second image to extract unevenness information of the subject.

Abstract: According to an embodiment, an optical apparatus includes an illumination unit, a light-receiving unit and a processing unit. The illumination unit can illuminate an object with a plurality of pattern rays including rays with different wavelengths simultaneously. The light-receiving unit includes a pixel that can receive the rays from the object to disperse at least two of the different wavelengths included in the pattern rays. The processing unit acquires information on the object based on a result of the pixel of the light-receiving unit receiving the pattern rays with which the illumination unit illuminates the object simultaneously.

Abstract: A laser module includes: a laser diode bar including a plurality of emitters configured to emit laser light from a front surface and leak light from a rear surface; a housing including a reflecting surface configured to surround a space together with the laser diode bar and reflect, toward the space, light leaked from the rear surface, in a scattering manner; and a detector configured to detect light reflected by the reflecting surface. A laser module includes: a laser diode bar including a plurality of emitters configured to emit laser light from a front surface and leak light from a rear surface; a condenser lens on which light leaked from rear surfaces of all of the plurality of emitters impinges; and a detector configured to detect light transmitted through the condenser lens.

Abstract: According to one embodiment, an optical deflection element includes a substrate and three or more electrodes. The substrate has an incidence plane which the laser light enters and an emission plane from which the laser light exits. The three or more electrodes are arranged on the substrate at first intervals in a first direction. Electrodes allow a surface acoustic wave having a first wavelength to be generated in the substrate by applying a voltage thereto. Wiring is provided such that a voltage is selectively applied to the electrodes at an interval between at least two electrodes. The electrodes allow a surface acoustic wave having a second wavelength to be generated in the substrate by applying a voltage selectively at second intervals.

Abstract: A nozzle according to one embodiment has an inner surface and an outer surface, and is provided with a first passage through which an energy ray passes, and a second passage that is provided between the inner surface and the outer surface, and through which powder and fluid pass. The second passage includes a second open end on one end thereof in a first direction. A first surface that is one of the inner surface and the outer surface includes a first edge on one end thereof in the first direction. A second surface that is the other one of those includes a second edge on one end thereof in the first direction, and is distanced from the first edge toward the first direction. The fluid ejected from the second open end flows along the second surface, and separates at the second edge.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.