Patents by Inventor Hiroya Ota

Hiroya Ota has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11949550
    Abstract: A relay device that performs reset processing in relation to wired communication with a first device in response to a change in a communication rate of the wired communication with the first device; and in response to performing the reset processing, start control to transmit a predetermined message to a second device even though there is no transmission from the first device, the predetermined message being expected to be transmitted from the first device to the second device.
    Type: Grant
    Filed: September 13, 2022
    Date of Patent: April 2, 2024
    Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Hiroya Matsumoto, Yoshiroh Hirata, Hiroshi Ota
  • Patent number: 8907278
    Abstract: Provided is a charged particle beam applied apparatus for observing a sample, provided with: a beam-forming section that forms a plurality of charged particle beams on a sample; an energy control unit that controls the incident energy of the plurality of charged particle beams that are irradiated onto the sample; a beam current control unit that controls the beam current of the plurality of charged particle beams that are irradiated onto the sample; and a beam arrangement control unit that controls the arrangement in which the plurality of charged particle beams is irradiated onto the sample. The beam-forming section includes a beam splitting electrode, a lens array upper electrode, a lens array middle electrode, a lens array lower electrode and a movable stage, and functions as the beam current control unit or the beam arrangement control unit through selection, by the movable stage, of a plurality of aperture pattern sets.
    Type: Grant
    Filed: December 2, 2011
    Date of Patent: December 9, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Momoyo Enyama, Hiroya Ota, Taku Ninomiya, Mari Nozoe
  • Publication number: 20130299697
    Abstract: Provided is a charged particle beam applied apparatus for observing a sample, provided with: a beam-forming section that forms a plurality of charged particle beams on a sample; an energy control unit that controls the incident energy of the plurality of charged particle beams that are irradiated onto the sample; a beam current control unit that controls the beam current of the plurality of charged particle beams that are irradiated onto the sample; and a beam arrangement control unit that controls the arrangement in which the plurality of charged particle beams is irradiated onto the sample. The beam-forming section includes a beam splitting electrode, a lens array upper electrode, a lens array middle electrode, a lens array lower electrode and a movable stage, and functions as the beam current control unit or the beam arrangement control unit through selection, by the movable stage, of a plurality of aperture pattern sets.
    Type: Application
    Filed: December 2, 2011
    Publication date: November 14, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Momoyo Enyama, Hiroya Ota, Taku Ninomiya, Mari Nozoe