Abstract: An image forming method includes exposing a surface of an image bearer with light according to an image pattern including an image portion and a non-image portion, the image portion constituted of a plurality of pixels, to form an electrostatic latent image correspondent to the image pattern, comparing the image pattern adjacent to each of the pixels with a comparison pattern constituted of a plurality of pixels to specify at least a group of pixels existing at a boundary with respect to the non-image portion as a group of non-exposure pixels among the pixels constituting the image portion, and executing determination of specifying at least a group of pixels adjacent to the group of non-exposure pixels as a group of high power exposure pixels exposed with light of a higher light power than a predetermined light power required for exposing the image portion among the pixels constituting the image portion.

Abstract: An image forming method exposes a surface of an image bearer with light according to an image pattern including an image portion to form an electrostatic latent image, and includes: setting, among pixels constituting the image portion, at least a group of pixels existing at a boundary with respect to a non-image portion as a non-exposure pixel group, and at least a group of pixels existing at a boundary with respect to the non-exposure pixel group as a high power exposure pixel group; specifying, among the pixels constituting the image portion, a predetermined pixel as a target pixel, and a group of pixels existing at a boundary with respect to the non-image portion close to the target pixel as a boundary pixel group; and specifying a light power value of the target pixel based on image identification information acquired from the pixels constituting the image portion.

Abstract: In an image forming method for forming an electrostatic latent image corresponding to an image pattern including an image portion and a non-image portion by exposing a surface of an image bearer with light based on the image pattern, the image portion has a plurality of pixels, the pixels constituting the image portion but not adjacent to at least a non-image portion are exposed with a first optical output that is higher than a given optical output obtained when the entire pixels corresponding to the image portion are exposed over a given time period.

Abstract: An electrostatic latent image forming method for forming, on an image carrier, an electrostatic latent image that has a pattern where there are an irradiated area and a not-irradiated area in a mixed manner, the electrostatic latent image forming method comprises; adjusting an exposure condition of an irradiated area that is included in the irradiated area and is adjacent to the not-irradiated area so that an electric field intensity of an electrostatic latent image that corresponds to the not-irradiated area is increased so as to prevent adhesion of a developer, and irradiating the image carrier with light under the adjusted exposure condition.

Abstract: An image forming method includes exposing a surface of an image bearer with light according to an image pattern including an image portion and a non-image portion, the image portion constituted of a plurality of pixels, to form an electrostatic latent image correspondent to the image pattern, comparing the image pattern adjacent to each of the pixels with a comparison pattern constituted of a plurality of pixels to specify at least a group of pixels existing at a boundary with respect to the non-image portion as a group of non-exposure pixels among the pixels constituting the image portion, and executing determination of specifying at least a group of pixels adjacent to the group of non-exposure pixels as a group of high power exposure pixels exposed with light of a higher light power than a predetermined light power required for exposing the image portion among the pixels constituting the image portion.

Abstract: An image forming method includes: exposing a surface of an image carrier with a light based on an image pattern including an image portion and a non-image portion to form an electrostatic latent image corresponding to the image pattern. The image portion is made up of a plurality of pixels. Some of the pixels that make up the image portion are exposed with light of a first output value that is higher than a prescribed optical output value when the entire pixels corresponding to the image portion are exposed over a prescribed time period.

Abstract: An electrostatic latent image forming method for forming, on an image carrier, an electrostatic latent image that has a pattern where there are an irradiated area and a not-irradiated area in a mixed manner, the electrostatic latent image forming method comprises; adjusting an exposure condition of an irradiated area that is included in the irradiated area and is adjacent to the not-irradiated area so that an electric field intensity of an electrostatic latent image that corresponds to the not-irradiated area is increased so as to prevent adhesion of a developer, and irradiating the image carrier with light under the adjusted exposure condition.

Abstract: An image forming apparatus forms an image by exposing an image bearer on the basis of image data including at least one predetermined pattern. The image forming apparatus includes a processing device that sets an exposure amount of a plurality of exposure pixels. The predetermined pattern is constituted by the plurality of exposure pixels, and a peripheral region of the predetermined pattern in the image data is constituted by a plurality of non-exposure pixels. The processing device sets an exposure amount of an exposure pixel in a specific region that is adjacent to a boundary between the predetermined pattern and the peripheral region and is constituted by at least one exposure pixel in the predetermined pattern, and an exposure amount of an exposure pixel in a region other than the specific region in the predetermined pattern to values different from each other.

Abstract: An image forming method forms an electrostatic latent image corresponding to an image pattern including an image portion and a non-image portion by exposing a surface of an image bearer with light according to the image pattern. The image portion includes a plurality of pixels. Among the pixels constituting the image portion, at least a group of pixels existing at a boundary with respect to the non-image portion is set as a non-exposure pixel group. Among the pixels constituting the image portion, at least a group of pixels existing at a boundary with respect to the non-exposure pixel group is set as a high power exposure pixel group where exposure is performed with light of a higher light power value than a predetermined light power value required for exposing the image portion.

Abstract: An electrostatic latent image forming method for forming, on an image carrier, an electrostatic latent image that has a pattern where there are an irradiated area and a not-irradiated area in a mixed manner, the electrostatic latent image forming method comprises; adjusting an exposure condition of an irradiated area that is included in the irradiated area and is adjacent to the not-irradiated area so that an electric field intensity of an electrostatic latent image that corresponds to the not-irradiated area is increased so as to prevent adhesion of a developer, and irradiating the image carrier with light under the adjusted exposure condition.

Abstract: A latent-image measuring device that measures the state of a photoconductor. The latent-image measuring device emits a charged-particle beam to the photoconductor to detects a charged-particle signal obtained through the emission of the charged-particle beam. The latent-image measuring device then exposes the photoconductor a plurality of times to form electrostatic latent images on the photoconductor, and measures an amount of change in latent-image depth while changing a time interval between a plurality of exposures.

Abstract: In an image forming method for forming an electrostatic latent image corresponding to an image pattern including an image portion and a non-image portion by exposing a surface of an image bearer with light based on the image pattern, the image portion has a plurality of pixels, the pixels constituting the image portion but not adjacent to at least a non-image portion are exposed with a first optical output that is higher than a given optical output obtained when the entire pixels corresponding to the image portion are exposed over a given time period.

Abstract: A method of measuring a total amount of latent image charge includes: scanning a sample with a charged particle beam, the sample having a charge distribution on a surface of the sample, the charge distribution being caused by forming an electrostatic latent image by exposure; measuring a state of a surface charge distribution on the sample based on a detection signal obtained by the scanning; obtaining an electric potential at a potential saddle point, the potential saddle point being formed by the surface charge distribution of the sample; obtaining an electrostatic latent image area, the electrostatic latent image being formed by the surface charge distribution of the sample; and performing a calculation using the electric potential at the potential saddle point and the electrostatic latent image area to measure a total amount of electric charge of the electrostatic latent image.

Abstract: An image forming method includes: exposing a surface of an image carrier with a light based on an image pattern including an image portion and a non-image portion to form an electrostatic latent image corresponding to the image pattern. The image portion is made up of a plurality of pixels. Some of the pixels that make up the image portion are exposed with light of a first output value that is higher than a prescribed optical output value when the entire pixels corresponding to the image portion are exposed over a prescribed time period.

Abstract: A surface charge measuring distribution method includes the steps of irradiating a sample with a charged particle beam and charging a sample surface in a spot-like manner, irradiating the charged sample with the charged particle beam to measure a potential at a potential saddle point formed above the sample, selecting one of preset multiple structure models and a tentative space charge distribution associated with the selected structure model, calculating a space potential at the potential saddle point by electromagnetic field analysis using the selected structure model and tentative space charge distribution, comparing the calculated space potential and measured value to determine the tentative space charge distribution as a space charge distribution of the sample when an error between the space potential and the measured value is within a predetermined range, and calculating a surface charge distribution of the sample by electromagnetic field analysis based on the determined space charge distribution.

Abstract: An electrostatic latent image forming method for forming, on an image carrier, an electrostatic latent image that has a pattern where there are an irradiated area and a not-irradiated area in a mixed manner, the electrostatic latent image forming method comprises; adjusting an exposure condition of an irradiated area that is included in the irradiated area and is adjacent to the not-irradiated area so that an electric field intensity of an electrostatic latent image that corresponds to the not-irradiated area is increased so as to prevent adhesion of a developer, and irradiating the image carrier with light under the adjusted exposure condition.

Abstract: A method of measuring a total amount of latent image charge includes: scanning a sample with a charged particle beam, the sample having a charge distribution on a surface of the sample, the charge distribution being caused by forming an electrostatic latent image by exposure; measuring a state of a surface charge distribution on the sample based on a detection signal obtained by the scanning; obtaining an electric potential at a potential saddle point, the potential saddle point being formed by the surface charge distribution of the sample; obtaining an electrostatic latent image area, the electrostatic latent image being formed by the surface charge distribution of the sample; and performing a calculation using the electric potential at the potential saddle point and the electrostatic latent image area to measure a total amount of electric charge of the electrostatic latent image.

Abstract: An optical scanning apparatus includes an optical deflector that deflects a light beam at a substantially constant angular velocity and an optical system that condenses the deflected light beam onto a to-be-scanned surface thereby performing optical scanning of the to-be-scanned surface. The to-be-scanned surface is a surface of a latent image carrier having a charge generation layer that generates carriers and a charge transport layer. A driving unit drives the optical deflector at a scanning frequency at which exposure is attained in a state where the carriers generated at the charge generation layer of the latent image carrier substantially stay still.

Abstract: A light scanning apparatus is provided in which a light source is controlled so that the total exposure energy density of when light beams are emitted to an image carrying member across light deflection scanning of a plurality of times becomes constant on the image carrying member, thereby high image quality, long lasting output images are obtained. Exposure energy density necessary when exposure is completed by light deflection scanning of one time is set to Ex1, the latent image electrical potential deepness of a latent image formed thereof is set to Vs1, total exposure energy density across light deflection scanning of a plurality of times is set to Ex_n, the latent image electrical potential deepness thereof is set to Vs_n, wherein Ex_n=Ex1??Ex and {(Vs_n/Vs1)^3?1.05}×Ex1<?Ex<{(Vs_n/Vs1)^3?0.95}×Ex1.

Abstract: A latent-image measuring device that measures the state of a photoconductor. The latent-image measuring device emits a charged-particle beam to the photoconductor to detects a charged-particle signal obtained through the emission of the charged-particle beam. The latent-image measuring device then exposes the photoconductor a plurality of times to form electrostatic latent images on the photoconductor, and measures an amount of change in latent-image depth while changing a time interval between a plurality of exposures.