Patents by Inventor Hiroshi Sakayori

Hiroshi Sakayori has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11975775
    Abstract: A steering control device for reducing a steering load on the driver by adjusting a gain of a rear wheel steering angle with respect to a front wheel steering angle operated by the driver according to a relative relationship between the vehicle and the parking frame to enable fine steering of the own vehicle near the parking frame when the four-wheel steering vehicle is parked. The steering control device is configured to control a rear wheel steering angle by a rear wheel steering system based on a front wheel steering angle operated by a driver, and includes an arithmetic device configured to reduce an absolute value of a gain of the rear wheel steering angle with respect to the front wheel steering angle as a positional relationship between an own vehicle and a parking frame comes closer when an own vehicle shifts to a parking driving mode.
    Type: Grant
    Filed: August 22, 2019
    Date of Patent: May 7, 2024
    Assignee: HITACHI ASTEMO, LTD.
    Inventors: Go Sakayori, Hiroshi Nakano, Yoshiji Hasegawa, Tomoaki Fujibayashi, Junya Takahashi
  • Patent number: 7994771
    Abstract: A current measurement circuit includes: a constant-voltage loop circuit including an operational amplifier, and a first resistor for current detection connected to an output of the operational amplifier, the output of the operational amplifier being fed back to an inverting input terminal of the operational amplifier via the first resistor; a differential amplifier for current detection with an input of a voltage between both ends of the first resistor; and a saturation prevention and recovery circuit connected to the both ends of the first resistor for preventing saturation of the operational amplifier and/or accelerating recovery from the saturation thereof.
    Type: Grant
    Filed: April 14, 2009
    Date of Patent: August 9, 2011
    Assignee: Agilent Technologies, Inc.
    Inventor: Hiroshi Sakayori
  • Publication number: 20100085034
    Abstract: A current measurement circuit includes: a constant-voltage loop circuit including an operational amplifier, and a first resistor for current detection connected to an output of the operational amplifier, the output of the operational amplifier being fed back to an inverting input terminal of the operational amplifier via the first resistor; a differential amplifier for current detection with an input of a voltage between both ends of the first resistor; and a saturation prevention and recovery circuit connected to the both ends of the first resistor for preventing saturation of the operational amplifier and/or accelerating recovery from the saturation thereof.
    Type: Application
    Filed: April 14, 2009
    Publication date: April 8, 2010
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventor: Hiroshi Sakayori
  • Patent number: 7315170
    Abstract: In a device for measuring the properties of a device under test connected by a signal transmission path having reciprocity, a terminal on the device under test side of the signal transmission path is opened; pulse signals are transmitted to a terminal on the measuring apparatus side of the signal transmission path; the transmitted pulse signals are monitored and spectrum analyzed on the measuring apparatus; the pulse signals reflected from a terminal on the device under test side of the signal transmission path are monitored and spectrum analyzed on the measuring apparatus; and the frequency properties of propagation delay of the signal transmission path are found by referring to the coefficient obtained based on the impedance of the resistance load, the spectrum of the transmitted pulse signals, and the spectrum of the reflected pulse signals. The effect of an error is eliminated from the measuring results using the resulting frequency properties or propagation delay in actual measurement.
    Type: Grant
    Filed: March 27, 2006
    Date of Patent: January 1, 2008
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventor: Hiroshi Sakayori
  • Publication number: 20060241887
    Abstract: In a device for measuring the properties of a device under test connected by a signal transmission path having reciprocity, a terminal on the device under test side of the signal transmission path is opened; pulse signals are transmitted to a terminal on the measuring apparatus side of the signal transmission path; the transmitted pulse signals are monitored and spectrum analyzed on the measuring apparatus; the pulse signals reflected from a terminal on the device under test side of the signal transmission path are monitored and spectrum analyzed on the measuring apparatus; and the frequency properties of propagation delay of the signal transmission path are found by referring to the coefficient obtained based on the impedance of the resistance load, the spectrum of the transmitted pulse signals, and the spectrum of the reflected pulse signals. The effect of an error is eliminated from the measuring results using the resulting frequency properties or propagation delay in actual measurement.
    Type: Application
    Filed: March 27, 2006
    Publication date: October 26, 2006
    Inventor: Hiroshi Sakayori
  • Patent number: 6958612
    Abstract: An apparatus for calibrating the DC voltage level of measurement equipment supplies a calibration voltage through a DC voltage superposition means to the measurement equipment, detects the voltage level supplied to the measurement equipment, and adjusts the calibration voltage. Therefore, in the high-frequency range, the calibration apparatus can reduce the effect on the measurement accuracy of the measurement equipment and supply a highly accurate calibration voltage to the measurement equipment.
    Type: Grant
    Filed: June 5, 2003
    Date of Patent: October 25, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Hiroshi Sakayori
  • Patent number: 6864699
    Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.
    Type: Grant
    Filed: March 24, 2004
    Date of Patent: March 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Hiroshi Sakayori, Takanori Komuro
  • Publication number: 20040178816
    Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.
    Type: Application
    Filed: March 24, 2004
    Publication date: September 16, 2004
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Hiroshi Sakayori, Takanori Komuro
  • Patent number: 6737881
    Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.
    Type: Grant
    Filed: January 22, 2002
    Date of Patent: May 18, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Hiroshi Sakayori, Takanori Komuro
  • Publication number: 20030234654
    Abstract: An apparatus for calibrating the DC voltage level of measurement equipment supplies a calibration voltage through a DC voltage superposition means to the measurement equipment, detects the voltage level supplied to the measurement equipment, and adjusts the calibration voltage. Therefore, in the high-frequency range, the calibration apparatus can reduce the effect on the measurement accuracy of the measurement equipment and supply a highly accurate calibration voltage to the measurement equipment.
    Type: Application
    Filed: June 5, 2003
    Publication date: December 25, 2003
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventor: Hiroshi Sakayori
  • Publication number: 20020140451
    Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.
    Type: Application
    Filed: January 22, 2002
    Publication date: October 3, 2002
    Applicant: Agilent Technologies, Inc.
    Inventors: Hiroshi Sakayori, Takanori Komuro
  • Patent number: 5754130
    Abstract: An ultrahigh-speed analog-to-digital converter that does not use optical signals is implemented by means of simple circuit configurations. To achieve this, phase differences between a carrier and modulated signals are detected, the modulated signals having been obtained by modulating the phase of the carrier with an analog signal. Analog-to-digital conversion is then performed by applying binary weighting to the modulation factors of the phase modulations. Alternatively, different relative delays are applied stepwise in 2.sup.n -1 stages (where n is the resolution) between the carrier and the signal that has been phase modulated by the analog signal. The phase of the signals with these delays and the phase of the signal without any delay are respectively compared in 2.sup.n -1 stages. An n-bit digital signal is formed and output on the basis of the results of these comparisons.
    Type: Grant
    Filed: September 27, 1995
    Date of Patent: May 19, 1998
    Assignee: Teratec Corporation
    Inventor: Hiroshi Sakayori