Patents by Inventor Hiroyuki Tokitoh

Hiroyuki Tokitoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of and an apparatus for measuring surface contour
    Patent number: 5467289
    Abstract: A measurement-datum similar to profile of a measuring object set in a measuring area in which a detector and the measuring object are moved relatively is formed to measure the displacement value between the detector and the measuring object through the relative movement based on the measurement-datum to thereby compute the surface contour of the measuring object from the measured data with reference to the measurement-datum. Since the measurement-datum is set in the spatial area, a precise mechanical processing will not be required for an accurate measurement of the measuring object having a strange profile which was not measured by conventional apparatus.
    Type: Grant
    Filed: October 12, 1993
    Date of Patent: November 14, 1995
    Assignee: Mitutoyo Corporation
    Inventors: Makoto Abe, Shigekata Ohta, Hiroyuki Tokitoh, Morimasa Ueda, Takahumi Kano, Hiroyuki Hidaka