Patents by Inventor Hiroshi Sasai

Hiroshi Sasai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240123106
    Abstract: Space cleaning device includes: hypochlorous acid water generator; mixing bath storing a mixture of the hypochlorous acid water and water; hypochlorous acid water supply unit; water supply unit; water level sensor detecting a water level of the water mixture; humidifying purifier micronizing the water mixture and releases the water mixture micronized into air; and control unit controlling operations of hypochlorous acid water supply unit and water supply unit. Control unit is configured, after supplying the hypochlorous acid water and the water to fill mixing bath with the water mixture, controls an operation of hypochlorous acid water supply unit to supply a predetermined amount of the hypochlorous acid water to mixing bath once in every predetermined time period, and controls an operation of water supply unit to supply the water to mixing bath based on information related to the water level of the water mixture received from water level sensor.
    Type: Application
    Filed: February 24, 2022
    Publication date: April 18, 2024
    Inventors: Yuki MIZUNO, Shinji YOSHIDA, Tomohiro HAYASHI, Takeshi KINOSHITA, Yuichi KANBARA, Mayumi SASAI, Hiroshi KOHARA
  • Patent number: 11099138
    Abstract: A phase calculation unit (12) calculates, as a first phase, a deflection angle of a first similarity vector having a first similarity and a second similarity calculated by a similarity calculation unit (11) as elements. The phase calculation unit (12) calculates, as a second phase, a deflection angle of a second similarity vector having a third similarity and a fourth similarity calculated by the similarity calculation unit (11) as elements. A period calculation unit (13) calculates a period of a pattern formed on a long body on the basis of the first phase and the second phase calculated by the phase calculation unit (12). An abnormality detection unit (14) detects an abnormality in the long body on the basis of the period calculated by the period calculation unit (13).
    Type: Grant
    Filed: February 6, 2017
    Date of Patent: August 24, 2021
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Junji Hori, Koji Sakata, Takuya Hashiguchi, Keita Mochizuki, Kiyotaka Watanabe, Hiroshi Sasai
  • Publication number: 20190345648
    Abstract: A phase calculation unit (12) calculates, as a first phase, a deflection angle of a first similarity vector having a first similarity and a second similarity calculated by a similarity calculation unit (11) as elements. The phase calculation unit (12) calculates, as a second phase, a deflection angle of a second similarity vector having a third similarity and a fourth similarity calculated by the similarity calculation unit (11) as elements. A period calculation unit (13) calculates a period of a pattern formed on a long body on the basis of the first phase and the second phase calculated by the phase calculation unit (12). An abnormality detection unit (14) detects an abnormality in the long body on the basis of the period calculated by the period calculation unit (13).
    Type: Application
    Filed: February 6, 2017
    Publication date: November 14, 2019
    Applicant: Mitsubishi Electric Corporation
    Inventors: Junji HORI, Koji SAKATA, Takuya HASHIGUCHI, Keita MOCHIZUKI, Kiyotaka WATANABE, Hiroshi SASAI
  • Patent number: 8536861
    Abstract: A wire rope flaw detector includes a magnetizer having a pair of exciting magnets disposed on a back yoke such that polarities thereof are opposite to each other, and forming a main magnetic path in a predetermined segment in an axial direction of a wire rope; and a leakage magnetic flux detection section disposed in the predetermined segment in the axial direction, and detecting leakage magnetic flux generated from a damaged portion of the wire rope. Each of the exciting magnets are formed so as to have a cross-section of a shape that embraces the wire rope when each exciting magnet is cut along a plane perpendicular to the axial direction of the wire rope, and has magnetic orientation, on the cross-section of the exciting magnet, oriented from at least two directions toward the wire rope.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: September 17, 2013
    Assignee: Mitsubishi Electric Corporation
    Inventors: Kimiyasu Furusawa, Taizo Iwami, Takashi Yoshioka, Hiroshi Sasai
  • Patent number: 8476898
    Abstract: In order to examine abnormality in shape of an outer circumference of a wire rope, the rope tester device includes a comb-shaped detection plate having a curved test edge portion extending along at least one portion of an outer circumference of a substantially circular sectional configuration of the wire rope and a testing recessed portion for receiving the wire rope in the vicinity of or in contact with the test edge portion, and a support device for rotatably supporting the detection plate in the vicinity of or in contact with the wire rope for permitting the rotation of the detection plate when the detection plate receives a force from an abnormal portion of the wire rope to relieve the force. A test string is disposed in an opening of the testing recessed portion for testing a surface that is not in the vicinity of or in contact with the test edge portion.
    Type: Grant
    Filed: November 13, 2007
    Date of Patent: July 2, 2013
    Assignee: Mitsubishi Electric Corporation
    Inventors: Koichiro Nishiyori, Hiroshi Sasai, Takashi Yoshioka
  • Patent number: 8390281
    Abstract: A magnetic flux generated by current excitation is allowed to pass through a part or an entire of a magnetic path of a leakage magnetic flux. A magnetic flux content due to the current excitation is temporally changed to change a leakage magnetic flux content interlinked with a detection coil so that an induced voltage is generated in the detection coil. Consequently, damage can be detected even in a case where there is no relative speed between a wire rope and a wire rope flaw detector. Further, a configuration of the magnetic path and the number of ampere turns of an exciting coil are set to be appropriate to prevent the magnetic flux generated by the current excitation from passing through the detection coil or to allow the magnetic fluxes offset each other. Thus, noise superimposition on the detection coil due to the current excitation can be prevented.
    Type: Grant
    Filed: April 14, 2008
    Date of Patent: March 5, 2013
    Assignee: Mitsubishi Electric Corporation
    Inventors: Takashi Yoshioka, Hiroshi Sasai, Koichiro Nishiyori
  • Patent number: 8164329
    Abstract: A wire rope flaw detector comprises a back yoke and excitation permanent magnets, which form a main magnetic path in a predetermined section of a wire rope in the axial direction; a magnetic path member arranged in the predetermined section to be magnetically insulated from the back yoke and the permanent magnets and making the leakage flux generated from a damaged part of wire rope detour to the outside of the wire rope; and a detection coil wound around the magnetic path member for detecting leakage flux. The amount of leakage flux can be increased by providing the magnetic path member and since the windable area of the detection coil is increased, the number of turns of detection coil can be increased.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: April 24, 2012
    Assignee: Mitsubishi Electric Corporation
    Inventors: Takashi Yoshioka, Hiroshi Sasai, Yoshinori Miyamoto, Kimiyasu Furusawa, Yukinobu Karata
  • Patent number: 7982458
    Abstract: There is obtained a wire-rope flaw detector capable of realizing a high signal-to-noise ratio even in the case where only one detection coil is disposed.
    Type: Grant
    Filed: April 10, 2009
    Date of Patent: July 19, 2011
    Assignee: Mitsubishi Electric Corporation
    Inventors: Takashi Yoshioka, Hiroshi Sasai, Yoshinori Miyamoto
  • Publication number: 20110006762
    Abstract: A magnetic flux generated by current excitation is allowed to pass through a part or an entire of a magnetic path of a leakage magnetic flux. A magnetic flux content due to the current excitation is temporally changed to change a leakage magnetic flux content interlinked with a detection coil so that an induced voltage is generated in the detection coil. Consequently, damage can be detected even in a case where there is no relative speed between a wire rope and a wire rope flaw detector. Further, a configuration of the magnetic path and the number of ampere turns of an exciting coil are set to be appropriate to prevent the magnetic flux generated by the current excitation from passing through the detection coil or to allow the magnetic fluxes offset each other. Thus, noise superimposition on the detection coil due to the current excitation can be prevented.
    Type: Application
    Filed: April 14, 2008
    Publication date: January 13, 2011
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Takashi Yoshioka, Hiroshi Sasai, Koichiro Nishiyori
  • Publication number: 20100259253
    Abstract: In order to examine abnormality in shape of an outer circumference of a wire rope, the rope tester device includes a comb-shaped detection plate having a curved test edge portion extending along at least one portion of an outer circumference of a substantially circular sectional configuration of the wire rope and a testing recessed portion for receiving the wire rope in the vicinity of or in contact with the test edge portion, and a support device for rotatably supporting the detection plate in the vicinity of or in contact with the wire rope for permitting the rotation of the detection plate when the detection plate receives a force from an abnormal portion of the wire rope to relieve the force. A test string is disposed in an opening of the testing recessed portion for testing a surface that is not in the vicinity of or in contact with the test edge portion.
    Type: Application
    Filed: November 13, 2007
    Publication date: October 14, 2010
    Applicant: Mitsubishi Electric Corporation
    Inventors: Koichiro Nishiyori, Hiroshi Sasai, Takashi Yoshioka
  • Publication number: 20100244821
    Abstract: In order to reduce noise due to the rope vibration in the rope tester, a mounting shaft extending perpendicular to the running direction of the wire rope is positioned in front of the rope tester, and a hook-shaped engagement piece, which extends from the rope tester and is slidable or rotatable into an opened or closed position, is brought into engagement with the mounting shaft so that the rope tester is held movable in the perpendicular direction relative to the running direction of the wire rope.
    Type: Application
    Filed: November 13, 2007
    Publication date: September 30, 2010
    Applicant: Mitsubishi Electric Corporation
    Inventors: Koichiro Nishiyori, Hiroshi Sasai, Takashi Yoshioka
  • Publication number: 20100182000
    Abstract: There is obtained a wire-rope flaw detector capable of realizing a high signal-to-noise ratio even in the case where only one detection coil is disposed.
    Type: Application
    Filed: April 10, 2009
    Publication date: July 22, 2010
    Applicant: Mitsubishi Electric Corporation
    Inventors: Takashi YOSHIOKA, Hiroshi SASAI, Yoshinori MIYAMOTO
  • Publication number: 20100102807
    Abstract: A wire rope flaw detector comprises a back yoke and excitation permanent magnets, which form a main magnetic path in a predetermined section of a wire rope in the axial direction; a magnetic path member arranged in the predetermined section to be magnetically insulated from the back yoke and the permanent magnets and making the leakage flux generated from a damaged part of wire rope detour to the outside of the wire rope; and a detection coil wound around the magnetic path member for detecting leakage flux. The amount of leakage flux can be increased by providing the magnetic path member and since the windable area of the detection coil is increased, the number of turns of detection coil can be increased.
    Type: Application
    Filed: January 31, 2007
    Publication date: April 29, 2010
    Inventors: Takashi Yoshioka, Hiroshi Sasai, Yoshinori Miyamoto, Kimiyasu Furusawa, Yukinobu Karata
  • Publication number: 20100019762
    Abstract: A wire rope flaw detector includes a magnetizer having a pair of exciting magnets disposed on a back yoke such that polarities thereof are opposite to each other, and forming a main magnetic path in a predetermined segment in an axial direction of a wire rope; and a leakage magnetic flux detection section disposed in the predetermined segment in the axial direction, and detecting leakage magnetic flux generated from a damaged portion of the wire rope. Each of the exciting magnets are formed so as to have a cross-section of a shape that embraces the wire rope when each exciting magnet is cut along a plane perpendicular to the axial direction of the wire rope, and has magnetic orientation, on the cross-section of the exciting magnet, oriented from at least two directions toward the wire rope.
    Type: Application
    Filed: January 31, 2007
    Publication date: January 28, 2010
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Kimiyasu Furusawa, Taizo Iwami, Takashi Yoshioka, Hiroshi Sasai
  • Patent number: 6926558
    Abstract: A first terminal block having first terminals to be in contact with terminals of a plug is incorporated in a housing. The first terminals are exposed to an internal space portion 1e of the housing, while the rear ends of the first terminals project at the rear of the block. A second terminal block has second terminals to be connected to a motherboard the modular jack should be attached to. Electronic parts a are mounted on an internal board. The internal board includes through-hole-like terminals or notch-like terminals to which the first and second terminals and should be soldered. Winding terminals of winding parts are inserted and soldered to through holes of the internal board.
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: August 9, 2005
    Assignee: TDK Corporation
    Inventors: Hiroshi Sasai, Mutsumi Kinoshita, Mitsutaka Yasuda, Tadashi Fukuda
  • Publication number: 20040110422
    Abstract: A first terminal block 3 having first terminals 2 to be in contact with terminals of a plug is incorporated in a housing 1. The first terminals 2 are exposed to an internal space portion 1e of the housing 1, while the rear ends of the first terminals 2 project at the rear of the block 3. A second terminal block 5 has second terminals 4 to be connected to a motherboard the modular jack should be attached to. Electronic parts 7a and 7b are mounted on an internal board 6. The internal board 6 includes through-hole-like terminals 6a and 6b or notch-like terminals to which the first and second terminals 2 and 4 should be soldered. Winding terminals 8 of winding parts are inserted and soldered to through holes 6c and 6d of the internal board 6.
    Type: Application
    Filed: December 5, 2003
    Publication date: June 10, 2004
    Applicant: TDK CORPORATION
    Inventors: Hiroshi Sasai, Mutsumi Kinoshita, Mitsutaka Yasuda, Tadashi Fukuda
  • Patent number: 6690024
    Abstract: A laser inspection apparatus has a light source 13 for outputting laser beam, application means 5, 33, 34 for irradiating the laser beam 7 output from the light source 13 to any desired position of a detected body 21, first detection means 2 for detecting fluorescence 8 generated from the detected body 21 to which the laser beam 7 is applied, and second detection means 3 for detecting reflected light 8 scattered on a surface of the detected body 21 to which the laser beam 7 is applied.
    Type: Grant
    Filed: July 18, 2000
    Date of Patent: February 10, 2004
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Koji Funaoka, Masahiko Sakamoto, Shozui Takeno, Hiroshi Sasai
  • Patent number: 6215386
    Abstract: A combined-type coil device provided with a core, a first coil and a second coil, where the core is provided with at least four through holes and the through holes are roughly parallel to one another. When a combination of two through holes constitutes a first through holes pair and the combination of the remaining two through holes constitutes a second through holes pair, a center line passing through the centers of the holes in the first through hole pair and a center line passing through the centers of the holes in the second through hole pair extend almost perpendicular to each other. The first coil passes through the first through hole pair, whereas the second coil passes through the second through hole pair.
    Type: Grant
    Filed: October 26, 1999
    Date of Patent: April 10, 2001
    Assignee: TDK Corporation
    Inventors: Katsuhiro Gokita, Mutsumi Kinoshita, Hiroshi Sasai, Kazuhiko Umeda, Tadashi Fukuda, Toshio Chamura
  • Patent number: 5590672
    Abstract: A semiconductor cleaning apparatus includes a cassette loader/unloader for moving a cassette; a product loader/unloader for loading a wafer into and unloading a wafer from a cassette; a cleaner for cleaning a wafer; a water cleaner for cleaning with water a wafer that has been cleaned in the cleaner; a dryer for drying the wafer that has been cleaned with water in the water cleaner; and a conveyance having a wafer grasping hand for directly holding a wafer unloaded from a cassette and sequentially conveying the wafer held by the wafer hand to the cleaner, the water cleaner, and the dryer.
    Type: Grant
    Filed: July 17, 1995
    Date of Patent: January 7, 1997
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Masashi Ohmori, Hiroshi Tanaka, Akira Nishimoto, Hiroshi Sasai, Naohiko Fujino, Satoru Kotoh
  • Patent number: 5568821
    Abstract: A semiconductor cleaning apparatus includes a cassette loader/unloader for moving a cassette; a product loader/unloader for loading a wafer into and unloading a wafer from a cassette; a cleaner for cleaning a wafer; a water cleaner for cleaning with water a wafer that has been cleaned in the cleaner; a dryer for drying the wafer that has been cleaned with water in the water cleaner; and a conveyance having a wafer grasping hand for directly holding a wafer unloaded from a cassette and sequentially conveying the wafer held by the wafer hand to the cleaner, the water cleaner, and the dryer.
    Type: Grant
    Filed: July 17, 1995
    Date of Patent: October 29, 1996
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Masashi Ohmori, Hiroshi Tanaka, Akira Nishimoto, Hiroshi Sasai, Naohiko Fujino, Satoru Kotoh