Patents by Inventor Hiroyuki Hiraoka

Hiroyuki Hiraoka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7511206
    Abstract: The present invention provides carbon nanotubes perpendicularly and densely deposited over a wide area of a substrate. The carbon nanotubes are manufactured by supplying alternating-current power at a specific frequency between an anode and a cathode disposed in a reactor, and causing plasma to be generated between the anode and the cathode by introducing mixed gas containing an aliphatic hydrocarbon having 1-5 carbon atoms and hydrogen or mixed gas containing an aromatic hydrocarbon and hydrogen. The substrate is disposed between the anode and the cathode and held at a distance two times or less of the mean free path of a hydrocarbon cation from the anode.
    Type: Grant
    Filed: November 7, 2005
    Date of Patent: March 31, 2009
    Assignee: Futaba Corporation
    Inventors: Hiroyuki Hiraoka, Yosuke Shiratori, Masahide Yamamoto, Shigeo Itoh, Kenji Nawamaki
  • Publication number: 20060054491
    Abstract: The present invention provides carbon nanotubes perpendicularly and densely deposited over a wide area of a substrate. The carbon nanotubes are manufactured by supplying alternating-current power at a specific frequency between an anode and a cathode disposed in a reactor, and causing plasma to be generated between the anode and the cathode by introducing mixed gas containing an aliphatic hydrocarbon having 1-5 carbon atoms and hydrogen or mixed gas containing an aromatic hydrocarbon and hydrogen. The substrate is disposed between the anode and the cathode and held at a distance two times or less of the mean free path of a hydrocarbon cation from the anode.
    Type: Application
    Filed: November 7, 2005
    Publication date: March 16, 2006
    Applicants: International Center for Materials Research, Futaba Corporation
    Inventors: Hiroyuki Hiraoka, Yosuke Shiratori, Masahide Yamamoto, Shigeo Itoh, Kenji Nawamaki
  • Publication number: 20030108478
    Abstract: The present invention provides carbon nanotubes perpendicularly and densely deposited over a wide area of a substrate. The carbon nanotubes are manufactured by supplying alternating-current power at a specific frequency between an anode and a cathode disposed in a reactor, and causing plasma to be generated between the anode and the cathode by introducing mixed gas containing an aliphatic hydrocarbon having 1-5 carbon atoms and hydrogen or mixed gas containing an aromatic hydrocarbon and hydrogen. The substrate is disposed between the anode and the cathode and held at a distance two times or less of the mean free path of a hydrocarbon cation from the anode.
    Type: Application
    Filed: September 24, 2002
    Publication date: June 12, 2003
    Applicants: International Center for Materials Research, Futaba Corporation
    Inventors: Hiroyuki Hiraoka, Yosuke Shiratori, Masahide Yamamoto, Shigeo Itoh, Kenji Nawamaki
  • Patent number: 6312769
    Abstract: A method of producing a liquid crystal alignment layer comprising exposing an organic film to polarized pulse laser beam to align molecules in a surface portion of the organic film. There is provided a liquid crystal alignment layer composed of a polyamide film having aligned molecules in a surface portion.
    Type: Grant
    Filed: April 29, 1998
    Date of Patent: November 6, 2001
    Assignee: JSR Corporation
    Inventors: Hiroyuki Hiraoka, Yasumasa Takeuchi, Shin-ichi Kimura, Yasuo Matsuki, Toshihiro Ogawa, Masayuki Kimura
  • Patent number: 5684065
    Abstract: To provide a fluorine-containing resin molded article surface-modified by irradiating, onto a surface thereof, a laser beam having a wavelength of 150 to 370 nm through a basic solution, preferably an aqueous basic solution. The surface-modified fluorine-containing resin molded article is excellent in adhesion to not only organic materials but also metals.
    Type: Grant
    Filed: December 19, 1996
    Date of Patent: November 4, 1997
    Assignee: Daikin Industries, Ltd.
    Inventors: Hiroyuki Hiraoka, Shinji Tamaru, Osamu Tanaka
  • Patent number: 5368681
    Abstract: A method is disclosed for the deposition of crystalline diamond on a substrate such as a silicon wafer. A polymer (for example poly(methylmethacrylate)) is provided as a target for laser ablation using for example an ArF excimer laser or an Nd-Yag laser. The laser ablation is performed in the presence of a reactive gas such as oxygen or hydrogen. The substrate is heated to a temperature of between 450 and 700 degrees celsius.
    Type: Grant
    Filed: June 9, 1993
    Date of Patent: November 29, 1994
    Assignees: Hong Kong University of Science, Hong Kong University of Science and Technology, R and D Corporation Limited
    Inventors: Hiroyuki Hiraoka, Stefan A. Latsch, Rong-Fu Xiao
  • Patent number: 5270151
    Abstract: Reaction products of organosilane compounds or polydiphenylsilazane compounds and a novolac resin having phenolic groups can be used as O.sub.2 RIE barrier materials in semiconductor etching processes. These materials have low O.sub.2 etch rates and can be spun on to form crack-free thick layers. Particular RIE barrier materials contemplated have the general formula: ##STR1## wherein A is a methyl or phenyl group.
    Type: Grant
    Filed: March 17, 1992
    Date of Patent: December 14, 1993
    Assignee: International Business Machines Corporation
    Inventors: Peter A. Agostino, Ajay P. Giri, Hiroyuki Hiraoka, Carlton G. Willson, Daniel J. Dawson
  • Patent number: 4999280
    Abstract: Photoresist images are made resistant to reactive ion etching by treating them with a poly(dimethylsilazane).
    Type: Grant
    Filed: March 17, 1989
    Date of Patent: March 12, 1991
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka
  • Patent number: 4875124
    Abstract: A thin film magnetic head is provided in which the electrical insulation surrounding the conductive coil comprises a photosensitive resin which has been crosslinked by a thermally activated crosslinking agent or promotor. The addition of the thermally activated crosslinking agent or promotor greatly reduces both the cure temperature and cure time and results in enhanced dimensional stability without any deleterious effects.
    Type: Grant
    Filed: April 18, 1988
    Date of Patent: October 17, 1989
    Assignee: International Business Machines Corporation
    Inventors: Heidi L. Dickstein, Hiroyuki Hiraoka, James H. Lee
  • Patent number: 4770974
    Abstract: A resist composition is made resistant to reactive ion etching by admixing therewith a poly(dialkylsilazane).
    Type: Grant
    Filed: July 27, 1987
    Date of Patent: September 13, 1988
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka
  • Patent number: 4690838
    Abstract: The reactive ion etching and thermal flow resistance of a resist image is enhanced by contacting the resist image with an alkyl metal compound of magnesium or aluminum.
    Type: Grant
    Filed: August 25, 1986
    Date of Patent: September 1, 1987
    Assignee: International Business Machines Corporation
    Inventors: Hiroyuki Hiraoka, Jeffrey W. Labadie, James H. Lee, Scott A. MacDonald, Carlton G. Willson
  • Patent number: 4507331
    Abstract: A dry process for forming a positive tone micro pattern by coating a substrate with an organic polymer film then with a film of an oxygen etch barrier, selected from the group consisting of films of organometallic, including organosilicon compounds and metals, exposing the etch barrier film to a low energy proton beam in a patternwise manner, and developing the pattern by means of oxygen reactive ion etching.
    Type: Grant
    Filed: December 12, 1983
    Date of Patent: March 26, 1985
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka
  • Patent number: 4482427
    Abstract: A dry process for forming via holes with sloped walls by oxygen reactive ion etching through a perforated mask.
    Type: Grant
    Filed: May 21, 1984
    Date of Patent: November 13, 1984
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka
  • Patent number: 4464460
    Abstract: A process for making an image oxygen-reactive ion etch barrier using a polysilane that is resistant to resistive ion etching and is also a positive acting resist.
    Type: Grant
    Filed: June 28, 1983
    Date of Patent: August 7, 1984
    Assignee: International Business Machines Corporation
    Inventors: Hiroyuki Hiraoka, Donald C. Hofer, Robert D. Miller, Lester A. Pederson, Carlton G. Willson
  • Patent number: 4460436
    Abstract: A patterned polymer film is deposited on a substrate by pattern-wise exposing a monomer vapor to a beam of ions and dry developing by etching with oxygen plasma.
    Type: Grant
    Filed: September 6, 1983
    Date of Patent: July 17, 1984
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka
  • Patent number: 4452665
    Abstract: A polymeric halocarbon is used as an etch barrier for plasma etching in a process to make high resolution, high aspect ratio polymer patterns.
    Type: Grant
    Filed: October 12, 1983
    Date of Patent: June 5, 1984
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka
  • Patent number: 4389482
    Abstract: A photoresist that has strong resistance to reactive ion etching, high photosensitivity to mid- and deep UV-light, and high resolution capability is formed by using as the resist material a copolymer of methacrylonitrile and methacrylic acid, and by baking the resist before the exposure to light for improved photosensitivity, and after exposure to light, development, and prior to treatment with reactive ion etching.
    Type: Grant
    Filed: December 14, 1981
    Date of Patent: June 21, 1983
    Assignee: International Business Machines Corporation
    Inventors: Joachim Bargon, Hiroyuki Hiraoka, Lawrence W. Welsh, Jr.
  • Patent number: 4379826
    Abstract: The sensitivity of a positive working electron beam resist is increased by using as the resist material a resin which is a condensation product of formaldehyde with a phenol or a cresol having a chloro substituent ortho to the hydroxyl group on its aromatic ring.
    Type: Grant
    Filed: August 31, 1981
    Date of Patent: April 12, 1983
    Assignee: International Business Machines Corporation
    Inventors: James Economy, Roy J. Gritter, Hiroyuki Hiraoka
  • Patent number: 4119688
    Abstract: An electro-lithography method suitable for forming a high resolution pattern in an electron sensitive resist material is disclosed. This technology permits the inexpensive high resolution reproduction of masks for use in integrated circuits and magnetic bubbles. The method involves the application of a pulsed, electric field to two parallel electrodes having an electron beam resist layer positioned on one of the electrodes and a mask positioned between the second electrode and the resist layer. The mask forms a gap having a thickness of 10.sup.-4 m to 10.sup.-5 m with the resist layer.
    Type: Grant
    Filed: June 17, 1977
    Date of Patent: October 10, 1978
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka
  • Patent number: 4004043
    Abstract: Positive resists are made using polymers and copolymers of methacrylic acid, methacrylic anhydride, methyl methacrylate, methacrylimide, and N-alkyl-methacrylimides which have been nitrated in up to about 10% of the monomer units on the methyl groups branching off the polymer chain. Inclusion of the nitro groups results in an increase of over an order of magnitude in the speed of development of images when the polymers are used as positive resists.
    Type: Grant
    Filed: September 26, 1975
    Date of Patent: January 18, 1977
    Assignee: International Business Machines Corporation
    Inventor: Hiroyuki Hiraoka